Patents by Inventor Xiaoqiang Peng

Xiaoqiang Peng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Near-null compensator and figure metrology apparatus for measuring aspheric surfaces by subaperture stitching and measuring method thereof
    Patent number: 9115977
    Abstract: A variable near-null compensator for measuring aspheric surfaces by subaperture stitching includes a pair of counter-rotating CGH phase plates, each of the phase plates having a phase function including two terms Z5 and Z7 of Zernike polynomials. The phase plates are mounted on a pair of precision rotary center-through tables, wherein rotational axes of the pair of precision rotary center-through tables coincide with the optical axes of the phase plates. A figure metrology apparatus includes a wavefront interferometer, the test mirror mount, the near-null compensator and the mechanical adjustment components therefor. The optical axis of the near-null compensator coincides with the optical axis of the interferometer. A method for measuring aspheric surfaces by subaperture stitching includes the steps of mounting the test mirror, measuring the subapertures with the figure metrology apparatus, and finally processing the data by stitching.
    Type: Grant
    Filed: July 20, 2012
    Date of Patent: August 25, 2015
    Assignee: NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY
    Inventors: Shanyong Chen, Yifan Dai, Shengyi Li, Xiaoqiang Peng, Chao Xie, Yanglin Peng
  • Near-Null Compensator and Figure Metrology Apparatus for Measuring Aspheric Surfaces by Subaperture Stitching and Measuring Method Thereof
    Publication number: 20140132960
    Abstract: A variable near-null compensator for measuring aspheric surfaces by subaperture stitching includes a pair of counter-rotating CGH phase plates, each of the phase plates having a phase function including two terms Z5 and Z7 of Zernike polynomials. The phase plates are mounted on a pair of precision rotary center-through tables, wherein rotational axes of the pair of precision rotary center-through tables coincide with the optical axes of the phase plates. A figure metrology apparatus includes a wavefront interferometer, the test mirror mount, the near-null compensator and the mechanical adjustment components therefor. The optical axis of the near-null compensator coincides with the optical axis of the interferometer. A method for measuring aspheric surfaces by subaperture stitching includes the steps of mounting the test mirror, measuring the subapertures with the figure metrology apparatus, and finally processing the data by stitching.
    Type: Application
    Filed: July 20, 2012
    Publication date: May 15, 2014
    Inventors: Shanyong Chen, Yifan Dai, Shengyi Li, Xiaoqiang Peng, Chao Xie, Yanglin Peng