Patents by Inventor Xiaoke Wan
Xiaoke Wan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10323924Abstract: In interferometer imaging signal acquisition using a movable optical beam to sample a target with specular or non specular reflecting surfaces or internal features, beam moving during interferometer signal acquisition can generate unwanted phase error due to shifting speckle field. Examples include coherent LIDAR, Interferometry Doppler sensing and optical coherence tomography. During an interferometer signal acquisition period, an interferometer sensing beam can be substantially stationary, and active step-scanning can be synchronized with interferometer signal acquisition cycles. For interferometers using repetitive chirping lasers, passive dispersive counter-scan mechanisms can be used to assist step-scanning operation.Type: GrantFiled: January 14, 2018Date of Patent: June 18, 2019Inventor: Xiaoke Wan
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Patent number: 10228518Abstract: A method for terminating a plurality of optical fibers arranged in a two-dimensional arrangement comprises inserting the plurality of optical fibers into and through a fiber ferrule, where the fiber ferrule has a plurality of parallel channels extending from an entry surface through to a polish surface; polishing the polish surface including an end of each of the plurality of optical fibers to form a coplanar surface at a polish angle relative to a reference plane perpendicular to the parallel channels; and affixing a glass plate to the polish surface.Type: GrantFiled: July 12, 2016Date of Patent: March 12, 2019Assignee: StereoVision Imaging, Inc.Inventor: Xiaoke Wan
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Publication number: 20180238675Abstract: In interferometer imaging signal acquisition using a movable optical beam to sample a target with specular or non specular reflecting surfaces or internal features, beam moving during interferometer signal acquisition can generate unwanted phase error due to shifting speckle field. Examples include coherent LIDAR, Interferometry Doppler sensing and optical coherence tomography. During an interferometer signal acquisition period, an interferometer sensing beam can be substantially stationary, and active step-scanning can be synchronized with interferometer signal acquisition cycles. For interferometers using repetitive chirping lasers, passive dispersive counter-scan mechanisms can be used to assist step-scanning operation.Type: ApplicationFiled: January 14, 2018Publication date: August 23, 2018Inventor: Xiaoke Wan
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Publication number: 20170343716Abstract: Various implementations of the invention, improve an optical efficiency of an optical path comprising a polarizing beam splitter and a quarter wave plate. In some implementations of the invention, where an additional optical component introduces a phase retardance into the optical path, the quarter wave plate may be adjusted away from its nominal orientation relative to the optical path to improve an optical efficiency of the optical path.Type: ApplicationFiled: January 13, 2017Publication date: November 30, 2017Applicant: Digital Signal CorporationInventors: Xiaoke Wan, Hani Daniel, Chris Roller
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Patent number: 9696138Abstract: A scanning monochromatic spatial low-coherent interferometer (S-LCI) can be used to simultaneously measure geometric thickness and refractive index. The probe beam of the scanning S-LCI can be an off-axis converging single wavelength laser beam, and the decomposed incident angles of the beam on the sample can be accurately defined in the Fourier domain. The angle dependent phase shift of a plane parallel plate or other sample can be obtained in a single system measurement. From the angle dependent phase shift, the geometric thickness and refractive index of the sample can be simultaneously obtained. Additionally or alternatively, the S-LCI system can interrogate the sample to profile the location and refractive index of one or more layers within the sample using the disclosed techniques.Type: GrantFiled: July 31, 2012Date of Patent: July 4, 2017Assignee: University of Florida Research Foundation, Inc.Inventors: Xiaoke Wan, Jian Ge
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Publication number: 20170160485Abstract: A method for terminating a plurality of optical fibers arranged in a two-dimensional arrangement comprises inserting the plurality of optical fibers into and through a fiber ferrule, where the fiber ferrule has a plurality of parallel channels extending from an entry surface through to a polish surface; polishing the polish surface including an end of each of the plurality of optical fibers to form a coplanar surface at a polish angle relative to a reference plane perpendicular to the parallel channels; and affixing a glass plate to the polish surface.Type: ApplicationFiled: July 12, 2016Publication date: June 8, 2017Inventor: Xiaoke Wan
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Publication number: 20160011367Abstract: A method for terminating a plurality of optical fibers arranged in a two-dimensional arrangement comprises inserting the plurality of optical fibers into and through a fiber ferrule, where the fiber ferrule has a plurality of parallel channels extending from an entry surface through to a polish surface; polishing the polish surface including an end of each of the plurality of optical fibers to form a coplanar surface at a polish angle relative to a reference plane perpendicular to the parallel channels; and affixing a glass plate to the polish surface.Type: ApplicationFiled: July 8, 2014Publication date: January 14, 2016Inventor: Xiaoke Wan
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Publication number: 20140168637Abstract: A scanning monochromatic spatial low-coherent interferometer (S-LCI) can be used to simultaneously measure geometric thickness and refractive index. The probe beam of the scanning S-LCI can be an off-axis converging single wavelength laser beam, and the decomposed incident angles of the beam on the sample can be accurately defined in the Fourier domain. The angle dependent phase shift of a plane parallel plate or other sample can be obtained in a single system measurement. From the angle dependent phase shift, the geometric thickness and refractive index of the sample can be simultaneously obtained. Additionally or alternatively, the S-LCI system can interrogate the sample to profile the location and refractive index of one or more layers within the sample using the disclosed techniques.Type: ApplicationFiled: July 31, 2012Publication date: June 19, 2014Applicant: UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INC.Inventors: Xiaoke Wan, Jian Ge
