Abstract: The present disclosure discloses a display panel and a display device. The display panel includes a base substrate, and the base substrate includes a plurality of sub-pixels and a plurality of signal routing wires; where each of the plurality of sub-pixels includes an effective light-emitting region; an orthographic projection of the effective light-emitting region on the base substrate and an orthographic projection of one of the plurality of signal routing wires on the base substrate have a first overlapping region; and the first overlapping region is in a non-linear shape.

Abstract: The present disclosure discloses a display panel and a display device. The display panel includes a base substrate, and the base substrate includes a plurality of sub-pixels and a plurality of signal routing wires; where each of the plurality of sub-pixels includes an effective light-emitting region; an orthographic projection of the effective light-emitting region on the base substrate and an orthographic projection of one of the plurality of signal routing wires on the base substrate have a first overlapping region; and the first overlapping region is in a non-linear shape.

Abstract: The invention relates to the technical field of an alignment method, and discloses a method for aligning substrate and mask, including: firstly forming at least one set of alignment marks on a mask plate; selecting a certain number of large-size substrates as sample substrates; forming a plurality of sets of alignment marks on each sample substrate using the mask plate and the at least one set of alignment marks formed thereon to divide the sample substrate into a plurality of sub-substrate areas; and then performing mask process on the respective sample substrates, accurate alignment for each sub-substrate area can be realized by means of the plurality of sets of alignment marks on the sample substrate, and one sub-substrate area can be accurately aligned by means of at least two sets of alignment marks formed on the sample substrate.

Abstract: The invention relates to the technical field of an alignment method, and discloses a method for aligning substrate and mask, including: firstly forming at least one set of alignment marks on a mask plate; selecting a certain number of large-size substrates as sample substrates; forming a plurality of sets of alignment marks on each sample substrate using the mask plate and the at least one set of alignment marks formed thereon to divide the sample substrate into a plurality of sub-substrate areas; and then performing mask process on the respective sample substrates, accurate alignment for each sub-substrate area can be realized by means of the plurality of sets of alignment marks on the sample substrate, and one sub-substrate area can be accurately aligned by means of at least two sets of alignment marks formed on the sample substrate.