Patents by Inventor Xiaoping Qian

Xiaoping Qian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11465361
    Abstract: In accordance with some embodiments, systems, methods, and media for controlling support structures and build orientation are provided. In some embodiments, a method for additive manufacturing a part using a three dimensional (3D) printing system, the 3D printing system including a print head and a build plate is provided, the method comprising: receiving a plurality of physical constraints associated with the part; optimizing a build orientation of the part to identify an optimized build orientation b* for the part with respect to a design domain defined by the physical constraints based on the plurality of physical constraints, and a plurality of design constraints using at least one variable associated with build orientation as an optimization variable, the plurality of design constraints comprising: an initial build orientation b0; and a critical surface slope angle and generating a part model based on the optimized build orientation b*.
    Type: Grant
    Filed: March 27, 2020
    Date of Patent: October 11, 2022
    Assignee: Wisconsin Alumni Research Foundation
    Inventors: Xiaoping Qian, Cunfu Wang
  • Patent number: 11383444
    Abstract: Systems and methods for controlling support structures in manufacturing are provided. In particular, the present disclosure provides systems and methods for characterizing the support volume in the design phase based on a perimeter length of a boundary with undercut, projected along a build direction, referred to as a projected undercut perimeter (PUP). By constraining this PUP, the amount of support structures in resulting designs are effectively controlled. By constraining overhang able based PUP, the resulting designs can self support.
    Type: Grant
    Filed: December 5, 2019
    Date of Patent: July 12, 2022
    Assignee: Wisconsin Alumni Research Foundation
    Inventor: Xiaoping Qian
  • Publication number: 20210299962
    Abstract: In accordance with some embodiments, systems, methods, and media for controlling support structures and build orientation are provided. In some embodiments, a method for additive manufacturing a part using a three dimensional (3D) printing system, the 3D printing system including a print head and a build plate is provided, the method comprising: receiving a plurality of physical constraints associated with the part; optimizing a build orientation of the part to identify an optimized build orientation b* for the part with respect to a design domain defined by the physical constraints based on the plurality of physical constraints, and a plurality of design constraints using at least one variable associated with build orientation as an optimization variable, the plurality of design constraints comprising: an initial build orientation b0; and a critical surface slope angle and generating a part model based on the optimized build orientation b*.
    Type: Application
    Filed: March 27, 2020
    Publication date: September 30, 2021
    Inventors: Xiaoping Qian, Cunfu Wang
  • Publication number: 20200108560
    Abstract: Systems and methods for controlling support structures in manufacturing are provided. In particular, the present disclosure provides systems and methods for characterizing the support volume in the design phase based on a perimeter length of a boundary with undercut, projected along a build direction, referred to as a projected undercut perimeter (PUP). By constraining this PUP, the amount of support structures in resulting designs are effectively controlled. By constraining overhang able based PUP, the resulting designs can self support.
    Type: Application
    Filed: December 5, 2019
    Publication date: April 9, 2020
    Applicant: Wisconsin Alumni Research Foundation
    Inventor: Xiaoping Qian
  • Patent number: 10525628
    Abstract: Systems and methods for controlling support structures in manufacturing are provided. In particular, the present disclosure provides systems and methods for characterizing the support volume in the design phase based on a perimeter length of a boundary with undercut, projected along a build direction, referred to as a projected undercut perimeter (PUP). By constraining this PUP, the amount of support structures in resulting designs are effectively controlled. By constraining overhang able based PUP, the resulting designs can self support.
    Type: Grant
    Filed: April 28, 2016
    Date of Patent: January 7, 2020
    Assignee: Wisconsin Alumni Research Foundation
    Inventor: Xiaoping Qian
  • Patent number: 10346554
    Abstract: A system and method for carrying out an isogeometric analysis process includes accessing the CAD model of the object from the memory. The process also includes analyzing the CAD model to generate a pre-refinement geometric map of the CAD object that has a smoothness projected to maintain a consistency of a geometric map based on the pre-refinement geometric map during a refinement of the mesh. The process further includes refining the mesh based on the pre-refinement geometric map to converge toward a refinement criteria associated with the CAD model.
    Type: Grant
    Filed: March 16, 2015
    Date of Patent: July 9, 2019
    Assignee: Wisconsin Alumni Research Foundation
    Inventors: Xiaoping Qian, Songtao Xia
  • Publication number: 20170312986
    Abstract: Systems and methods for controlling support structures in manufacturing are provided. In particular, the present disclosure provides systems and methods for characterizing the support volume in the design phase based on a perimeter length of a boundary with undercut, projected along a build direction, referred to as a projected undercut perimeter (PUP). By constraining this PUP, the amount of support structures in resulting designs are effectively controlled. By constraining overhang able based PUP, the resulting designs can self support.
