Patents by Inventor Xilong Chen

Xilong Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170168992
    Abstract: Techniques to provide significance for statistical tests are described. An apparatus may comprise a data handler component to receive a real data set from a client device, the real data set to comprise data representing at least one measurable phenomenon, a statistical test component to receive a computational representation arranged to generate an approximate probability distribution for statistics of a statistical test based on a parameter vector, the statistics of the statistical test to follow a probability distribution, generate statistics for the statistical test using the real data set, generate the approximate probability distribution of the computational representation, and a significance generator component to generate a set of statistical significance values for the statistics through interpolation using the approximate probability distribution, the set of statistical significance values comprising one or more p-values. Other embodiments are described and claimed.
    Type: Application
    Filed: May 6, 2014
    Publication date: June 15, 2017
    Applicant: SAS INSTITUTE INC.
    Inventors: Xilong Chen, Mark Roland Little
  • Publication number: 20170116158
    Abstract: Techniques to perform interpolation for statistical tests are described. An apparatus may comprise processor circuitry and a simulated data component for execution by the processor circuitry to generate simulated data for a statistical test, statistics of the statistical test based on parameter vectors to follow a probability distribution. The apparatus may further comprise a statistic simulator component for execution by the processor circuitry to simulate statistics for the parameter vectors from the simulated data, each parameter vector represented with a single point in a grid of points. The apparatus may further comprise a code generator component for execution by the processor circuitry to remove selective points from the grid of points to form a subset of points, and generate interpolation code to interpolate a statistic of the statistical test on any point. Other embodiments are described and claimed.
    Type: Application
    Filed: May 6, 2014
    Publication date: April 27, 2017
    Applicant: SAS INSTITUTE INC.
    Inventors: Xilong Chen, Mark Roland Little
  • Publication number: 20170109323
    Abstract: Techniques to perform data reduction for statistical tests are described. An apparatus may comprise an evaluation component to receive a computational representation arranged to generate an approximate probability distribution for statistics of a statistical test, the computational representation to include a simulated data structure with information for estimated cumulative distribution function (CDF) curves for one or more parameter vectors of the statistical test, each parameter vector represented with a single point in a grid of points, the evaluation component to evaluate the simulated data structure to determine whether any points in the grid of points are removable from the simulated data structure with a target level of precision, and a data reduction generator to reduce the simulated data structure in accordance with the evaluation to produce a reduced simulated data structure having a smaller data storage size relative to the simulated data structure. Other embodiments are described and claimed.
    Type: Application
    Filed: May 6, 2014
    Publication date: April 20, 2017
    Applicant: SAS INSTITUTE INC.
    Inventors: Xilong Chen, Mark Roland Little
  • Publication number: 20170024242
    Abstract: Techniques to manage virtual classes for statistical tests are described. An apparatus may comprise a simulated data component to generate simulated data for a statistical test, statistics of the statistical test based on parameter vectors to follow a probability distribution, a statistic simulator component to simulate statistics for the parameter vectors from the simulated data with a distributed computing system comprising multiple nodes each having one or more processors capable of executing multiple threads, the simulation to occur by distribution of portions of the simulated data across the multiple nodes of the distributed computing system, and a distributed control engine to control task execution on the distributed portions of the simulated data on each node of the distributed computing system with a virtual software class arranged to coordinate task and sub-task operations across the nodes of the distributed computing system. Other embodiments are described and claimed.
    Type: Application
    Filed: May 6, 2014
    Publication date: January 26, 2017
    Applicant: SAS Institute Inc.
    Inventors: Xilong Chen, Mark Roland Little
  • Patent number: 9208131
    Abstract: Techniques to simulate statistical tests are described. An apparatus may comprise a simulated data component to generate simulated data for a statistical test, where statistics of the statistical test are based on parameter vectors to follow a probability distribution, a statistic simulator component to generate statistics for the parameter vectors from the simulated data, each parameter vector represented with a single point in a grid of points, the statistic simulation component to distribute portions of the simulated data or simulated statistics across multiple nodes of a distributed computing system in accordance with a column-wise or column-wise-by-group distribution algorithm, and a code generator component to create a computational representation arranged to generate an approximate probability distribution for each point in the grid of points from the simulated statistics, the approximate probability distribution to comprise an empirical cumulative distribution function (CDF).
    Type: Grant
    Filed: May 6, 2014
    Date of Patent: December 8, 2015
    Assignee: SAS INSTITUTE, INC.
    Inventors: Xilong Chen, Mark Roland Little
  • Publication number: 20150324325
    Abstract: Techniques to perform data reduction for statistical tests are described. An apparatus may comprise an evaluation component to receive a computational representation arranged to generate an approximate probability distribution for statistics of a statistical test, the computational representation to include a simulated data structure with information for estimated cumulative distribution function (CDF) curves for one or more parameter vectors of the statistical test, each parameter vector represented with a single point in a grid of points, the evaluation component to evaluate the simulated data structure to determine whether any points in the grid of points are removable from the simulated data structure with a target level of precision, and a data reduction generator to reduce the simulated data structure in accordance with the evaluation to produce a reduced simulated data structure having a smaller data storage size relative to the simulated data structure. Other embodiments are described and claimed.
