Abstract: The present invention discloses a method for extracting a trap time constant of a gate dielectric layer in a semiconductor device, which is related to the reliability of microelectronic devices. The method comprises initializing a state of a trap in the semiconductor device so that the trap finally comes to an empty state; applying a DC or AC signal to a gate terminal and a zero bias Vd1 to a drain terminal; after a period of time t1, applying small voltages Vg2 and Vd2 to the gate and drain terminals respectively, and detecting a state of a drain current Id; modifying the time t1 to t2=t1+?t while maintaining other conditions; repeatedly performing the previous steps in a same manner to perform N times of measurements for N numbers of time points t1, t1+?t, . . .

Abstract: Apparatuses (10) for reporting problems in cable systems comprising cables (101) and loads (111-115) connected to the cables via fuses (121-125) are provided with first circuits (1) for detecting the fuses (121-125) going from conducting to non-conducting modes or having reached non-conducting modes, second circuits (2) for changing impedances of the cable systems at locations near the apparatuses (10) by introducing one or more impedance elements at the locations, and third circuits (3) for bringing the second circuits (2) into activated modes in response to detection results from the first circuits (1). The second circuits (2) may comprise capacitors (4) and the third circuits (3) may comprise switches (5).

Abstract: Devices (1) for detecting problems in cable systems with cables (4) and loads (5-8) comprise first circuits (11) for providing first signals to the cables (4), second circuits (12) for measuring parameters of second signals that are responses to the first signals, and third circuits (13) for detecting the problems in response to changes in values of the parameters. The loads (5-8) may comprise mutually parallel loads each showing a capacitive behavior. The problems may comprise interruptions in the cables (4) that result in changes in capacitances of the cable system and in the changes in the values of the parameters. The devices (1) may further comprise fourth circuits (14) for discharging the capacitances, fifth circuits (15) for deriving positions of the problems from the changes in the values of the parameters, and sixth circuits (16) for feeding at least one other circuit (11-15) and/or for activating at least one other circuit (11-15) in response to cable system information and/or timing information.