Patents by Inventor Wu Chou

Wu Chou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250341710
    Abstract: Disclosed is an apparatus and method for imaging: a side-view of a object on a surface, a Contact Angle of a liquid object, the color of an object, or combinations thereof.
    Type: Application
    Filed: July 16, 2025
    Publication date: November 6, 2025
    Applicant: Essenlix Corporation
    Inventors: Stephen Y. CHOU, Wei DING, Wu CHOU, Ji QI, Jun TIAN, Yuecheng ZHANG, Mingquan WU
  • Publication number: 20250297942
    Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.
    Type: Application
    Filed: June 9, 2025
    Publication date: September 25, 2025
    Applicant: Essenlix Corporation
    Inventors: Stephen Y. CHOU, Wei DING, Ji QI, Jun Tian, Wu Chou
  • Publication number: 20250265312
    Abstract: The present disclosure relates to devices, apparatuses and methods of improving the accuracy of image-based assay, that uses imaging system having uncertainties or deviations (imperfection) compared with an ideal imaging system. One aspect of the present invention is to add the monitoring marks on the sample holder, with at least one of their geometric and/optical properties of the monitoring marks under predetermined and known, and taking images of the sample with the monitoring marks, and training a machine learning model using the images with the monitoring mark.
    Type: Application
    Filed: February 28, 2025
    Publication date: August 21, 2025
    Applicant: Essenlix Corporation
    Inventors: Xing Li, Wu CHOU, Stephen Y. CHOU, Wei DING
  • Patent number: 12393004
    Abstract: Disclosed is an apparatus and method for imaging: a side-view of a object on a surface, a Contact Angle of a liquid object, the color of an object, or combinations thereof.
    Type: Grant
    Filed: July 6, 2023
    Date of Patent: August 19, 2025
    Assignee: Essenlix Corporation
    Inventors: Stephen Y. Chou, Wei Ding, Wu Chou, Ji Qi, Jun Tian, Yuecheng Zhang, Mingquan Wu
  • Publication number: 20250251584
    Abstract: A microscopy imaging system and methods for improving an assaying of a sample is disclosed.
    Type: Application
    Filed: April 22, 2025
    Publication date: August 7, 2025
    Applicant: Essenlix Corporation
    Inventors: Ji QI, Stephen Y. CHOU, Wu CHOU, Wei DING
  • Patent number: 12366520
    Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.
    Type: Grant
    Filed: November 9, 2023
    Date of Patent: July 22, 2025
    Assignee: Essenlix Corporation
    Inventors: Stephen Y. Chou, Wei Ding, Ji Qi, Jun Tian, Wu Chou
  • Patent number: 12326396
    Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between two plates.
    Type: Grant
    Filed: November 9, 2023
    Date of Patent: June 10, 2025
    Assignee: Essenlix Corporation
    Inventors: Stephen Y. Chou, Wei Ding, Ji Qi, Jun Tian, Wu Chou
  • Patent number: 12313836
    Abstract: A microscopy imaging system and methods for improving an assaying of a sample is disclosed.
    Type: Grant
    Filed: November 9, 2020
    Date of Patent: May 27, 2025
    Assignee: Essenlix Corporation
    Inventors: Ji Qi, Stephen Y. Chou, Wu Chou, Wei Ding
  • Publication number: 20250116593
    Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.
    Type: Application
    Filed: June 10, 2024
    Publication date: April 10, 2025
    Applicant: Essenlix Corporation
    Inventors: Stephen Y. CHOU, Wu CHOU, Xing LI, Hongbing LI, Yuecheng Zhang, Mingquan WU, Wei DING, Jun TIAN
  • Patent number: 12248533
    Abstract: The present disclosure relates to devices, apparatus and methods of improving the accuracy of image-based assay, that uses imaging system having uncertainties or deviations (imperfection) compared with an ideal imaging system. One aspect of the present invention is to add the monitoring marks on the sample holder, with at least one of their geometric and/optical properties of the monitoring marks under predetermined and known, and taking images of the sample with the monitoring marks, and train a machine learning model using the images with the monitoring mark.
    Type: Grant
    Filed: January 24, 2023
    Date of Patent: March 11, 2025
    Assignee: Essenlix Corporation
    Inventors: Xing Li, Wu Chou, Stephen Y. Chou, Wei Ding, Ji Qi
  • Publication number: 20240410824
    Abstract: The disclosure provides an apparatus, a device, and methods for improving optical analysis of a thin layer of a sample between two plates, particularly for multiple wavelengths.
    Type: Application
    Filed: February 14, 2024
    Publication date: December 12, 2024
    Applicant: Essenlix Corporation
    Inventors: Stephen Y. CHOU, Wei DING, Ji QI, Jun TIAN, Wu CHOU, Hongbing LI
  • Publication number: 20240309369
    Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.
