Patents by Inventor Xiaolang Yan

Xiaolang Yan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Normal incidence broadband spectroscopic polarimeter and optical measurement system
    Patent number: 9176048
    Abstract: A kind of normal incidence broadband spectroscopic polarimeter which is easy to adjust the focus, has no chromatic aberration, maintains the polarization and has simple structure. The normal incidence broadband spectroscopic polarimeter can make the probe beam normal incidence and focus on the sample surface by using at least one flat reflector element to change propagation direction of the focused beam. Moreover, the normal incidence broadband spectroscopic polarimeter contains at least one polarizer as to measure the anisotropy or non-uniform samples, such as three-dimensional profile and material optical constants of thin films consisting of the periodic structure. An optical measurement system including the normal incidence broadband spectroscopic polarimeter is also provided.
    Type: Grant
    Filed: June 1, 2011
    Date of Patent: November 3, 2015
    Assignee: BEIOPTICS TECHNOLOGY CO., LTD
    Inventors: Guoguang Li, Tao Liu, Edgar Genio, Tiezhong Ma, Xiaolang Yan
  • Normal Incidence Broadband Spectroscopic Polarimeter and Optical Measurement System
    Publication number: 20130050702
    Abstract: A kind of normal incidence broadband spectroscopic polarimeter which is easy to adjust the focus, has no chromatic aberration, maintains the polarization and has simple structure. The normal incidence broadband spectroscopic polarimeter can make the probe beam normal incidence and focus on the sample surface by using at least one flat reflector element to change propagation direction of the focused beam. Moreover, the normal incidence broadband spectroscopic polarimeter contains at least one polarizer as to measure the anisotropy or non-uniform samples, such as three-dimensional profile and material optical constants of thin films consisting of the periodic structure. An optical measurement system including the normal incidence broadband spectroscopic polarimeter is also provided.
    Type: Application
    Filed: June 1, 2011
    Publication date: February 28, 2013
    Applicant: BEIOPTICS TECHNOLOGY CO., LTD
    Inventors: Guoguang Li, Tao Liu, Edgar Genio, Tiezhong Ma, Xiaolang Yan