Patents by Inventor Xiao Bian
Xiao Bian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11801607Abstract: The present disclosure is related to methods and systems for controlling a snake-arm robot. The method includes receiving real-time image data associated with an operating environment or a location of a workpiece from optical sensor(s) mounted on a robot head of the robot; receiving input data describing a desired pose of the robot head; computing and translating a desired displacement of the robot head; computing a position of each of the links of the snake-arm robot to follow motion of the robot head, a current position of each the links, and data required to move joints connecting the links to move the robot to the desired pose; generating movement instructions; and transmitting the movement instructions to a drive motor associated with an introduction device or controllers associated with servo-motors operably connected to joints connecting the links of the snake-arm causing the robot head to move to the desired pose.Type: GrantFiled: May 25, 2021Date of Patent: October 31, 2023Assignee: General Electric CompanyInventors: Huan Tan, Xiao Bian, Todd Danko
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Patent number: 11727052Abstract: A method of inspecting a component using an image retrieval module includes storing an inspection image file in a memory and identifying a region of interest in the inspection image file. The method further includes accessing a database storing image files and determining feature vectors associated with the image files. The method also includes determining a hash code for each image file based on the feature vectors and classifying a subset of image files as relevant based on the hash codes. The method further includes sorting the subset of image files based on the feature vectors and generating search results based on the sorted subset of image files. The image retrieval module includes a convolutional neural network configured to learn from the determination of the feature vectors and increase the accuracy of the image retrieval module in classifying the image files.Type: GrantFiled: September 3, 2020Date of Patent: August 15, 2023Assignee: General Electric CompanyInventors: Xiao Bian, Bernard Patrick Bewlay, Colin James Parris, Feng Xue, Shaopeng Liu, Arpit Jain, Shourya Sarcar
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Publication number: 20230107092Abstract: A method for monitoring a rotor assembly of a wind turbine includes receiving, via an imaging analytics module of a controller, thermal imaging data of the rotor assembly. The thermal imaging data includes a plurality of image frames. The method also includes automatically identifying, via a first machine learning model of the imaging analytics module, a plurality of sections of a rotor blade of the rotor assembly within the plurality of image frames until all sections of the rotor blade are identified. Further, the method includes selecting, via a function of the imaging analytics module, a subset of image frames from the plurality of image frames, the subset of image frames comprising a minimum number of the plurality of image frames required to represent all sections of the rotor blade. Moreover, the method includes generating, via a visualization module of the controller, an image of the rotor assembly using the subset of image frames.Type: ApplicationFiled: February 27, 2020Publication date: April 6, 2023Inventors: Arpit Jain, Feng Xue, Michael John MacDonald, Xiao Bian, Venkata Vijayaraghava Nalladega, Gary Anthony Miller
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Patent number: 11507616Abstract: A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.Type: GrantFiled: September 3, 2020Date of Patent: November 22, 2022Assignee: General Electric CompanyInventors: Shaopeng Liu, Xiao Bian, Yan Liu, Feng Xue, Walter Vincent Dixon, III, Mark Richard Gilder, Peihong Zhu, Bernard Patrick Bewlay, Byron Andrew Pritchard, Masako Yamada, Colin James Parris
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Publication number: 20220067083Abstract: A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.Type: ApplicationFiled: September 3, 2020Publication date: March 3, 2022Inventors: Shaopeng Liu, Xiao Bian, Yan Liu, Feng Xue, Walter Vincent Dixon, III, Mark Richard Gilder, Peihong Zhu, Bernard Patrick Bewlay, Byron Andrew Pritchard, Masako Yamada, Colin James Parris
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Publication number: 20220067082Abstract: A method of inspecting a component using an image retrieval module includes storing an inspection image file in a memory and identifying a region of interest in the inspection image file. The method further includes accessing a database storing image files and determining feature vectors associated with the image files. The method also includes determining a hash code for each image file based on the feature vectors and classifying a subset of image files as relevant based on the hash codes. The method further includes sorting the subset of image files based on the feature vectors and generating search results based on the sorted subset of image files. The image retrieval module includes a convolutional neural network configured to learn from the determination of the feature vectors and increase the accuracy of the image retrieval module in classifying the image files.Type: ApplicationFiled: September 3, 2020Publication date: March 3, 2022Inventors: Xiao Bian, Bernard Patrick Bewlay, Colin James Parris, Feng Xue, Shaopeng Liu, Arpit Jain, Shourya Sarcar
