Abstract: The invention relates to a personal token (in particular a SIM card), a system comprising a personal token and a communication device (in particular a cellular phone), and a method for parental control of the services of the communication device. The personal token of the invention comprises connection means for connecting to a communication device and parental control means, the parental control means controlling access of a controlled entity to the services offered by the communication device according to a set of rules stored in the personal token. The personal token also comprises rules modification means enabling the modification of the set of rules (access to the rules modification means being restricted to a controlling entity), and a web server, the rules modification means being accessible through at least one web page on the web server.

Abstract: A method of processing a semiconductor device comprises: applying a focused ion beam to a structure of a semiconductor device to be processed; producing a live detector signal by detecting secondary electrons emitted as the focused ion beam is applied to the structure; comparing the live detector signal with a reference trace having a region indicative of an expected material boundary and a stop marker within said region; and terminating or altering a FIB operation when the live detector signal exhibits a characteristic corresponding to said region of the reference trace.

Abstract: A charged particle beam system such as a focused ion beam system includes a vacuum chamber; an optical microscope located so as to have a filed of view within a first region of the chamber; a laser aligned with the optical microscope so as to project a laser beam into the first region; a charged particle beam column located within the chamber and arranged so as to focus a charged particle beam into a second region of the chamber; and specimen support located in the chamber and moveable between a first position in the first region and a second position in the second region. The laser is used to mark a DUT with a registration mark which is visible in the images from the optical microscope and the charged particle beam. The position of the registration mark can be accurately determined in the optical image and the position of features which would otherwise be invisible in the charged particle beam image inferred.