Patents by Inventor XIANG N. LI

XIANG N. LI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Memory testing in a data processing system
    Patent number: 9218893
    Abstract: In a method of memory testing in a data processing system, in response to receiving a request for a hardware memory test during boot process of the data processing system, a controller accesses a stored past memory test result. The past memory test result includes at least a first number of test loops used in a past memory test, an identification of a first test pattern, and an error that occurred in the past memory test. The controller adjusts a second number of test loops and a second test pattern to be used in the hardware memory test according to the past memory test result. The controller then performs the hardware memory test according to the adjusted second number of test loops and the second test pattern.
    Type: Grant
    Filed: September 11, 2013
    Date of Patent: December 22, 2015
    Assignee: Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
    Inventors: Sumeet Kochar, Hai Qiang Li, Xiang N. Li, Chao C. Xu
  • MEMORY TESTING IN A DATA PROCESSING SYSTEM
    Publication number: 20140095948
    Abstract: In a method of memory testing in a data processing system, in response to receiving a request for a hardware memory test during boot process of the data processing system, a controller accesses a stored past memory test result. The past memory test result includes at least a first number of test loops used in a past memory test, an identification of a first test pattern, and an error that occurred in the past memory test. The controller adjusts a second number of test loops and a second test pattern to be used in the hardware memory test according to the past memory test result. The controller then performs the hardware memory test according to the adjusted second number of test loops and the second test pattern.
    Type: Application
    Filed: September 11, 2013
    Publication date: April 3, 2014
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: SUMEET KOCHAR, HAI QIANG LI, XIANG N. LI, CHAO C. XU