Patents by Inventor Xi HOU

Xi HOU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11965833
    Abstract: A detection device includes a frame, a transport mechanism, detection mechanisms, and a grasping mechanism. The transport mechanism includes a feeding line, a first flow line, and a second flow line arranged in parallel on the frame. The detection mechanisms are arranged on the frame and located on two sides of the transport mechanism. The grasping mechanism is arranged on the frame and used to transport workpieces on the feeding line to the detection mechanisms, transport qualified workpieces to the first flow line, and transport unqualified workpieces to the second flow line.
    Type: Grant
    Filed: November 26, 2020
    Date of Patent: April 23, 2024
    Assignees: HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Jing-Zhi Hou, Lin-Hui Cheng, Yan-Chao Ma, Jin-Cai Zhou, Zi-Long Ma, Neng-Neng Zhang, Yi Chen, Chen-Xi Tang, Meng Lu, Peng Zhou, Ling-Hui Zhang, Lu-Hui Fan, Shi-Gang Xu, Cheng-Yi Chao, Liang-Yi Lu
  • Publication number: 20210364278
    Abstract: The disclosure relates to a measuring method and a measuring device for measuring a radius of an optical element based on a computer-generated hologram, and belongs to the field of photoelectric technology detection. The present disclosure is characterized in that two conjugated wave surfaces, i.e. a confocal wavefront and a cat's eye wavefront, are simultaneously generated by one piece of computer-generated hologram, and at the same time, interferograms at the cat's eye position and at the confocal position are obtained and surface shape parameters are measured, and the radius of an optical element is solved according to the measurement result.
    Type: Application
    Filed: January 10, 2019
    Publication date: November 25, 2021
    Inventors: Gaofeng WU, Qiang Chen, Weihong Song, Xi Hou
  • Patent number: 10962487
    Abstract: A flaw detecting apparatus and a method for a plane mirror based on line scanning and ring band stitching are provided. The flaw detecting apparatus comprises: a line scanning detector, an annular illumination source, a rotary table rotatable about a Z axis, a translation table translatable along an X axis and a processor. By translating and rotating the plane mirror to be detected, an entire surface of the plane mirror to be detected can be detected by the line scanning detector, and the flaw of the entire plane mirror to be detected is obtained by a ring band stitching method. The method of line scanning and ring band stitching reduces the imaging distortion, the intermediate data amount, the difficulty in the distortion correction and difficulty in stitching, and improves the detection speed and the detection quality.
    Type: Grant
    Filed: November 12, 2019
    Date of Patent: March 30, 2021
    Assignee: The Institute of Optics and Electronics, The Chinese Academy of Sciences
    Inventors: Fuchao Xu, Haiyang Quan, Taotao Fu, Xiaochuan Hu, Xi Hou, Sheng Li
  • Patent number: 10782248
    Abstract: Embodiments of the present disclosure relate to a measuring method and device for measuring surface defects of a cambered optical element, which belongs to the field of photoelectric detection technology. The device includes a sensor measuring head, a rotatable workpiece table, an automatic sampling device, and a spraying device. The sensor measuring head includes an illumination sub-system and a line scan imaging sub-system, the illumination sub-system provides an illumination of high uniformity and high brightness for a surface of a sample to be detected, the rotatable workpiece table and the imaging sub-system are configured for performing a ring belt scanning and a high resolution scatter imaging to the defects on an optical surface region.
    Type: Grant
    Filed: November 7, 2019
    Date of Patent: September 22, 2020
    Assignee: The Institute of Optics and Electronics, The Chinese Academy of Sciences
    Inventors: Haiyang Quan, Fuchao Xu, Taotao Fu, Xiaochuan Hu, Gaofeng Wu, Xi Hou, Fan Wu, Sheng Li
  • Publication number: 20200150055
    Abstract: Embodiments of the present disclosure relate to a measuring method and device for measuring surface defects of a cambered optical element, which belongs to the field of photoelectric detection technology. The device includes a sensor measuring head, a rotatable workpiece table, an automatic sampling device, and a spraying device. The sensor measuring head includes an illumination sub-system and a line scan imaging sub-system, the illumination sub-system provides an illumination of high uniformity and high brightness for a surface of a sample to be detected, the rotatable workpiece table and the imaging sub-system are configured for performing a ring belt scanning and a high resolution scatter imaging to the defects on an optical surface region.
    Type: Application
    Filed: November 7, 2019
    Publication date: May 14, 2020
    Inventors: Haiyang Quan, Fuchao Xu, Taotao Fu, Xiaochuan Hu, Gaofeng Wu, Xi Hou, Fan Wu, Sheng Li
  • Publication number: 20200150053
    Abstract: A flaw detecting apparatus and a method for a plane mirror based on line scanning and ring band stitching are provided. The flaw detecting apparatus comprises: a line scanning detector, an annular illumination source, a rotary table rotatable about a Z axis, a translation table translatable along an X axis and a processor. By translating and rotating the plane mirror to be detected, an entire surface of the plane mirror to be detected can be detected by the line scanning detector, and the flaw of the entire plane mirror to be detected is obtained by a ring band stitching method. The method of line scanning and ring band stitching reduces the imaging distortion, the intermediate data amount, the difficulty in the distortion correction and difficulty in stitching, and improves the detection speed and the detection quality.
    Type: Application
    Filed: November 12, 2019
    Publication date: May 14, 2020
    Applicant: The Institute of Optics and Electronics, The Chinese Academy of Sciences
    Inventors: Fuchao XU, Haiyang QUAN, Taotao FU, Xiaochuan HU, Xi HOU, Sheng LI