Patents by Inventor Woon-Kyu Choi

Woon-Kyu Choi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130173332
    Abstract: Systems and methods for automatically and/or systematically include more data sources and/or more detailed data in the analysis, prediction, and model building. Process data may be employed to pinpoint the process parameter excursions and domain knowledge and/or expert systems may be automatically and/or systematically incorporated into the root cause analysis, the prediction and/or the model building to improve results and/or to reduce the reliance on inconsistent and expensive human experts.
    Type: Application
    Filed: December 29, 2011
    Publication date: July 4, 2013
    Inventors: Tom Thuy Ho, Weidong Wang, Woon-Kyu Choi, Ji-Hoon Keith Han, Gabriel Serge Villareal
  • Publication number: 20130080372
    Abstract: Computer-implemented methods and systems for tool health prediction for a tool having sub-systems and components are disclosed. The method includes providing parameter values from sensors to an expert system. The method also includes providing knowledge base data from a knowledge base to the expert system. The knowledge base includes at least one of tool history, part information, domain knowledge, and model history. The method also includes generating, using the expert system, at least one tool health prediction pertaining to tool maintenance. The prediction generation employs a set of prediction models that includes at least one prediction model. The prediction generation further employs at least the parameter values and the knowledge base data.
    Type: Application
    Filed: September 20, 2012
    Publication date: March 28, 2013
    Inventors: Tom Thuy Ho, Weidong Wang, Gabriel Serge Villareal, Ji-Hoon Keith Han, Woon-Kyu Choi
  • Publication number: 20130030760
    Abstract: Integrated yield/equipment data processing system for collecting and analyzing integrated tool-related data (cause data) and material-related data (effect data) pertaining to at least one material processing tool and at least one material is disclosed. In an embodiment, the tool-related data is correlated with the material-related data, and the correlated tool-related data and material-related data is employed by logic to perform at least one of root-cause analysis, prediction model building and tool control/optimization. By integrating cause-and-effect data in a single platform, the data necessary for performing, for example, automated problem detection (e.g., automated root cause analysis) and prediction, is readily available and correlated, which for example shortens the cycle time to detection and facilitates efficient and timely automated tool management and control.
    Type: Application
    Filed: July 27, 2011
    Publication date: January 31, 2013
    Inventors: Tom Thuy Ho, Weidong Wang, Woon-Kyu Choi, Ji-Hoon Keith Han, Gabriel Serge Villareal