Abstract: A test board unit may include a test board, a thermal tank and a heat-dissipating plate. The test board may be configured to provide a semiconductor chip with a test current. The thermal tank may be configured to dissipate heat generated in the semiconductor chip. The heat-dissipating plate may be coupled between the test board and the thermal tank and may be configured to transfer the heat from the semiconductor chip to the thermal tank.

Abstract: A burn-in test system may include a burn-in test chamber, a heating chamber and a cooling chamber. The burn-in test chamber may receive an object thereon. The burn-in test chamber may perform a burn-in test at a burn-in test temperature. The heating chamber may be positioned at a first sidewall of the burn-in test chamber, and may preheat the object. The cooling chamber may be positioned at a second sidewall of the burn-in test chamber, and may cool the object.

Abstract: A burn-in test system may include a burn-in test chamber, a heating chamber and a cooling chamber. The burn-in test chamber may receive an object thereon. The burn-in test chamber may perform a burn-in test at a burn-in test temperature. The heating chamber may be positioned at a first sidewall of the burn-in test chamber, and may preheat the object. The cooling chamber may be positioned at a second sidewall of the burn-in test chamber, and may cool the object.

Abstract: A test board unit may include a test board, a thermal tank and a heat-dissipating plate. The test board may be configured to provide a semiconductor chip with a test current. The thermal tank may be configured to dissipate heat generated in the semiconductor chip. The heat-dissipating plate may be coupled between the test board and the thermal tank and may be configured to transfer the heat from the semiconductor chip to the thermal tank.

Abstract: An integrated circuit includes first to third failure information storage units, an input selection unit suitable for alternately storing plural pieces of failure information in the first and second failure information storage units generated whenever each of a plurality of tests is performed on a device under test (DUT), and a storage selection unit suitable for relocating the plural pieces of failure information from the first or second failure information storage unit that was not selected by the input selection unit, to the third failure information storage unit while excluding overlapping failure information from relocating.

Abstract: An integrated circuit includes first to third failure information storage units, an input selection unit suitable for alternately storing plural pieces of failure information in the first and second failure information storage units generated whenever each of a plurality of tests is performed on a device under test (DUT), and a storage selection unit suitable for relocating the plural pieces of failure information from the first or second failure information storage unit that was not selected by the input selection unit, to the third failure information storage unit while excluding overlapping failure information from relocating.

Abstract: A display device for selectively adjusting a viewing angle thereof and a method of adjusting a viewing angle thereof are provided. The display device comprises: a display unit displaying an input image based on a determined viewing angle; and a controlling unit determining a viewing angle of the display unit according to a predetermined viewing condition and controlling to display the input image with the determined viewing angle, wherein the viewing condition is one of a viewer position condition, an image type condition, and a viewer setting condition.

Abstract: Provided is a single quantification method of an external event PSA model containing multi-compartment scenarios, including: loading an internal event PSA logic model having core damage as a top event; constituting a mapping table comprising external events containing the multi-compartment scenarios in consideration of information regarding external event occurrence frequencies, external event-induced initiators, and equipments damaged by external events; reflecting the mapping table in the internal event PSA logic model to establish an external event PSA model; calculating a final minimum cut set (MCS) based on the external event PSA model; and calculating a core damage frequency (CDF) value according to the final MCS.

Abstract: A display device for selectively adjusting a viewing angle thereof and a method of adjusting a viewing angle thereof are provided. The display device comprises: a display unit displaying an input image based on a determined viewing angle; and a controlling unit determining a viewing angle of the display unit according to a predetermined viewing condition and controlling to display the input image with the determined viewing angle, wherein the viewing condition is one of a viewer position condition, an image type condition, and a viewer setting condition.

Abstract: Provided is a single quantification method of an external event PSA model containing multi-compartment scenarios, including: loading an internal event PSA logic model having core damage as a top event; constituting a mapping table comprising external events containing the multi-compartment scenarios in consideration of information regarding external event occurrence frequencies, external event-induced initiators, and equipments damaged by external events; reflecting the mapping table in the internal event PSA logic model to establish an external event PSA model; calculating a final minimum cut set (MCS) based on the external event PSA model; and calculating a core damage frequency (CDF) value according to the final MCS.