Abstract: A method for detecting concentration of iodine in water samples. An arsenite-containing test solution, a tetravalent cerium ion-containing test solution and a series of iodine-containing standard solutions are prepared. The standard solutions are added to primary wells of a microplate, respectively. A water sample is added to a secondary well. The arsenite-containing test solution and the tetravalent cerium ion-containing test solution are sequentially added to the primary wells and the secondary well. Reaction mixture in each well is reacted and then measured for absorbance by a detector. A standard curve is plotted according to the absorbance of each primary well and a concentration of each iodine-containing standard solution. The absorbance of the sample is plugged into the standard curve to obtain an iodine concentration in the sample.

Abstract: A method for detecting concentration of iodine in water samples. An arsenite-containing test solution, a tetravalent cerium ion-containing test solution and a series of iodine-containing standard solutions are prepared. The standard solutions are added to primary wells of a microplate, respectively. A water sample is added to a secondary well. The arsenite-containing test solution and the tetravalent cerium ion-containing test solution are sequentially added to the primary wells and the secondary well. Reaction mixture in each well is reacted and then measured for absorbance by a detector. A standard curve is plotted according to the absorbance of each primary well and a concentration of each iodine-containing standard solution. The absorbance of the sample is plugged into the standard curve to obtain an iodine concentration in the sample.

Abstract: A test system (200) for testing for missing or shorted parts within a tuner circuit includes a signal generator (202) for applying a harmonic-containing baseband time varying RF test signal to the tuner circuit. The tuner circuit is tuned to a harmonic of test signal. A detector 208 coupled to the baseband IF output of the tuner circuit detects the voltage generated in response to the applied RF test signal. A voltage measurement device (210) measures voltage detected by detector to provide an indication of the gain. Significant changes in the gain indicate missing part(s) or short circuits.

Abstract: A test system (200) for testing for missing or shorted parts within a tuner circuit includes a signal generator (202) for applying a harmonic-containing baseband time varying RF test signal to the tuner circuit. The tuner circuit is tuned to a harmonic of test signal. A detector 208 coupled to the baseband IF output of the tuner circuit detects the voltage generated in response to the applied RF test signal. A voltage measurement device (210) measures voltage detected by detector to provide an indication of the gain. Significant changes in the gain indicate missing part(s) or short circuits.