Abstract: Methods and systems for detecting defects in an array region on a specimen are provided. One system includes an inspection subsystem configured for generating output responsive to patterned features formed in an array region on a specimen. The system also includes a computer subsystem configured for determining if a pitch of the patterned features in the output is an integer of pixels in a detector of the inspection subsystem that generated the output. When the pitch is not an integer of the pixels, the computer subsystem is configured for interpolating the output to generate interpolated output having a modified pitch of the patterned features in the interpolated output that is an integer of the pixels. The computer subsystem is also configured for detecting defects in the array region by applying a defect detection method to the interpolated output.

Abstract: Methods and systems for aligning images of different layers on a specimen are provided. The embodiments may be particularly useful for singular value decomposition (SVD) based cross-layer alignment for defect detection. One system includes a computer subsystem configured for generating first and second SVD based noise images for first and second images, respectively, of first and second layers, respectively, on a specimen. The first layer is formed subsequent to formation of the second layer on the specimen. The computer subsystem is also configured for computing one or more global offsets by aligning the first SVD based noise images to the second SVD based noise images, applying the one or more global offsets to the second images to thereby align the second images to the first images, and determining information for the specimen based on the aligned first and second images.

Abstract: An imaging catheter, a tip, a tube body and a medical device, relating to the field of medical instruments, where the imaging catheter includes a tube body and a tip, the tube body includes a first shuttling wall and a second shuttling wall, a first lumen is formed between the first shuttling wall and the second shuttling wall, the tip includes a first mounting wall and a second mounting wall, and a second lumen is formed between the first mounting wall and the second mounting wall. The second lumen is communicated with the first lumen, and a proximal end of the first mounting wall corresponds between the first shuttling wall and the second shuttling wall. A radial distance between a point m and a point n is a, and an inner diameter of the first lumen is b, where a?b.

Abstract: A biomedical device includes a zinc-based material including a matrix including zinc, and nanostructures dispersed in the matrix. Embodiments of this disclosure are directed to zinc (Zn)-based materials including dispersed nanostructures for biomedical applications and devices, such as bioresorbable vascular stents, bioresorbable ureteral stents, endoluminal springs for distraction enterogenesis, biodegradable bone implants with tunable modulus, guided bone generation membranes, bioresorbable dental membranes, and other biomedical implants, as well as other functional applications, such as biodegradable electronics and sensors.

Abstract: Methods and systems for detecting defects on a specimen are provided. One system performs double detection in which at least one of the reference images compared to a test image is a computed reference image generated from multiple images corresponding to the test image. The other reference image may or may not be computed from more than one of the multiple images. Such a computed reference image may also be a median-based computed reference generated from multiple-median images generated from different subsets of images in a job of images generated by an inspection subsystem for a specimen. Such a system may also group images for a die row on a specimen into different jobs based on color so that different jobs have different color value ranges. Such grouping may also be performed so that each of the jobs includes a number of images greater than a predetermined, minimum job size.

Abstract: An optical inspection system includes an optical device and an image processing device. The optical device includes a light source and an image sensor. The light source is configured to generate a first laser beam and direct the first laser beam through an illuminator to be an incident laser beam toward a wafer, so as to generate a reflected laser beam accordingly. The image sensor is configured to capture the reflected laser beam through an objective to be a second laser beam and generate an image of the wafer accordingly. The image processing device is configured to generate a detection result according to the image. A wavelength of the incident laser beam is less than 120 nm.

Abstract: Provided are an antibody specifically binding to 4-1BB and an antigen-binding fragment thereof. The antibody specifically binding to 4-1BB and the antigen-binding fragment of the antibody have high specificity, and after being binded to an antigen, the antibody and the antigen-binding fragment thereof can enhance an immune killing function of T cells, can induce activation of immune cells and promote secretion of cytokines, and can significantly inhibit the growth of tumors in the body.

Abstract: Provided are an antibody specifically binding to CD47 and an antigen-binding fragment thereof. The antibody and the antigen-binding fragment thereof have high specificity and stability, can specifically block a CD47-SIPR? pathway, do not cause hemagglutination within a certain concentration range, and thus can significantly suppress tumor growth in vivo.

Abstract: An imaging catheter and an imaging device relate to a technical field of medical devices. The imaging catheter includes a metal wire tube, a tip and a retaining ring. A metal wire exposed at one end of the metal wire tube forms a conductive end, which is electrically connected with the tip so as to allow the metal wire to be used as a conductive medium to lead static electricity out of the tip, thereby reducing effects of static electricity on a photographing assembly at the tip, and the harm of static electricity to human body. The retaining ring covers the conductive end and is connected with the tip, so as to make the metal wire tube fixedly connected with the tip.

