Abstract: A head worn display device is disclosed. Each of two display assemblies includes a first waveguide with a field of view and a second waveguide with a field of view, where the fields of view are overlapped to generate a combined field of view for each of the display assemblies. Each of the display assemblies further includes a first collimator and a second collimator, where each collimator is configured to direct illumination through the waveguide stack along a single axis, and where each collimator is rotated a select angle to offset the combined field of view to merge collimator pupils and generate a seamless total field of view for each of the display assemblies. Each of the display assemblies are rotated a select angle to offset the respective total fields of view along the single axis and generate a seamless wide field of view for the head worn display device.

Abstract: A LCD test system is provided for use in a high volume production environment. An automated test is performed that tests each LCD and provides a pass/fail indication. The automated test includes an image-sticking test that drives the test image based on a control voltage that corresponds to a maximum rate of change of brightness. The control voltage is determined by differentiating an electro-optic curve. The brightness difference between the test image and another test image is compared to predetermined threshold. The other test image may be a gray scale test. Alternatively, the image-sticking test may integrate brightness levels of odd and even frames, compare these results to predetermined thresholds. The test includes a color uniformity test in which average differences in peak reflectance and peak frequency within sections of the LCD are compared to predetermined thresholds for the pass/fall indication. The test includes a spatial distribution of defects test.