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Patent number: 8659845Abstract: High-precision monolithic optical assemblies are formed using low-cost standard optical components, such as wedge plates and/or wedge second surface mirrors. By rolling and/or shifting the components relative to each other with matched optical surfaces in contact, a precise alignment solution is found for a particular optical assembly. The resulting arrangement of components can be bonded or held together so as to form a high-precision monolithic optical assembly, which can be inserted into an optical system, according to the assembly's function. The functionality of the monolithic optical assembly can be independent of the optical system in which it is used.Type: GrantFiled: April 6, 2009Date of Patent: February 25, 2014Assignee: University of Florida Research Foundation, Inc.Inventors: Xiaoke Wan, Jian Ge
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Patent number: 8570524Abstract: Calibration of an arbitrary spectrometer can use a stable monolithic interferometer as a wavelength calibration standard. Light from a polychromatic light source is input to the monolithic interferometer where it undergoes interference based on the optical path difference (OPD) of the interferometer. The resulting wavelength-modulated output beam is analyzed by a reference spectrometer to generate reference data. The output beam from the interferometer can be provided to an arbitrary spectral instrument. Wavelength calibration of the arbitrary spectral instrument may then be performed based on a comparison of the spectral instrument output with the reference data. By appropriate choice of materials for the monolithic interferometer, a highly stable structure can be fabricated that has a wide field and/or is thermally compensated. Because the interferometer is stable, the one-time generated reference data can be used over an extended period of time without re-characterization.Type: GrantFiled: August 3, 2010Date of Patent: October 29, 2013Assignee: University of Florida Research Foundation, Inc.Inventors: Xiaoke Wan, Jian Ge
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Publication number: 20110286100Abstract: High-precision monolithic optical assemblies are formed using low-cost standard optical components, such as wedge plates and/or wedge second surface mirrors. By rolling and/or shifting the components relative to each other with matched optical surfaces in contact, a precise alignment solution is found for a particular optical assembly. The resulting arrangement of components can be bonded or held together so as to form a high-precision monolithic optical assembly, which can be inserted into an optical system, according to the assembly's function. The functionality of the monolithic optical assembly can be independent of the optical system in which it is used.Type: ApplicationFiled: April 6, 2009Publication date: November 24, 2011Inventors: Xiaoke Wan, Jian Ge
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Publication number: 20110032529Abstract: Calibration of an arbitrary spectrometer can use a stable monolithic interferometer as a wavelength calibration standard. Light from a polychromatic light source is input to the monolithic interferometer where it undergoes interference based on the optical path difference (OPD) of the interferometer. The resulting wavelength-modulated output beam is analyzed by a reference spectrometer to generate reference data. The output beam from the interferometer can be provided to an arbitrary spectral instrument. Wavelength calibration of the arbitrary spectral instrument may then be performed based on a comparison of the spectral instrument output with the reference data. By appropriate choice of materials for the monolithic interferometer, a highly stable structure can be fabricated that has a wide field and/or is thermally compensated. Because the interferometer is stable, the one-time generated reference data can be used over an extended period of time without re-characterization.Type: ApplicationFiled: August 3, 2010Publication date: February 10, 2011Applicant: University of Florida Research Foundation, Inc.Inventors: Xiaoke WAN, Jian Ge
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Patent number: 7146073Abstract: In an optical fiber system for delivering laser, a laser beam is focused onto an optical fiber at an injection port of the system. The end portions of the fiber have cladding treatments to attenuate stray light and cladding mode light, so as to enhance the protection of the outer layer joint points. Photodetector sensors monitor scattered stray light, cladding mode light, and/or transmitted cladding mode light. Sensor signals are provided to a control unit for analyzing the fiber coupling performance. If need be, the control unit can control a laser shutter or the like to minimize or prevent damage. In materials processing applications, the photodetector signals can be analyzed to determine the processing status of a work piece.Type: GrantFiled: July 19, 2004Date of Patent: December 5, 2006Assignee: Quantronix CorporationInventor: Xiaoke Wan
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Publication number: 20060013532Abstract: In an optical fiber system for delivering laser, a laser beam is focused onto an optical fiber at an injection port of the system. The end portions of the fiber have cladding treatments to attenuate stray light and cladding mode light, so as to enhance the protection of the outer layer joint points. Photodetector sensors monitor scattered stray light, cladding mode light, and/or transmitted cladding mode light. Sensor signals are provided to a control unit for analyzing the fiber coupling performance. If need be, the control unit can control a laser shutter or the like to minimize or prevent damage. In materials processing applications, the photodetector signals can be analyzed to determine the processing status of a work piece.Type: ApplicationFiled: July 19, 2004Publication date: January 19, 2006Inventor: Xiaoke Wan