    Type: Application
    Filed: April 28, 2016
    Publication date: November 2, 2017
    Inventor: Xiaoping Qian
  • Publication number: 20160275207
    Abstract: A system and method for carrying out an isogeometric analysis process includes accessing the CAD model of the object from the memory. The process also includes analyzing the CAD model to generate a pre-refinement geometric map of the CAD object that has a smoothness projected to maintain a consistency of a geometric map based on the pre-refinement geometric map during a refinement of the mesh. The process further includes refining the mesh based on the pre-refinement geometric map to converge toward a refinement criteria associated with the CAD model.
    Type: Application
    Filed: March 16, 2015
    Publication date: September 22, 2016
    Inventors: Xiaoping Qian, Songtao Xia
  • Patent number: 7336374
    Abstract: A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto a surface of an object, and an imaging system for receiving light reflected from the surface of the object. The method includes determining a profile of the object to be inspected, and generating a mask based on the determined profile, wherein the mask includes an opening extending therethrough that has a profile that substantially matches a profile of the object as viewed from the light source.
    Type: Grant
    Filed: October 24, 2005
    Date of Patent: February 26, 2008
    Assignee: General Electric Company
    Inventors: Kevin George Harding, Xiaoping Qian, Russell Stephen DeMuth
  • Patent number: 7301165
    Abstract: A method for inspecting an object using a structured light measurement system that includes a light source for projecting light onto a surface of the object and an imaging sensor for receiving light reflected from the object. The method includes determining a position of at least one of the light source and the imaging sensor with respect to the object based on at least one of a three-dimensional model of the object and a three-dimensional model of the structured light measurement system.
    Type: Grant
    Filed: October 24, 2005
    Date of Patent: November 27, 2007
    Assignee: General Electric Company
    Inventors: Qingying Hu, Kevin George Harding, Joseph Benjamin Ross, Xiaoping Qian
  • Publication number: 20070103685
    Abstract: A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto a surface of an object, and an imaging system for receiving light reflected from the surface of the object. The method includes determining a profile of the object to be inspected, and generating a mask based on the determined profile, wherein the mask includes an opening extending therethrough that has a profile that substantially matches a profile of the object as viewed from the light source.
    Type: Application
    Filed: October 24, 2005
    Publication date: May 10, 2007
    Inventors: Kevin Harding, Xiaoping Qian, Russell DeMuth
  • Publication number: 20070090309
    Abstract: A method for inspecting an object using a structured light measurement system that includes a light source for projecting light onto a surface of the object and an imaging sensor for receiving light reflected from the object. The method includes determining a position of at least one of the light source and the imaging sensor with respect to the object based on at least one of a three-dimensional model of the object and a three-dimensional model of the structured light measurement system.
    Type: Application
    Filed: October 24, 2005
    Publication date: April 26, 2007
    Inventors: Qingying Hu, Kevin Harding, Joseph Ross, Xiaoping Qian
  • Patent number: 7092094
    Abstract: The present disclosure provides for an optical metrology system for scanning an object (106) having a shiny surface. The optical metrology system includes at least one light source (102) configured and adapted to emit a structured light pattern (L) against the surface of the object, at least one first polarizer (108) disposed between the light source and the object such that the light pattern passes therethrough, the first polarizer being configured and adapted to vary at least one of the plane of polarization and the polarization angle of the light pattern, at least one camera (124a–124c) configured and adapted to take images of the object, and at least one second polarizer disposed between the camera and the object, the second polarizer having a fixed orientation.
    Type: Grant
    Filed: September 29, 2003
    Date of Patent: August 15, 2006
    Assignee: General Electric Company
    Inventors: Xiaoping Qian, Kevin George Harding
  • Publication number: 20050068532
    Abstract: The present disclosure provides for an optical metrology system for scanning an object (106) having a shiny surface. The optical metrology system includes at least one light source (102) configured and adapted to emit a structured light pattern (L) against the surface of the object, at least one first polarizer (108) disposed between the light source and the object such that the light pattern passes therethrough, the first polarizer being configured and adapted to vary at least one of the plane of polarization and the polarization angle of the light pattern, at least one camera (124a-124c) configured and adapted to take images of the object, and at least one second polarizer disposed between the camera and the object, the second polarizer having a fixed orientation.
    Type: Application
    Filed: September 29, 2003
    Publication date: March 31, 2005
    Inventors: Xiaoping Qian, Kevin Harding