Patents by Inventor Xianghai Wu

Xianghai Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Precise probe placement in automated scanning probe microscopy systems
    Patent number: 9995763
    Abstract: A scanning probe microscope (SPM) system and associated method. The SPM system having a probe adapted to interact with nanoscale features of a sample and scan within a target region to produce a three-dimensional image of that target region, the system maintaining location information for a plurality of features of interest of the sample according to a sample-specific coordinate system, wherein the SPM system is configured to adjust positioning of the probe relative to the sample according to a SPM coordinate system, the SPM system further configured to manage a dynamic relationship between the sample-specific coordinate system and the SPM coordinate system by determining a set of alignment errors between the sample-specific coordinate system and the SPM coordinate system and apply corrections to the SPM coordinate system to offset the determined alignment errors.
    Type: Grant
    Filed: February 24, 2015
    Date of Patent: June 12, 2018
    Assignee: Bruker Nano, Inc.
    Inventors: Jason Osborne, Eric Milligan, Andrew Lopez, Xianghai Wu, Sean Hand, Vladimir Fonoberov