Abstract: A system for testing a computing device includes a test device, a switch module connected between the test device and the computing device, and a display module connected to the test device for displaying a plurality of test parameters. The testing device is connected to the computing device via a USB connection. The test device has a power cycling test program and a display driving program. The test device sends trigger signals to turn the computing device on or off and receives signals from computing device via the USB connection, for detecting the occurrence of errors during testing. A method utilizing the system is also disclosed.

Abstract: Embodiments of the present invention disclose a method for coordinated multi-cell transmission, a central controller and a User Equipment (UE). In one embodiment, the method includes: determining, by a central controller, at least one candidate cooperating set in a super-cell, wherein each cell in the super-cell belongs to at least one candidate cooperating set, and broadcasting information of the at least one candidate cooperating set determined to all UEs in the super-cell; selecting, by each UE, a candidate cooperating set from the at least one candidate cooperating set as a cooperating set of the UE, and feeding back information of the cooperating set selected to the central controller; and determining, by the central controller, all cooperating sets in the super-cell and UEs participating in cooperation in each cooperating set according to the information of the selected cooperating set fed back by each UE.

Abstract: Embodiments of the present invention include a method and base station for obtaining Channel Quality Indicator (CQI) information. One embodiment of the method includes: receiving, by a base station, quantized channel information, quantization error, Inter-Cell Interference (ICI) power and noise power fed back by each User Equipment (UE) after channel estimation; and estimating, by the base station, a CQI corresponding to each UE to obtain an estimated CQI value corresponding to each UE according to the quantized channel information, the quantization error, the ICI power and the noise power which are fed back by the UE as well as an instantaneous precoding vector or matrix of each UE. Through the embodiments, the base station can obtain more precise CQI information of each UE so as to select a precise modulation and coding scheme and to increase system throughput.

Abstract: A test system includes a front bezel of an electronic device and a test device. The front bezel includes a plurality of positions defined in the front bezel, a plurality of light emitting diodes (LEDs) located in the plurality of positions, and a female LED connector connected to the plurality of LEDs. The test device includes a male LED connector electrically connected to the female LED connector, and a programmable logic device (PLD) electrically connected to the male LED connector, and configured to control the LEDs to emit light in a sequence to determine if the plurality of LEDs are correctly located in the correct plurality of positions.

Abstract: A switch for switching a set of peripheral devices between two computers comprises at least one chip. The at least one chip has a selected signal pin, a group of invariable pins and two groups of variable pins. Each invariable pin corresponds to two variable pins. The group of invariable pins connects to the peripheral devices. Each of the two groups of variable pins connects to one of the two computers. Each invariable pin selectively connects to one of the corresponding two variable pins depending on the states of the selected signal pin to connect the set of peripheral devices to the selected computer.

Abstract: A test system includes a front bezel of an electronic device and a test device. The front bezel includes a plurality of positions defined in the front bezel, a plurality of light emitting diodes (LEDs) located in the plurality of positions, and a female LED connector connected to the plurality of LEDs. The test device includes a male LED connector electrically connected to the female LED connector, and a programmable logic device (PLD) electrically connected to the male LED connector, and configured to control the LEDs to emit light in a sequence to determine if the plurality of LEDs are correctly located in the correct plurality of positions.

Abstract: A testing system includes a computer (10) and a signal switching adapter (30). The computer includes a test signal generating element (19) and a microprocessor (15). The test signal generating element is capable of generating an original test signal. The microprocessor (15) is capable of communicating with the test signal generating element. A video card (11) is capable of receiving the original test signal from the microprocessor and outputting a to-be-displayed analog signal. The signal switching adapter includes an A/D converter (32). The A/D converter is capable of converting the to-be-displayed analog signal to a digital display signal. The signal switching adapter is capable of outputting the digital display signal back to the microprocessor.

Abstract: A switch for switching a set of peripheral devices between two computers comprises at least one chip. The at least one chip has a selected signal pin, a group of invariable pins and two groups of variable pins. Each invariable pin corresponds to two variable pins. The group of invariable pins connects to the peripheral devices. Each of the two groups of variable pins connects to one of the two computers. Each invariable pin selectively connects to one of the corresponding two variable pins depending on the states of the selected signal pin to connect the set of peripheral devices to the selected computer.

Abstract: A debug device include a programmable logic device (11) with debugging source codes burnt thereinto; a PCI connector (16) connected with the programmable logic device; a LPC connector (17) connected with the programmable logic device; a first display module (13) connected with the programmable device for showing codes of a port 80; a second display module (14) connected with the programmable device for showing codes of a selected port of 80h to 87h; and a button (15) connected with the programmable logic device for selecting the selected port of 80h to 87h. When the debugging device is used to debug a motherboard with PCI or LPC bus during a POST routine, the debugging device receives datum from the PCI or LPC bus and outputs corresponding datum to the first and second display modules, thereby showing codes of at least one port of 80h to 87h.