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Publication number: 20210283784Abstract: The present disclosure is related to methods and systems for controlling a snake-arm robot. The method includes receiving real-time image data associated with an operating environment or a location of a workpiece from optical sensor(s) mounted on a robot head of the robot; receiving input data describing a desired pose of the robot head; computing and translating a desired displacement of the robot head; computing a position of each of the links of the snake-arm robot to follow motion of the robot head, a current position of each the links, and data required to move joints connecting the links to move the robot to the desired pose; generating movement instructions; and transmitting the movement instructions to a drive motor associated with an introduction device or controllers associated with servo-motors operably connected to joints connecting the links of the snake-arm causing the robot head to move to the desired pose.Type: ApplicationFiled: May 25, 2021Publication date: September 16, 2021Inventors: Huan Tan, Xiao Bian, Todd Danko
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Patent number: 11068752Abstract: A method of inspecting a component using an image inspection controller that includes a processor communicatively coupled to a memory includes classifying each sample image in a first database as a first sample or a second sample using a classification module, extracting at least one class generic feature from each first sample to generate a plurality of class generic features, and extracting at least one class specific feature from each second sample to generate a plurality of class specific features. The method further includes combining the class generic features and the class specific features to generate a plurality of supplemental images. The method further includes storing the sample images and the supplemental images in a second database, classifying each sample image and each supplemental image, capturing at least one image of the component using a camera, and identifying at least one feature of the component in the at least one image of the component using the classification module.Type: GrantFiled: October 31, 2019Date of Patent: July 20, 2021Assignee: General Electric CompanyInventors: Xiao Bian, Colin James Parris, Bernard Patrick Bewlay, Masako Yamada, Shaopeng Liu, Peng Chu
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Patent number: 11034026Abstract: Methods and systems for controlling a snake-arm robot. In an embodiment, a server computer receives real-time image data associated with at least one of an operating environment and a location of a workpiece from an optical sensor mounted on a robot head of a snake-arm robot, and receives, input data describing a desired pose of the robot head from a user device. The server computer then computes a desired velocity of the robot head using an image Jacobian, translates the desired velocity of the robot head into incremental displacement data and rotation data within a control cycle, computes a position of each of a plurality of links comprising a snake-arm of the snake-arm robot to follow motion of the robot head, computes a current position of each of the plurality of links utilizing a forward dynamics model, and computes force and torque data required to move at least one of a plurality of joints connecting the links to move the snake-arm robot to the desired pose.Type: GrantFiled: January 10, 2019Date of Patent: June 15, 2021Assignee: General Electric CompanyInventors: Huan Tan, Xiao Bian, Todd Danko
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Publication number: 20210133511Abstract: A method of inspecting a component using an image inspection controller that includes a processor communicatively coupled to a memory includes classifying each sample image in a first database as a first sample or a second sample using a classification module, extracting at least one class generic feature from each first sample to generate a plurality of class generic features, and extracting at least one class specific feature from each second sample to generate a plurality of class specific features. The method further includes combining the class generic features and the class specific features to generate a plurality of supplemental images. The method further includes storing the sample images and the supplemental images in a second database, classifying each sample image and each supplemental image, capturing at least one image of the component using a camera, and identifying at least one feature of the component in the at least one image of the component using the classification module.Type: ApplicationFiled: October 31, 2019Publication date: May 6, 2021Inventors: Xiao Bian, Colin James Parris, Bernard Patrick Bewlay, Masako Yamada, Shaopeng Liu, Peng Chu
