Patents by Inventor Xavier Amouretti

Xavier Amouretti has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10072982
    Abstract: An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.
    Type: Grant
    Filed: December 23, 2016
    Date of Patent: September 11, 2018
    Assignee: BIOTEK INSTRUMENTS, INC.
    Inventors: Oleg Zimenkov, Xavier Amouretti, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan J. Venditti, Jr., Christopher Many, Bill Anderson, Ben Knight, James Piette, Ross Piette, Joe Tobey, Brian Ferris
  • Publication number: 20170108438
    Abstract: An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.
    Type: Application
    Filed: December 23, 2016
    Publication date: April 20, 2017
    Applicant: BTI HOLDINGS, INC.
    Inventors: Oleg ZIMENKOV, Xavier AMOURETTI, Michael KONTOROVICH, Ben NORRIS, Richard N. SEARS, Dan J. VENDITTI, JR., Christopher MANY, Bill ANDERSON, Ben KNIGHT, James PIETTE, Ross PIETTE, Joe TOBEY, Brian FERRIS
  • Patent number: 9557217
    Abstract: An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.
    Type: Grant
    Filed: May 31, 2012
    Date of Patent: January 31, 2017
    Assignee: BTI HOLDINGS, INC.
    Inventors: Oleg Zimenkov, Xavier Amouretti, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan J. Venditti, Jr., Christopher Many, Bill Anderson, Ben Knight, James Piette, Ross Piette, Joe Tobey, Brian Ferris
  • Publication number: 20120300194
    Abstract: An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.
    Type: Application
    Filed: May 31, 2012
    Publication date: November 29, 2012
    Applicant: BTI HOLDINGS, INC.
    Inventors: Oleg ZIMENKOV, Xavier AMOURETTI, Michael KONTOROVICH, Ben NORRIS, Richard N. SEARS, Dan J. VENDITTI, JR., Christopher MANY, Bill Anderson, Ben Knight, James Piette, Ross Piette, Joe Tobey, Brian Ferris
  • Patent number: 8218141
    Abstract: An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.
    Type: Grant
    Filed: July 19, 2010
    Date of Patent: July 10, 2012
    Assignee: BTI Holdings, Inc.
    Inventors: Oleg Zimenkov, Xavier Amouretti, Robert M. Gifford, Mark R. Kennedy, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan Venditti, Christopher Many
  • Publication number: 20100277725
    Abstract: An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.
    Type: Application
    Filed: July 19, 2010
    Publication date: November 4, 2010
    Inventors: Oleg Zimenkov, Xavier Amouretti, Robert M. Gifford, Mark R. Kennedy, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan Venditti, Christopher Many
  • Patent number: 7782454
    Abstract: An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.
    Type: Grant
    Filed: May 25, 2007
    Date of Patent: August 24, 2010
    Assignee: BTI Holdings, Inc.
    Inventors: Oleg Zimenkov, Xavier Amouretti, Robert M. Gifford, Mark R. Kennedy, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan Venditti, Christopher Many
  • Publication number: 20080191149
    Abstract: An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.
    Type: Application
    Filed: May 25, 2007
    Publication date: August 14, 2008
    Inventors: Oleg Zimenkov, Xavier Amouretti, Robert M. Gifford, Mark R. Kennedy, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan Venditti, Christopher Many