Abstract: A cleaning apparatus and a cleaning method are provided. The cleaning apparatus is used for removing a residue on a substrate, and includes: a deformable device arranged on the substrate; and an excitation device configured to generate an excitation source for the deformable device, so as to enable the deformable device to be deformed under the effect of the excitation source, thereby to drive the substrate to vibrate and enable the residue to fall off from the substrate.

Abstract: The present disclosure provides a UV curing device, a sealant curing system and a sealant curing method. The UV curing device includes: a light-emitting mechanism configured to emit and guide UV rays in an output direction; and a first adjustment mechanism connected to the light-emitting mechanism and configured to adjust the output direction of the UV rays from the light-emitting mechanism so that the UV rays enter a to-be-cured display panel at an incident angle.

Abstract: A sealant coating nozzle and a sealant coating apparatus are provided. The sealant coating nozzle includes a nozzle cavity, a nozzle opening communicated with the nozzle cavity, telescopic inner films located in the nozzle cavity and driving apparatuses configured to drive the telescopic inner films to deform in the nozzle cavity; a volume of the nozzle cavity is reduced by the telescopic inner films in a first deformation state to extrude sealant in the nozzle cavity via the nozzle opening, and the volume of the nozzle cavity is increased by the telescopic inner films in a second deformation state to suck the sealant at the nozzle opening into the nozzle cavity.

Abstract: A cleaning apparatus and a cleaning method are provided. The cleaning apparatus is used for removing a residue on a substrate, and includes: a deformable device arranged on the substrate; and an excitation device configured to generate an excitation source for the deformable device, so as to enable the deformable device to be deformed under the effect of the excitation source, thereby to drive the substrate to vibrate and enable the residue to fall off from the substrate.

Abstract: The present disclosure provides a monitoring device, a monitoring method and a device for cutting a display substrate. The monitoring device includes an infrared temperature detection module configured to detect a temperature at a contacting position where a cutter wheel is in contact with the display substrate when cutting the display substrate with the cutter wheel, so as to acquire a temperature parameter at the contacting position; and a processing module configured to generate, based on the temperature parameter, a corresponding control parameter for controlling the process of cutting the display substrate.

Abstract: A sealant coating nozzle and a sealant coating apparatus are provided. The sealant coating nozzle includes a nozzle cavity, a nozzle opening communicated with the nozzle cavity, telescopic inner films located in the nozzle cavity and driving apparatuses configured to drive the telescopic inner films to deform in the nozzle cavity; a volume of the nozzle cavity is reduced by the telescopic inner films in a first deformation state to extrude sealant in the nozzle cavity via the nozzle opening, and the volume of the nozzle cavity is increased by the telescopic inner films in a second deformation state to suck the sealant at the nozzle opening into the nozzle cavity.

Abstract: The present disclosure provides a method and a device of inspecting a sealant coating on a substrate. An image of a sample substrate is captured. The sample substrate is selected from a plurality of substrates. A non-coating area is identified from the image of the sample substrate. Abnormal points are identified in the non-coating area. Positions of the abnormal points are recorded. An image of a sealant-coated substrate having a sealant coating on one of the plurality of substrates is captured. Defect positions of the sealant coating are identified from the image of the sealant-coated substrate. Defects located in a non-coating area of the sealant-coated substrate at positions corresponding to the positions of the abnormal points identified based on the sample substrate are considered as normal.

Abstract: The present disclosure provides a UV curing device, a sealant curing system and a sealant curing method. The UV curing device includes: a light-emitting mechanism configured to emit and guide UV rays in an output direction; and a first adjustment mechanism connected to the light-emitting mechanism and configured to adjust the output direction of the UV rays from the light-emitting mechanism so that the UV rays enter a to-be-cured display panel at an incident angle.

Abstract: A turnover device, a substrate cell-assembling apparatus and a substrate cell-assembling method are provided. The turnover device comprises: a fixed support and a turnover platform connected with the fixed support by a first rotary shaft, the turnover platform having a first suction surface and a second suction surface which are oppositely arranged and are configured to suction a substrate; a second rotary shaft and a third rotary shaft, configured to respectively drive the first suction surface and the second suction surface to rotate in an in-plane direction, axial directions of the second rotary shaft and the third rotary shaft being basically perpendicular to that of the first rotary shaft. The turnover platform is configured to turn over the first suction surface and the second suction surface by the first rotary shaft.

Abstract: The present disclosure provides a method and a device of inspecting a sealant coating on a substrate. An image of a sample substrate is captured. The sample substrate is selected from a plurality of substrates. A non-coating area is identified from the image of the sample substrate. Abnormal points are identified in the non-coating area. Positions of the abnormal points are recorded. An image of a sealant-coated substrate having a sealant coating on one of the plurality of substrates is captured. Defect positions of the sealant coating are identified from the image of the sealant-coated substrate. Defects located in a non-coating area of the sealant-coated substrate at positions corresponding to the positions of the abnormal points identified based on the sample substrate are considered as normal.

Abstract: The present disclosure provides a monitoring device, a monitoring method and a device for cutting and grinding a display substrate. The monitoring device includes an infrared temperature detection module configured to detect a temperature at a contacting position where a cutter wheel is in contact with the display substrate when cutting or grinding the display substrate with the cutter wheel, so as to acquire a temperature parameter at the contacting position; and a processing module configured to generate, based on the temperature parameter, a corresponding control parameter for controlling the process of cutting or grinding procedure the display substrate.

Abstract: A turnover device, a substrate cell-assembling apparatus and a substrate cell-assembling method are provided. The turnover device comprises: a fixed support and a turnover platform connected with the fixed support by a first rotary shaft, the turnover platform having a first suction surface and a second suction surface which are oppositely arranged and are configured to suction a substrate; a second rotary shaft and a third rotary shaft, configured to respectively drive the first suction surface and the second suction surface to rotate in an in-plane direction, axial directions of the second rotary shaft and the third rotary shaft being basically perpendicular to that of the first rotary shaft. The turnover platform is configured to turn over the first suction surface and the second suction surface by the first rotary shaft.