Abstract: A system is proposed for continuously monitoring the integrity of a transmission fiber coupled to a laser source and immediately shutting down the laser source upon recognition of any type of cut, break or disconnect along the transmission fiber. A pair of monitoring photodiodes is included with the laser source and used to look at the ratio of reflected light to transmitted light, shutting down the laser if the ratio exceeds a given threshold. If a break is present, the power of the reflected light will be higher than normal, where a defined threshold is used to determine of the calculated intensity is indicative of a break. By using measurements performed in terms of decibels, the monitoring system needs only to take the difference in intensities to generate the reflection/transmission ratio output.

Abstract: Technologies for atomic force microscopy (AFM)-based photothermal two-dimensional infrared (2DIR) spectroscopy are disclosed. Techniques may comprise providing pulsed light from an infrared (IR) laser source. A pulse sequence may be generated from the IR light. The pulse sequence may comprise one or more time delays among constituent pulses. The pulsed IR light may be focused on matter in a sample region. The pulsed IR light may interact with the matter in the sample region. One or more photothermal expansion mechanical actions in the matter of the sample region may be measured. One or more signals corresponding to the one or more measured photothermal expansion actions may be created and may be recorded as a function of the one or more time delays. A photothermal two-dimensional (2D) spectrum may be extracted from the one or more signals as recorded as a function of the one or more time delays.

Abstract: A nanocrystal film product formed by one-step ligand exchange includes at least one dimension greater than 100 nm and ordered nanocrystals characterized as having a domain size of greater than 100 nm.

Abstract: Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

Abstract: A method includes at least partially submerging a substrate in a colloidal mixture of nanocrystals and a first solvent. The nanocrystals have first ligands coupled thereto. The method also includes applying an electric field to the colloidal mixture to form a solvated nanocrystal film and removing the solvated nanocrystal film from the first solvent. The method further includes applying a second solvent to the solvated nanocrystal film for ligand exchange. The second solvent comprises second ligands. A nanocrystal film product formed by one-step ligand exchange includes at least one dimension greater than 100 nm and ordered nanocrystals characterized as having a domain size of greater than 100 nm.

Abstract: An apparatus and method of performing sample characterization with an AFM and a pulsed IR laser directed at the tip of a probe of the AFM. Gated laser pulsing and gated detection based on a lock-in amplifier, boxcar integrator or FFT may be employed in Peak force tapping operation. Nano-spectroscopic measurements with sub-20 nm, and even sub-10 nm resolution can be executed together with nano-mechanical and other property measurements.

Abstract: A system is proposed for continuously monitoring the integrity of a transmission fiber coupled to a laser source and immediately shutting down the laser source upon recognition of any type of cut, break or disconnect along the transmission fiber. A pair of monitoring photodiodes is included with the laser source and used to look at the ratio of reflected light to transmitted light, shutting down the laser if the ratio exceeds a given threshold. If a break is present, the power of the reflected light will be higher than normal, where a defined threshold is used to determine of the calculated intensity is indicative of a break. By using measurements performed in terms of decibels, the monitoring system needs only to take the difference in intensities to generate the reflection/transmission ratio output.

Abstract: Methods of forming joinery between components formed from dissimilar materials, and assemblies utilizing the joinery. The components include interface surfaces having complementary peaks and valleys that interlock. A compliant interface is formed between the interface surfaces and the interface can be configured to provide functionality.

Abstract: Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

Abstract: Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

Abstract: A method includes at least partially submerging a substrate in a colloidal mixture of nanocrystals and a first solvent. The nanocrystals have first ligands coupled thereto. The method also includes applying an electric field to the colloidal mixture to form a solvated nanocrystal film and removing the solvated nanocrystal film from the first solvent. The method further includes applying a second solvent to the solvated nanocrystal film for ligand exchange. The second solvent comprises second ligands. A nanocrystal film product formed by one-step ligand exchange includes at least one dimension greater than 100 nm and ordered nanocrystals characterized as having a domain size of greater than 100 nm.

Abstract: Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

Abstract: An apparatus and method of performing sample characterization with an AFM and a pulsed IR laser directed at the tip of a probe of the AFM. The laser pulses are synchronized with the oscillatory drive of the AFM and may only interact with the tip/sample on selected cycles of the oscillation. Peak force tapping mode is preferred for AFM operation. Nano-mechanical and nano-spectroscopic measurements can be made with sub-50 nm, and even sub-20 nm, resolution.

Abstract: A system includes a surface coupled edge emitting laser that includes a core waveguide, a fan out region optically coupled to the core waveguide in a same layer of the surface coupled edge emitting laser as the core waveguide; and a first surface grating formed in the fan out region; and a photonic integrated circuit (PIC) that includes an optical waveguide and a second surface grating formed in an upper layer of the PIC, wherein the second surface grating is in optical alignment with the first surface grating.

Abstract: An embodiment includes an optical transmitter. An optical transmitter may include a primary laser for transmitting a primary optical signal and a backup laser for transmitting a backup optical signal. The optical transmitter may further include a photonic integrated circuit (PIC). The PIC may include at least one input port configured to receive the primary optical signal from the primary laser and the backup optical signal from the backup laser. The PIC may also include at least one output port configured to receive each of the primary optical signal and the backup optical signal. The optical transmitter may be configured to activate the backup laser upon determining that the primary laser has failed or is failing.

Abstract: In an example embodiment, a method includes receiving a first combined optical signal at an edge filter. The method further includes redirecting, at the edge filter, a second combined optical signal toward a first zigzag demultiplexer; and passing a third combined optical signal through the edge filter toward a light redirector based on wavelength. The method further includes redirecting the third combined optical signal toward a second zigzag demultiplexer. The method may further includes separating, at the first zigzag demultiplexer, the second combined optical signal into a first optical signal on a first optical path and a second optical signal on a second optical path based on wavelength. The method further includes separating, at the second zigzag demultiplexer, the third combined optical signal into a third optical signal on a third optical path and a fourth optical signal on a fourth optical path based on wavelengths.

Abstract: An embodiment includes an optical transmitter. An optical transmitter may include a primary laser for transmitting a primary optical signal and a backup laser for transmitting a backup optical signal. The optical transmitter may further include a photonic integrated circuit (PIC). The PIC may include at least one input port configured to receive the primary optical signal from the primary laser and the backup optical signal from the backup laser. The PIC may also include at least one output port configured to receive each of the primary optical signal and the backup optical signal. The optical transmitter may be configured to activate the backup laser upon determining that the primary laser has failed or is failing.

Abstract: In an example embodiment, a method includes receiving a first combined optical signal at an edge filter. The method further includes redirecting, at the edge filter, a second combined optical signal toward a first zigzag demultiplexer; and passing a third combined optical signal through the edge filter toward a light redirector based on wavelength. The method further includes redirecting the third combined optical signal toward a second zigzag demultiplexer. The method may further includes separating, at the first zigzag demultiplexer, the second combined optical signal into a first optical signal on a first optical path and a second optical signal on a second optical path based on wavelength. The method further includes separating, at the second zigzag demultiplexer, the third combined optical signal into a third optical signal on a third optical path and a fourth optical signal on a fourth optical path based on wavelengths.