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Patent number: 10861148Abstract: A system includes a borescope and at least one processor. The borescope includes a camera configured to acquire an acquisition series of frames of at least one target component. The at least one processor is operably coupled to the camera, and is configured to acquire the acquisition series of frames from the camera; determine a blurriness metric value for each of the frames; select frames that satisfy a threshold for the blurriness metric value to form an inspection series of frames; and perform an inspection analysis for the at least one target component using the inspection series of frames.Type: GrantFiled: April 30, 2018Date of Patent: December 8, 2020Assignee: GENERAL ELECTRIC COMPANYInventors: Wei Wang, Longyin Wen, Xiao Bian, Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay
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Patent number: 10755401Abstract: An inspection system includes one or more imaging devices and one or more processors. The imaging devices generate a first set of images of a work piece at a first position relative to the work piece and a second set of images of the work piece at a second position relative to the work piece. At least some of the images in the first and second sets are acquired using different light settings. The processors analyze the first set of images to generate a first prediction image associated with the first position, and analyze the second set of images to generate a second prediction image associated with the second position. The first and second prediction images include respective candidate regions. The processors merge the first and second prediction images to detect at least one predicted defect in the work piece depicted in at least one of the candidate regions.Type: GrantFiled: December 4, 2018Date of Patent: August 25, 2020Assignee: General Electric CompanyInventors: Xiao Bian, Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay, Steeves Bouchard, Jean-Philippe Choiniere, Marc-Andre Marois, Stephane Harel, John Karigiannis
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Patent number: 10746667Abstract: An inspection system includes an imaging device, visible light source, ultraviolet light source, and at least one processor. The imaging device generates a first image set of a work piece while the ultraviolet light source illuminates the work piece with ultraviolet light to cause fluorescent dye thereon to emit light, and generates a second image set of the work piece while the visible light source illuminates the work piece with visible light. The first and second image sets are generated at the same positions of the imaging device relative to the work piece. The processor maps the second image set to a computer design model of the work piece based on features depicted in the second image set and the positions of the imaging device. The processor determines a defect location on the work piece based on an analysis of the first image set and the computer design model.Type: GrantFiled: November 27, 2018Date of Patent: August 18, 2020Assignee: General Electric CompanyInventors: Xiao Bian, John Karigiannis, Stephane Harel, Steeves Bouchard, Maxime Beaudoin Pouliot, Wayne Grady, David Scott Diwinsky, Bernard Patrick Bewlay
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Patent number: 10726543Abstract: An inspection system includes one or more processors that obtain a first image of a work piece that has a fluorescent dye thereon in an ultraviolet (UV) light setting and a second image of the work piece in a visible light setting. The first and second images are generated by one or more imaging devices in the same position relative to the work piece. The one or more processors identify a candidate region of the first image based on a light characteristic of one or more pixels, and determine a corresponding candidate region of the second image that is at an analogous location as the candidate region of the first image. The one or more processors analyze both candidate regions to detect a potential defect on a surface of the work piece and a location of the potential defect relative to the surface of the work piece.Type: GrantFiled: November 27, 2018Date of Patent: July 28, 2020Assignee: General Electric CompanyInventors: Xiao Bian, Steeves Bouchard, David Cantin, Stephane Harel, John Karigiannis, David Scott Diwinsky, Bernard Bewlay
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Publication number: 20200223069Abstract: Methods and systems for controlling a snake-arm robot. In an embodiment, a server computer receives real-time image data associated with at least one of an operating environment and a location of a workpiece from an optical sensor mounted on a robot head of a snake-arm robot, and receives, input data describing a desired pose of the robot head from a user device. The server computer then computes a desired velocity of the robot head using an image Jacobian, translates the desired velocity of the robot head into incremental displacement data and rotation data within a control cycle, computes a position of each of a plurality of links comprising a snake-arm of the snake-arm robot to follow motion of the robot head, computes a current position of each of the plurality of links utilizing a forward dynamics model, and computes force and torque data required to move at least one of a plurality of joints connecting the links to move the snake-arm robot to the desired pose.Type: ApplicationFiled: January 10, 2019Publication date: July 16, 2020Inventors: Huan TAN, Xiao BIAN, Todd DANKO
