Patents by Inventor Xiaoping Qian
Xiaoping Qian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11465361Abstract: In accordance with some embodiments, systems, methods, and media for controlling support structures and build orientation are provided. In some embodiments, a method for additive manufacturing a part using a three dimensional (3D) printing system, the 3D printing system including a print head and a build plate is provided, the method comprising: receiving a plurality of physical constraints associated with the part; optimizing a build orientation of the part to identify an optimized build orientation b* for the part with respect to a design domain defined by the physical constraints based on the plurality of physical constraints, and a plurality of design constraints using at least one variable associated with build orientation as an optimization variable, the plurality of design constraints comprising: an initial build orientation b0; and a critical surface slope angle and generating a part model based on the optimized build orientation b*.Type: GrantFiled: March 27, 2020Date of Patent: October 11, 2022Assignee: Wisconsin Alumni Research FoundationInventors: Xiaoping Qian, Cunfu Wang
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Patent number: 11383444Abstract: Systems and methods for controlling support structures in manufacturing are provided. In particular, the present disclosure provides systems and methods for characterizing the support volume in the design phase based on a perimeter length of a boundary with undercut, projected along a build direction, referred to as a projected undercut perimeter (PUP). By constraining this PUP, the amount of support structures in resulting designs are effectively controlled. By constraining overhang able based PUP, the resulting designs can self support.Type: GrantFiled: December 5, 2019Date of Patent: July 12, 2022Assignee: Wisconsin Alumni Research FoundationInventor: Xiaoping Qian
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Publication number: 20210299962Abstract: In accordance with some embodiments, systems, methods, and media for controlling support structures and build orientation are provided. In some embodiments, a method for additive manufacturing a part using a three dimensional (3D) printing system, the 3D printing system including a print head and a build plate is provided, the method comprising: receiving a plurality of physical constraints associated with the part; optimizing a build orientation of the part to identify an optimized build orientation b* for the part with respect to a design domain defined by the physical constraints based on the plurality of physical constraints, and a plurality of design constraints using at least one variable associated with build orientation as an optimization variable, the plurality of design constraints comprising: an initial build orientation b0; and a critical surface slope angle and generating a part model based on the optimized build orientation b*.Type: ApplicationFiled: March 27, 2020Publication date: September 30, 2021Inventors: Xiaoping Qian, Cunfu Wang
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Publication number: 20200108560Abstract: Systems and methods for controlling support structures in manufacturing are provided. In particular, the present disclosure provides systems and methods for characterizing the support volume in the design phase based on a perimeter length of a boundary with undercut, projected along a build direction, referred to as a projected undercut perimeter (PUP). By constraining this PUP, the amount of support structures in resulting designs are effectively controlled. By constraining overhang able based PUP, the resulting designs can self support.Type: ApplicationFiled: December 5, 2019Publication date: April 9, 2020Applicant: Wisconsin Alumni Research FoundationInventor: Xiaoping Qian
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Patent number: 10525628Abstract: Systems and methods for controlling support structures in manufacturing are provided. In particular, the present disclosure provides systems and methods for characterizing the support volume in the design phase based on a perimeter length of a boundary with undercut, projected along a build direction, referred to as a projected undercut perimeter (PUP). By constraining this PUP, the amount of support structures in resulting designs are effectively controlled. By constraining overhang able based PUP, the resulting designs can self support.Type: GrantFiled: April 28, 2016Date of Patent: January 7, 2020Assignee: Wisconsin Alumni Research FoundationInventor: Xiaoping Qian
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Patent number: 10346554Abstract: A system and method for carrying out an isogeometric analysis process includes accessing the CAD model of the object from the memory. The process also includes analyzing the CAD model to generate a pre-refinement geometric map of the CAD object that has a smoothness projected to maintain a consistency of a geometric map based on the pre-refinement geometric map during a refinement of the mesh. The process further includes refining the mesh based on the pre-refinement geometric map to converge toward a refinement criteria associated with the CAD model.Type: GrantFiled: March 16, 2015Date of Patent: July 9, 2019Assignee: Wisconsin Alumni Research FoundationInventors: Xiaoping Qian, Songtao Xia
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Publication number: 20170312986Abstract: Systems and methods for controlling support structures in manufacturing are provided. In particular, the present disclosure provides systems and methods for characterizing the support volume in the design phase based on a perimeter length of a boundary with undercut, projected along a build direction, referred to as a projected undercut perimeter (PUP). By constraining this PUP, the amount of support structures in resulting designs are effectively controlled. By constraining overhang able based PUP, the resulting designs can self support.Type: ApplicationFiled: April 28, 2016Publication date: November 2, 2017Inventor: Xiaoping Qian