Abstract: A method for in-situ swath positioning includes generating an in-situ swath positioning database by selecting a plurality of high contrast alignment targets from a set of pixel-to-design alignment images within a pixel-to-design alignment database. The method includes performing a first runtime swath of a plurality of runtime dies, where each runtime frame associated with the first runtime swath includes a high contrast alignment target from the in-situ swath positioning database. The method may include determining one or more offset values for each runtime die based on the plurality of high contrast alignment targets and one or more runtime frames associated with the first runtime swath. The one or more offset values may include an x-offset value and a y-offset value for each die. The method may include adjusting an initial stage position based on the determined one or more offset values prior to performing a second runtime swath.

Abstract: A metal matrix nanocomposite includes: (1) a matrix including an aluminum alloy; and (2) nanostmctures dispersed in the matrix, wherein the matrix includes grains having aspect ratios of about 3 or less. Manufacturing processes include subjecting the nanocomposite to solidification processing, fusion welding, extrusion, thixocasting, additive manufacturing, and heat treatment.

Abstract: A large-space high-temperature and high-pressure true triaxial flexible loading device includes a cylinder reaction frame, which includes a cylinder, a lower shear ring, an upper shear ring, a bottom cover, and a top cover, wherein the bottom cover and the top cover are detachably mounted at a bottom and a top inside the cylinder respectively, and an interior of the cylinder is divided to form a loading space for performing a triaxial test on a square test block; the lower shear ring is detachably embedded on an inner wall of the cylinder below the bottom cover; the upper shear ring is detachably embedded on the inner wall of the cylinder above the top cover; a confining pressure reaction frame, mounted in the loading space around the square test block; and, flexible loading mechanisms, disposed in pairs at two opposed side surfaces of the square test block.

Abstract: Nanocomposite ceramic or glass materials are disclosed herein, which include a matrix material and one or more nanostructures dispersed within the matrix material. The nanostructures may comprise one or more core-shell nanostructures including a core nanostructure and a shell material. The shell material may be different from the material making up the core nanostructure and may improve the wettability of the core-shell nanostructure, the dispersion of the core-shell nanostructure within the matrix material, or make the core-shell nanostructure more resistant to oxidation, when compared to the core nanostructure alone. Methods of making nanocomposite ceramic or glass materials are also disclosed herein.

Abstract: Methods and systems for detecting defects on a specimen are provided. One system computes different candidate reference images from different combinations of images of the specimen generated by an inspection subsystem and combines different portions of the candidate reference images without modification to thereby generate a final reference image. The final reference image is then used for defect detection, which may be single or double detection. The embodiments are particularly useful for defect detection in areas of specimens including only non-resolvable, repeating device patterns, like cell regions, but may be used for inspection of other types of areas as well.

Abstract: Systems and methods for detecting defects on a reticle are provided. One system is configured for generating different stacked difference images for multiple instances of first patterned areas in different rows on a wafer based on images generated for the first patterned areas in the different rows. The system is also configured for performing double detection based on the different stacked difference images. The system then identifies defects on the reticle based on the defects detected by the double detection. As described further herein, the systems and methods detect defects from multiple reticle rows printed on a wafer, which can reduce noise and enable detection of substantially small repeater defects. The embodiments are particularly useful for high sensitivity repeater defect detection for extreme ultraviolet (EUV) reticles and multi-die reticles (MDR).

Abstract: A rendered image is generated from a semiconductor device design file. The rendered image is segmented based on a grey level of the rendered image. Care areas are determined based on the segmenting. Defect inspection is performed in the care areas. This process can be performed on a wafer inspection tool that uses photon optics or electron beam optics.

Abstract: Methods and systems for detecting defects on a specimen are provided. One system computes different candidate reference images from different combinations of images of the specimen generated by an inspection subsystem and combines different portions of the candidate reference images without modification to thereby generate a final reference image. The final reference image is then used for defect detection, which may be single or double detection. The embodiments are particularly useful for defect detection in areas of specimens including only non-resolvable, repeating device patterns, like cell regions, but may be used for inspection of other types of areas as well.

Abstract: Methods and systems for detecting defects in an array region on a specimen are provided. One system includes an inspection subsystem configured for generating output responsive to patterned features formed in an array region on a specimen. The system also includes a computer subsystem configured for determining if a pitch of the patterned features in the output is an integer of pixels in a detector of the inspection subsystem that generated the output. When the pitch is not an integer of the pixels, the computer subsystem is configured for interpolating the output to generate interpolated output having a modified pitch of the patterned features in the interpolated output that is an integer of the pixels. The computer subsystem is also configured for detecting defects in the array region by applying a defect detection method to the interpolated output.

Abstract: Disclosures herein are directed to antibodies and epitope binding agents that specifically bind to the extracellular domain of Patched-1 and compositions thereof for use in clinical and non-clinical applications. Also provided are methods to treat and/or prevent Hedgehog pathway related disorders.