    Type: Application
    Filed: May 6, 2014
    Publication date: November 12, 2015
    Applicant: SAS INSTITUTE INC.
    Inventors: Xilong Chen, Mark Roland Little
  • Publication number: 20150324327
    Abstract: Techniques to perform interpolation for statistical tests are described. An apparatus may comprise processor circuitry and a simulated data component for execution by the processor circuitry to generate simulated data for a statistical test, statistics of the statistical test based on parameter vectors to follow a probability distribution. The apparatus may further comprise a statistic simulator component for execution by the processor circuitry to simulate statistics for the parameter vectors from the simulated data, each parameter vector represented with a single point in a grid of points. The apparatus may further comprise a code generator component for execution by the processor circuitry to remove selective points from the grid of points to form a subset of points, and generate interpolation code to interpolate a statistic of the statistical test on any point. Other embodiments are described and claimed.
    Type: Application
    Filed: May 6, 2014
    Publication date: November 12, 2015
    Applicant: SAS INSTITUTE INC.
    Inventors: Xilong Chen, Mark Roland Little
  • Publication number: 20150324326
    Abstract: Techniques to perform curve fitting for statistical tests are described. An apparatus may comprise a simulated data component to generate simulated data for a statistical test, the statistical test based on parameter vectors to follow a probability distribution. The apparatus may further comprise a statistic simulator component to simulate statistics for the parameter vectors from the simulated data, each parameter vector represented with a single point in a grid of points, calculate quantiles for the parameters vectors from the simulated data, and fit an estimated cumulative distribution function (CDF) curve to quantiles for each point in the grid of points using a monotonic cubic spline interpolation technique in combination with a transform to satisfy a defined level of precision. Other embodiments are described and claimed.
    Type: Application
    Filed: May 6, 2014
    Publication date: November 12, 2015
    Applicant: SAS INSTITUTE INC.
    Inventors: Xilong Chen, Mark Roland Little
  • Publication number: 20150324328
    Abstract: Techniques to provide significance for statistical tests are described. An apparatus may comprise a data handler component to receive a real data set from a client device, the real data set to comprise data representing at least one measurable phenomenon, a statistical test component to receive a computational representation arranged to generate an approximate probability distribution for statistics of a statistical test based on a parameter vector, the statistics of the statistical test to follow a probability distribution, generate statistics for the statistical test using the real data set, generate the approximate probability distribution of the computational representation, and a significance generator component to generate a set of statistical significance values for the statistics through interpolation using the approximate probability distribution, the set of statistical significance values comprising one or more p-values. Other embodiments are described and claimed.
    Type: Application
    Filed: May 6, 2014
    Publication date: November 12, 2015
    Applicant: SAS INSTITUTE INC.
    Inventors: Xilong Chen, Mark Roland Little
  • Publication number: 20150324221
    Abstract: Techniques to manage virtual classes for statistical tests are described. An apparatus may comprise a simulated data component to generate simulated data for a statistical test, statistics of the statistical test based on parameter vectors to follow a probability distribution, a statistic simulator component to simulate statistics for the parameter vectors from the simulated data with a distributed computing system comprising multiple nodes each having one or more processors capable of executing multiple threads, the simulation to occur by distribution of portions of the simulated data across the multiple nodes of the distributed computing system, and a distributed control engine to control task execution on the distributed portions of the simulated data on each node of the distributed computing system with a virtual software class arranged to coordinate task and sub-task operations across the nodes of the distributed computing system. Other embodiments are described and claimed.
    Type: Application
    Filed: May 6, 2014
    Publication date: November 12, 2015
    Applicant: SAS Institute Inc.
    Inventors: Xilong Chen, Mark Roland Little
  • Publication number: 20140330536
    Abstract: Techniques to simulate statistical tests are described. An apparatus may comprise a simulated data component to generate simulated data for a statistical test, where statistics of the statistical test are based on parameter vectors to follow a probability distribution, a statistic simulator component to generate statistics for the parameter vectors from the simulated data, each parameter vector represented with a single point in a grid of points, the statistic simulation component to distribute portions of the simulated data or simulated statistics across multiple nodes of a distributed computing system in accordance with a column-wise or column-wise-by-group distribution algorithm, and a code generator component to create a computational representation arranged to generate an approximate probability distribution for each point in the grid of points from the simulated statistics, the approximate probability distribution to comprise an empirical cumulative distribution function (CDF).
    Type: Application
    Filed: May 6, 2014
    Publication date: November 6, 2014
    Applicant: SAS Institute Inc.
    Inventors: Xilong Chen, Mark Roland Little