Abstract: The present invention discloses a non-interferometric, non-iterative complex amplitude reading method and apparatus. The reading method includes the following steps: diffracting a light beam containing amplitude information and phase information to obtain a diffraction pattern with intensity variations; constructing a diffraction intensity-complex amplitude model and training it based on the correlation between the diffraction pattern and amplitude information and phase information, and applying the trained model directly to new diffraction images to obtain amplitude information and phase information. The method can achieve detection of complex amplitude information, including amplitude and phase, from a single diffraction image, improve the stability and accuracy of phase reading results, increase the calculation speed, and simplify the optical system. It is suitable for applications in holographic storage, biomedical image processing, and microscopic imaging, among others.

Abstract: Disclosed herein is a defect inspection apparatus including: a light source for emitting laser light; a mirror group for splitting the wave surface of incident laser light emitted by the light source into a plurality of component wave surfaces, arranging the component wave surfaces to form an array oriented in one direction and aligning the component wave surfaces to form a single wave surface after propagating the laser light through a moving object of measurement; an interferometer for splitting the single wave surface into two partial wave surfaces to create an interference stripe; an imaging section for taking an image of the interference stripe created by the interferometer; and an analysis section for detecting a defect existing on the surface of the moving object of measurement on the basis of changes of the image, which has been taken as the image of the interference stripe, with the lapse of time.

Abstract: Disclosed herein is a defect inspection apparatus including: a light source for emitting laser light; a mirror group for splitting the wave surface of incident laser light emitted by the light source into a plurality of component wave surfaces, arranging the component wave surfaces to form an array oriented in one direction and aligning the component wave surfaces to form a single wave surface after propagating the laser light through a moving object of measurement; an interferometer for splitting the single wave surface into two partial wave surfaces to create an interference stripe; an imaging section for taking an image of the interference stripe created by the interferometer; and an analysis section for detecting a defect existing on the surface of the moving object of measurement on the basis of changes of the image, which has been taken as the image of the interference stripe, with the lapse of time.

Abstract: The present invention provides an image display device allowing accurate detection of a pointed position on a projection image to be achieved. The image display device include: an image light generating section generating image light based on an input video signal; a projecting section projecting the image light onto a screen to form a projection image; a reflection light splitting section splitting part of reflection light of the projection image from the screen to another direction; a light receiving section receiving the split light; an image generating/obtaining section generating a display image from the video signal and obtaining the projection image corresponding to the inputted video signal from the light receiving section; a position detecting section detecting a position pointed out on the projection image as a pointed position based on the display image and the projection image to output information of the pointed position on the projection image.