Abstract: Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

Abstract: Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

Abstract: Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

Abstract: An apparatus and method of performing sample characterization with an AFM and a pulsed IR laser directed at the tip of a probe of the AFM. The laser pulses are synchronized with the oscillatory drive of the AFM and may only interact with the tip/sample on selected cycles of the oscillation. Peak force tapping mode is preferred for AFM operation. Nano-mechanical and nano-spectroscopic measurements can be made with sub-50 nm, and even sub-20 nm, resolution.

Abstract: An apparatus and method of performing sample characterization with an AFM and a pulsed IR laser directed at the tip of a probe of the AFM. The laser pulses are synchronized with the oscillatory drive of the AFM and may only interact with the tip/sample on selected cycles of the oscillation. Peak force tapping mode is preferred for AFM operation. Nano-mechanical and nano-spectroscopic measurements can be made with sub-50 nm, and even sub-20 nm, resolution.

Abstract: An s-SNOM near-field system containing an interferometer and configured to utilize IR-light output from a laser-driven plasma source of light. The system is equipped with (i) spectral and/or spatial filter(s) chosen to dimension the image of the plasma source formed at the tip of the system be substantially co-extensive with the tip, and/or (ii) an optical-inspection unit, located outside and not being part of the interferometer, that is structured to ensure that plasma source is imaged onto the tip of the system without astigmatism. The plasma-containing component(s) of the plasma source is/are engineered to have IR-light-output maximized in mid-IR range.

Abstract: The present disclosure provides a procedure and an apparatus to obtain the absorption profiles of molecular resonance with ANSOM. The method includes setting a reference field phase to ?=0.5? relative to the near-field field, and reference amplitude A?5|?eff|. The requirement on phase precision is found to be <0.3?. The apparatus includes a phase stabilization mechanism in addition to the ANSOM to maintain high phase precision homodyne phase condition of less than 0.1 rad. This method enables ANSOM performing vibrational spectroscopy at nanoscale spatial resolution.

Abstract: The present disclosure provides a procedure and an apparatus to obtain the absorption profiles of molecular resonance with ANSOM. The method includes setting a reference field phase to ?=0.5? relative to the near-field field, and reference amplitude A?5|?eff|. The requirement on phase precision is found to be <0.3?. The apparatus includes a phase stabilization mechanism in addition to the ANSOM to maintain high phase precision homodyne phase condition of less than 0.1 rad. This method enables ANSOM performing vibrational spectroscopy at nanoscale spatial resolution.

Abstract: The present disclosure provides a procedure to obtain the absorption profiles of molecular resonance with ANSOM. The method includes setting a reference field phase to ?=0.5 ? relative to the near-field field, and reference amplitude A?5|?eff|. The requirement on phase precision is found to be <0.3 ?. This method enables ANSOM performing vibrational spectroscopy at nanoscale spatial resolution.