Abstract: In accordance with embodiments disclosed herein, systems, methods, and computer programs are provided that determine a mechanical property of a subject. An excitation force is applied to a displacement origin within a subject, and a shear wave is generated in response to application of the excitation force. The displacement data indicative of displacement motion at the sample position is sampled by tracking pulses, and the timing of at least one of the tracking pulses is adjusted relative to application of the excitation force. The process continues until a peak displacement of the shear wave for the sample position is determined based upon the displacement data.

Abstract: A method of acquiring ultrasound images for a rheumatoid arthritis examination comprises receiving a hand in a scanning assembly including a transducer array and a fluid providing an acoustic coupling between the transducer array and the hand and identifying locations of a plurality of finger joints of the hand while the hand is held stationary in the scanning assembly. Ultrasound images of the plurality of finger joints are acquired with the transducer array while the hand is held stationary in the scanning assembly, wherein the ultrasound images are of an area less than an entire area of the hand based on the identified locations of the finger joints of the hand.

Abstract: A method for eliminating background noises in shear waves and the respective ultrasonic imaging system, the method includes: transmitting a push pulse along a push pulse vector; transmitting a first group of focus track pulses at a first group of a plurality of locations far away from the push pulse vector; receiving a first group of focus echo signals in response to the first group of focus track pulses; and processing the first group of focus echo signals to determine a first group of tissue displacement information varying with time.

Abstract: An apparatus comprising a convex probe, a receiver and an image generating device. The convex probe includes a number of transducer elements configured to transmit a number of sets of ultrasound signals. Each set of the ultrasound signals includes a non-steered frame and at least one steered frame angled toward the non-steered frame. The receiver is coupled to the probe and configured to receive a non-steered echo frame for the non-steered fame and at least one steered echo frame for the at least one steered frame. The image generating device is coupled to the receiver and configured to generate a non-steered image using the non-steered echo frame and a needle-enhancement image using the steered echo frame and combine the non-steered image and the needle-enhancement image into a compound image.

Abstract: A test system and method for low voltage differential signaling (LVDS) is provided. The system comprises: an input module for the user to input the information needed by the test; a communication module for connecting the control device 110 and the oscilloscope 120 using the communication means selected by the user; a measurement module for measure the parameters of the LVDS signal thought controlling a oscilloscope; an assessment module for assessing whether the obtained parameters of the LVDS signal comply with relevant LVDS specifications; and an output module for outputting the parameters of the LVDS signal and the assessment result of the parameters from the assessment module. The test system and method for LVDS provided by the present invention can advantageously meet the competitive needs in fast mass production and efficient engineering qualification.

Abstract: A double tilt sample holder for in-situ measuring mechanical and electrical properties of microstructures in transmission electron microscope (TEM) is provided. The sample holder includes a home-made hollow sample holder body, a sensor for measuring mechanical/electrical properties, a pressing piece, a sample holder head, a sensor carrier. The sensor for measuring mechanical/electrical properties is fixed on the sensor carrier on the sample holder head by the pressing piece, while the sensor carrier is connected to the sample holder head through a pair of supporting shafts located on sides of the sample holder head. The sensor carrier can tilt within the plane perpendicular to the ample holder head by revolving around the supporting shafts (i.e. tilting along Y axis at an angle of ±30°). The sample holder also allows obtaining mechanical/electrical parameters concurrently.

Abstract: In accordance with embodiments disclosed herein, systems, methods, and computer programs are provided that determine a mechanical property of a subject. An excitation force is applied to a displacement origin within a subject, and a shear wave is generated in response to application of the excitation force. The displacement data indicative of displacement motion at the sample position is sampled by tracking pulses, and the timing of at least one of the tracking pulses is adjusted relative to application of the excitation force. The process continues until a peak displacement of the shear wave for the sample position is determined based upon the displacement data.

Abstract: A double tilt sample holder for in-situ measuring mechanical and electrical properties of microstructures in transmission electron microscope (TEM) is provided. The sample holder includes a home-made hollow sample holder body, a sensor for measuring mechanical/electrical properties, a pressing piece, a sample holder head, a sensor carrier. The sensor for measuring mechanical/electrical properties is fixed on the sensor carrier on the sample holder head by the pressing piece, while the sensor carrier is connected to the sample holder head through a pair of supporting shafts located on sides of the sample holder head. The sensor carrier can tilt within the plane perpendicular to the ample holder head by revolving around the supporting shafts (i.e. tilting along Y axis at an angle of ±30°). The sample holder also allows obtaining mechanical/electrical parameters concurrently.

