Patents by Inventor Xiangdong Don Li

Xiangdong Don Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8728309
    Abstract: In a system and method for feature alignment in chromatographic systems, the system runs a first sample through a first separation column. The system determines a first set of features for the first sample run. The system runs a second sample through a second separation column and detects a second set of features for the second sample run. The system estimates a systematic shift in features between the first sample run through the first separation column and the second sample run through the second separation column. The system adjusts the second set of features detected for the second sample run through the second separation column based on the estimated systematic shift to obtain a third set of adjusted features.
    Type: Grant
    Filed: November 6, 2009
    Date of Patent: May 20, 2014
    Assignee: Agilent Technologies, Inc.
    Inventor: Xiangdong Don Li
  • Patent number: 8237108
    Abstract: The present invention provides, inter alia, methods of analyzing mass spectral data based on charge states of analyte ions. In some embodiments, the methods can be used for differential profiling of samples, such as comparing a sample comprising a given compound and a sample comprising metabolites of the same compound. The methods can also be used to identify and isolate biomarkers. Systems for performing the methods, as well as computer-readable media for performing the methods, are also described.
    Type: Grant
    Filed: February 4, 2011
    Date of Patent: August 7, 2012
    Assignee: Agilent Technologies, Inc.
    Inventors: David M. Horn, Xiangdong Don Li
  • Publication number: 20120108448
    Abstract: Systems and method for curation of mass spectral libraries. In general, the systems and methods provided herein (a) obtain an experimentally derived mass spectrum of a compound of interest; (b) identify a peak in the mass spectrum that represent an experimental m/z value for an ion fragment of the compound of interest; (c) remove from the mass spectrum any peak that does not correspond to the compound of interest; and (d) replace the experimental m/z value for the peak identified in step (b) with a calculated theoretical m/z value for the ion fragment.
    Type: Application
    Filed: November 3, 2010
    Publication date: May 3, 2012
    Inventors: Frank E. Kuhlmann, Heloise Logan, Steven M. Fischer, Xiangdong Don Li
  • Publication number: 20110198491
    Abstract: The present invention provides, inter alia, methods of analyzing mass spectral data based on charge states of analyte ions. In some embodiments, the methods can be used for differential profiling of samples, such as comparing a sample comprising a given compound and a sample comprising metabolites of the same compound. The methods can also be used to identify and isolate biomarkers. Systems for performing the methods, as well as computer-readable media for performing the methods, are also described.
    Type: Application
    Filed: February 4, 2011
    Publication date: August 18, 2011
    Inventors: David M. Horn, Xiangdong Don Li
  • Patent number: 7910877
    Abstract: The present invention provides, inter alia, methods of analyzing mass spectral data based on charge states of analyte ions. In some embodiments, the methods can be used for differential profiling of samples, such as comparing a sample comprising a given compound and a sample comprising metabolites of the same compound. The methods can also be used to identify and isolate biomarkers. Systems for performing the methods, as well as computer-readable media for performing the methods, are also described.
    Type: Grant
    Filed: October 31, 2008
    Date of Patent: March 22, 2011
    Assignee: Agilent Technologies, Inc.
    Inventors: David M Horn, Xiangdong Don Li
  • Publication number: 20100108876
    Abstract: The present invention provides, inter alia, methods of analyzing mass spectral data based on charge states of analyte ions. In some embodiments, the methods can be used for differential profiling of samples, such as comparing a sample comprising a given compound and a sample comprising metabolites of the same compound. The methods can also be used to identify and isolate biomarkers. Systems for performing the methods, as well as computer-readable media for performing the methods, are also described.
    Type: Application
    Filed: October 31, 2008
    Publication date: May 6, 2010
    Inventors: David M. Horn, Xiangdong Don Li
  • Publication number: 20100057377
    Abstract: In a system and method for feature alignment in chromatographic systems, the system runs a first sample through a first separation column. The system determines a first set of features for the first sample run. The system runs a second sample through a second separation column and detects a second set of features for the second sample run. The system estimates a systematic shift in features between the first sample run through the first separation column and the second sample run through the second separation column. The system adjusts the second set of features detected for the second sample run through the second separation column based on the estimated systematic shift to obtain a third set of adjusted features.
    Type: Application
    Filed: November 6, 2009
    Publication date: March 4, 2010
    Inventor: Xiangdong Don Li
  • Patent number: 7653496
    Abstract: The present invention provides, inter alia, methods of analyzing mass spectral data. In some embodiments, the methods can be used for differential profiling of samples, such as comparing a sample comprising a compound and a sample comprising metabolites of the same compound. The methods can also be used to identify and isolate biomarkers. Systems for performing the methods, as well as computer-readable media for performing the methods, are also described.
    Type: Grant
    Filed: February 2, 2007
    Date of Patent: January 26, 2010
    Assignee: Agilent Technologies, Inc.
    Inventor: Xiangdong Don Li
  • Patent number: 7635433
    Abstract: In a system and method for feature alignment in chromatographic systems, the system runs a first sample through a first separation column. The system determines a first set of features for the first sample run. The system runs a second sample through a second separation column and detects a second set of features for the second sample run. The system estimates a systematic shift in features between the first sample run through the first separation column and the second sample run through the second separation column. The system adjusts the second set of features detected for the second sample run through the second separation column based on the estimated systematic shift to obtain a third set of adjusted features.
    Type: Grant
    Filed: August 26, 2005
    Date of Patent: December 22, 2009
    Assignee: Agilent Technologies, Inc.
    Inventor: Xiangdong Don Li
  • Publication number: 20070176088
    Abstract: The present invention provides, inter alia, methods of analyzing mass spectral data. In some embodiments, the methods can be used for differential profiling of samples, such as comparing a sample comprising a compound and a sample comprising metabolites of the same compound. The methods can also be used to identify and isolate biomarkers. Systems for performing the methods, as well as computer-readable media for performing the methods, are also described.
    Type: Application
    Filed: February 2, 2007
    Publication date: August 2, 2007
    Inventor: Xiangdong Don Li
  • Publication number: 20070045190
    Abstract: In a system and method for feature alignment in chromatographic systems, the system runs a first sample through a first separation column. The system determines a first set of features for the first sample run. The system runs a second sample through a second separation column and detects a second set of features for the second sample run. The system estimates a systematic shift in features between the first sample run through the first separation column and the second sample run through the second separation column. The system adjusts the second set of features detected for the second sample run through the second separation column based on the estimated systematic shift to obtain a third set of adjusted features.
    Type: Application
    Filed: August 26, 2005
    Publication date: March 1, 2007
    Inventor: Xiangdong Don Li