    Type: Application
    Filed: November 9, 2023
    Publication date: September 19, 2024
    Applicant: Essenlix Corporation
    Inventors: Stephen Y. CHOU, Wei DING, Ji QI, Jun Tian, Wu Chou
  • Patent number: 12007320
    Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.
    Type: Grant
    Filed: June 28, 2023
    Date of Patent: June 11, 2024
    Assignee: Essenlix Corporation
    Inventors: Stephen Y. Chou, Wu Chou, Xing Li, Hongbing Li, Yuecheng Zhang, Mingquan Wu, Wei Ding, Jun Tian
  • Publication number: 20240175801
    Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.
    Type: Application
    Filed: November 9, 2023
    Publication date: May 30, 2024
    Applicant: Essenlix Corporation
    Inventors: Stephen Y. CHOU, Wei DING, Ji QI, Jun Tian, Wu Chou
  • Publication number: 20240159999
    Abstract: A method of assaying an analyte in a sample is disclosed. The method includes having a sample holder with a sample contact area for contacting a sample with an analyte, having a plurality of calibration structures on the sample contact area of the sample holder, imaging a part of the sample contact area that has the calibration structures, and using an algorithm that includes an image, calibration structures in the image, and artificial intelligence and/or machine learning to identify the analyte and/or determine the analyte concentration.
    Type: Application
    Filed: December 13, 2023
    Publication date: May 16, 2024
    Applicant: Essenlix Corporation
    Inventors: Stephen Y. Chou, Wei Ding, Ji Qi, Yuechang Zhang, Wu Chou, Mingquan Wu, Xing Li, Jun Tian
  • Patent number: 11933720
    Abstract: The disclosure provides an apparatus, a device, and methods for improving optical analysis of a thin layer of a sample between two plates, particularly for multiple wavelengths.
    Type: Grant
    Filed: June 22, 2020
    Date of Patent: March 19, 2024
    Assignee: Essenlix Corporation
    Inventors: Stephen Y. Chou, Wei Ding, Ji Qi, Jun Tian, Wu Chou, Hongbing Li
  • Publication number: 20240085304
    Abstract: The present disclosure relates to devices, apparatus and methods of improving the accuracy of image-based assay, that uses imaging system having uncertainties or deviations (imperfection) compared with an ideal imaging system. One aspect of the present invention is to add the monitoring marks on the sample holder, with at least one of their geometric and/optical properties of the monitoring marks under predetermined and known, and taking images of the sample with the monitoring marks, and train a machine learning model using the images with the monitoring mark.
    Type: Application
    Filed: January 18, 2022
    Publication date: March 14, 2024
    Applicant: Essenlix Corporation
    Inventors: Xing LI, Wu CHOU, Stephen Y. CHOU, Wei DING, Ji QI
  • Publication number: 20240035954
    Abstract: The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.
    Type: Application
    Filed: May 1, 2023
    Publication date: February 1, 2024
    Applicant: Essenlix Corporation
    Inventors: Stephen Y. CHOU, Wei DING, Wu CHOU, Jun TIAN, Yuecheng ZHANG, Mingquan WU, Xing LI
  • Patent number: 11885952
    Abstract: A method of assaying an analyte in a sample is disclosed. The method includes having a sample holder with a sample contact area for contacting a sample with an analyte, having a plurality of calibration structures on the sample contact area of the sample holder, imaging a part of the sample contact area that has the calibration structures, and using an algorithm that includes an image, calibration structures in the image, and artificial intelligence and/or machine learning to identify the analyte and/or determine the analyte concentration.
    Type: Grant
    Filed: July 30, 2019
    Date of Patent: January 30, 2024
    Assignee: Essenlix Corporation
    Inventors: Stephen Y. Chou, Wei Ding, Ji Qi, Yuecheng Zhang, Wu Chou, Mingquan Wu, Xing Li, Jun Tian
  • Publication number: 20240027430
    Abstract: The disclosure provides a method for identifying a bio-entity including a cell type and count in a sample. The method includes: providing a device comprising a first plate, a second plate, and a patterned structural element; depositing the sample between the first and second plates; reducing the spacing of the first and second plates so that the first and second plates are in a closed configuration to compress the sample into a layer; and imaging the sample to obtain an image; and measuring and analyzing the image against a database generated with a machine learning model to obtain the bio-entity of the sample. The sample can be a blood sample, and the method can be a white blood cell differential test conducted with a mobile phone.
    Type: Application
    Filed: September 26, 2023
    Publication date: January 25, 2024
    Applicant: Essenlix Corporation
    Inventors: Stephen Y. CHOU, Yu SUN, Wei DING, Ji Qi, Mingquan WU, Shengjian CAI, Wu CHOU