Abstract: A sensor for quantitative testing electromechanical properties and microstructure of nano-materials and a manufacturing method for the sensor are provided. The sensor comprises a suspended structure, pressure-sensitive resistor cantilevers, support beams, bimetallic strip and other components. When the bimetallic strip produces bending deformation, one of the pressure-sensitive resistor cantilevers is actuated and then stretches the low-dimensional nano-materials which drive the other pressure-sensitive resistor cantilever to bend. Through signal changes are outputted by the Wheatstone bridge, the variable stresses of low-dimensional nano-materials are obtained. Meanwhile, the variable strains of low-dimensional nano-materials are obtained by the horizontal displacements between two cantilevers, so the stress-strain curves of low-dimensional nano-materials are worked out. When the low-dimensional nano-materials are measured in the power state, the voltage-current curves are also obtained.

Abstract: A system for modeling electrical activity of an anatomical structure. The system includes a database that is configured to store cell set data corresponding to a group of cells of the anatomical structure. The cell set data includes a cell model that represents electrical activity of the group of cells. The cell model has a model parameter that relates to ion channels in the cells. The electrical activity represented by the cell model is at least partially based upon the model parameter. The system also includes a user interface that is configured to accept user inputs to change the model parameter and thereby change the electrical activity represented by the cell model to form a reconfigured cell model. The system also includes a display that is configured to display the user inputs and a processor that is configured to determine the electrical activity of the anatomical structure using the reconfigured cell model.

Abstract: A device for measuring electromechanical properties and microstructure of nano-materials under stress state comprises two bimetallic strips placed on an insulated metal ring plated with insulating paint, wherein the two bimetallic strips are placed in parallel or V-shaped to insulated metal ring on the same plane, one end of each bimetallic strip is fixed on the insulated metal ring, the other end of the bimetallic strip hangs inside of the insulated ring, the distance of two bimetallic strips were controlled within 0.002-1 mm. Also provided is a method for measuring electromechanical properties and microstructure of nano-materials under stress state.

Abstract: A sensor for quantitative test electromechanical properties and microstructure of nano-materials and a manufacturing method for the sensor are provided. The sensor comprises a suspended structure, pressure-sensitive resistor cantilevers, support beams, bimetallic strip and other components. When the bimetallic strip produces bending deformation, one of the pressure-sensitive resistor cantilevers is actuated and then stretches the low-dimensional nano-materials which drive the other pressure-sensitive resistor cantilever to bend. Through signal changes are outputted by the Wheatstone bridge, the variable stresses of low-dimensional nano-materials are obtained. Meanwhile, the variable strains of low-dimensional nano-materials are obtained by the horizontal displacements between two cantilevers, so the stress-strain curves of low-dimensional nano-materials are worked out. When the low-dimensional nano-materials are measured in the power state, the voltage-current curves are also obtained.

Abstract: A device for measuring electromechanical properties and microstructure of nano-materials under stress state comprises two bimetallic strips placed on an insulated metal ring plated with insulating paint, wherein the two bimetallic strips are placed in parallel or V-shaped to insulated metal ring on the same plane, one end of each bimetallic strip is fixed on the insulated metal ring, the other end of the bimetallic strip hangs inside of the insulated ring, the distance of two bimetallic strips were controlled within 0.002-1 mm. Also provided is a method for measuring electromechanical properties and microstructure of nano-materials under stress state.

Abstract: An N-glycosylated glycoprotein, having the molecular weight of 105 kDa when glycosylated and 85 kDa when non-glycosylated, is present on the surface of BL3 hematopoietic stem cells, but is absent from the surfaces of other cells including 32D and FDC-P1 myeloid progenitor cells, EL4 T-cells and 3T3 fibroblasts. Antibody which binds the gp105 protein inhibits the proliferation of BL3 cells that occurs in BL3-conditioned medium (BL3CM). It also can inhibit preferentially the formation of fetal liver cell-derived, multi-lineage colonies in vitro, and the development of bone marrow cell-derived, spleen colony-forming unit foci in vivo. Anti-gp105 antibody can be employed in making a preparation that is enriched for hematopoietic stem cells. Substantially purified from other proteins, the gp105 protein itself is a useful reagent for isolating and characterizing the factor(s) responsible for the proliferative effect of BL3CM.