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Publication number: 20200175669Abstract: An inspection system includes one or more imaging devices and one or more processors. The imaging devices generate a first set of images of a work piece at a first position relative to the work piece and a second set of images of the work piece at a second position relative to the work piece. At least some of the images in the first and second sets are acquired using different light settings. The processors analyze the first set of images to generate a first prediction image associated with the first position, and analyze the second set of images to generate a second prediction image associated with the second position. The first and second prediction images include respective candidate regions. The processors merge the first and second prediction images to detect at least one predicted defect in the work piece depicted in at least one of the candidate regions.Type: ApplicationFiled: December 4, 2018Publication date: June 4, 2020Inventors: Xiao Bian, Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay, Steeves Bouchard, Jean-Philippe Choiniere, Marc-Andre Marois, Stephane Harel, John Karigiannis
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Publication number: 20200166467Abstract: An inspection system includes an imaging device, visible light source, ultraviolet light source, and at least one processor. The imaging device generates a first image set of a work piece while the ultraviolet light source illuminates the work piece with ultraviolet light to cause fluorescent dye thereon to emit light, and generates a second image set of the work piece while the visible light source illuminates the work piece with visible light. The first and second image sets are generated at the same positions of the imaging device relative to the work piece. The processor maps the second image set to a computer design model of the work piece based on features depicted in the second image set and the positions of the imaging device. The processor determines a defect location on the work piece based on an analysis of the first image set and the computer design model.Type: ApplicationFiled: November 27, 2018Publication date: May 28, 2020Inventors: Xiao Bian, John Karigiannis, Stephane Harel, Steeves Bouchard, Maxime Beaudoin Pouliot, Wayne Grady, David Scott Diwinsky, Bernard Patrick Bewlay
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Publication number: 20200167202Abstract: The example embodiments are directed to a system and method for cold start deployment of an ML model for an edge system associated with an industrial asset. In one example, the method may include one or more of storing machine learning (ML) models and local edge information where the ML models are already deployed, receiving, via a network, meta information of an edge system associated with an industrial asset in response to a cold start of the edge system, dynamically determining an optimum ML model for the cold start of the edge system from among the already deployed ML models based on the received meta information and the local edge information, and transmitting the determined optimum ML model to the edge system.Type: ApplicationFiled: November 26, 2018Publication date: May 28, 2020Inventors: Dayu HUANG, Colin PARRIS, Xiao BIAN, Huan TAN, Kiersten RALSTON, Shaopeng LIU, Guiju SONG
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Publication number: 20200167905Abstract: An inspection system includes one or more processors that obtain a first image of a work piece that has a fluorescent dye thereon in an ultraviolet (UV) light setting and a second image of the work piece in a visible light setting. The first and second images are generated by one or more imaging devices in the same position relative to the work piece. The one or more processors identify a candidate region of the first image based on a light characteristic of one or more pixels, and determine a corresponding candidate region of the second image that is at an analogous location as the candidate region of the first image. The one or more processors analyze both candidate regions to detect a potential defect on a surface of the work piece and a location of the potential defect relative to the surface of the work piece.Type: ApplicationFiled: November 27, 2018Publication date: May 28, 2020Inventors: Xiao Bian, Steeves Bouchard, David Cantin, Stephane Harel, John Karigiannis, David Scott Diwinsky, Bernard Bewlay
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Publication number: 20200167652Abstract: The example embodiments are directed to a system and method for cold start deployment of an ML model for an edge system associated with an industrial asset. In one example, the method may include one or more of storing an incremental ML model comprising a plurality increments which sequentially increase a complexity of a predictive function of the incremental ML model, receiving performance information from an edge system that processes incoming data of an industrial asset using a current increment of the incremental ML model, dynamically determining to modify the current increment of the incremental ML model used by the edge system with a next increment of the incremental ML model having increased complexity based on the received performance information, and transmitting the next increment of the incremental ML model to the edge system.Type: ApplicationFiled: November 26, 2018Publication date: May 28, 2020Inventors: Dayu HUANG, Colin PARRIS, Xiao BIAN, Huan TAN, Kiersten RALSTON, Shaopeng LIU, Guiju SONG