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Publication number: 20160275207Abstract: A system and method for carrying out an isogeometric analysis process includes accessing the CAD model of the object from the memory. The process also includes analyzing the CAD model to generate a pre-refinement geometric map of the CAD object that has a smoothness projected to maintain a consistency of a geometric map based on the pre-refinement geometric map during a refinement of the mesh. The process further includes refining the mesh based on the pre-refinement geometric map to converge toward a refinement criteria associated with the CAD model.Type: ApplicationFiled: March 16, 2015Publication date: September 22, 2016Inventors: Xiaoping Qian, Songtao Xia
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Patent number: 7336374Abstract: A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto a surface of an object, and an imaging system for receiving light reflected from the surface of the object. The method includes determining a profile of the object to be inspected, and generating a mask based on the determined profile, wherein the mask includes an opening extending therethrough that has a profile that substantially matches a profile of the object as viewed from the light source.Type: GrantFiled: October 24, 2005Date of Patent: February 26, 2008Assignee: General Electric CompanyInventors: Kevin George Harding, Xiaoping Qian, Russell Stephen DeMuth
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Patent number: 7301165Abstract: A method for inspecting an object using a structured light measurement system that includes a light source for projecting light onto a surface of the object and an imaging sensor for receiving light reflected from the object. The method includes determining a position of at least one of the light source and the imaging sensor with respect to the object based on at least one of a three-dimensional model of the object and a three-dimensional model of the structured light measurement system.Type: GrantFiled: October 24, 2005Date of Patent: November 27, 2007Assignee: General Electric CompanyInventors: Qingying Hu, Kevin George Harding, Joseph Benjamin Ross, Xiaoping Qian
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Publication number: 20070103685Abstract: A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto a surface of an object, and an imaging system for receiving light reflected from the surface of the object. The method includes determining a profile of the object to be inspected, and generating a mask based on the determined profile, wherein the mask includes an opening extending therethrough that has a profile that substantially matches a profile of the object as viewed from the light source.Type: ApplicationFiled: October 24, 2005Publication date: May 10, 2007Inventors: Kevin Harding, Xiaoping Qian, Russell DeMuth
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Publication number: 20070090309Abstract: A method for inspecting an object using a structured light measurement system that includes a light source for projecting light onto a surface of the object and an imaging sensor for receiving light reflected from the object. The method includes determining a position of at least one of the light source and the imaging sensor with respect to the object based on at least one of a three-dimensional model of the object and a three-dimensional model of the structured light measurement system.Type: ApplicationFiled: October 24, 2005Publication date: April 26, 2007Inventors: Qingying Hu, Kevin Harding, Joseph Ross, Xiaoping Qian
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Patent number: 7092094Abstract: The present disclosure provides for an optical metrology system for scanning an object (106) having a shiny surface. The optical metrology system includes at least one light source (102) configured and adapted to emit a structured light pattern (L) against the surface of the object, at least one first polarizer (108) disposed between the light source and the object such that the light pattern passes therethrough, the first polarizer being configured and adapted to vary at least one of the plane of polarization and the polarization angle of the light pattern, at least one camera (124a–124c) configured and adapted to take images of the object, and at least one second polarizer disposed between the camera and the object, the second polarizer having a fixed orientation.Type: GrantFiled: September 29, 2003Date of Patent: August 15, 2006Assignee: General Electric CompanyInventors: Xiaoping Qian, Kevin George Harding
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Publication number: 20050068532Abstract: The present disclosure provides for an optical metrology system for scanning an object (106) having a shiny surface. The optical metrology system includes at least one light source (102) configured and adapted to emit a structured light pattern (L) against the surface of the object, at least one first polarizer (108) disposed between the light source and the object such that the light pattern passes therethrough, the first polarizer being configured and adapted to vary at least one of the plane of polarization and the polarization angle of the light pattern, at least one camera (124a-124c) configured and adapted to take images of the object, and at least one second polarizer disposed between the camera and the object, the second polarizer having a fixed orientation.Type: ApplicationFiled: September 29, 2003Publication date: March 31, 2005Inventors: Xiaoping Qian, Kevin Harding