Abstract: A system and method for managing a test of a motherboard can create a first test data consisting of test items. In the first test data, one or more selected test items to perform can be identified. A second test data is obtained by performing a logical NOR operation on the test bits corresponding to the selected test items. After performing the test items, a third test data is created by setting the test bits corresponding to the selected test items that pass the test to the test bits of the selected test items in the first test data, and by setting the test bits corresponding to the selected test items that fail the test to the test bits of the test items that have not been selected in the first test data. By comparing the third with the test data, a test result of the motherboard is obtained.

Abstract: In a method for adjusting a display of a computer monitor, the computer monitor includes a storage system storing display parameters of the computer monitor and an on-screen display (OSD) menu. A size proportion of a display screen of the computer monitor and a virtual region on the display screen is defined, and a functional relationship between virtual parameters and the display parameters is predetermined. The OSD menu acquires the display parameters that are user-adjustable, and updates the display parameters in the storage system. The virtual parameters corresponding to the display parameters are computed according to the functional relationship. The computer monitor displays data output from a host computer on the virtual region according to the computed virtual parameters.

Abstract: A system and method for managing a test of a motherboard can create a first test data consisting of test items. In the first test data, one or more selected test items to perform can be identified. A second test data is obtained by performing a logical NOR operation on the test bits corresponding to the selected test items. After performing the test items, a third test data is created by setting the test bits corresponding to the selected test items that pass the test to the test bits of the selected test items in the first test data, and by setting the test bits corresponding to the selected test items that fail the test to the test bits of the test items that have not been selected in the first test data. By comparing the third with the test data, a test result of the motherboard is obtained.

Abstract: A method for controlling a test process of an electronic device using a data processing device creates test control data to test the electronic device, selects a test item of the electronic device sequentially according to test bits in the test control data, and modifies a test bit corresponding to the selected test item to obtain modified test control data if the electronic device passes the selected test item. The method further compares the modified test control data with the created test control data if all the test items have been performed to determine if the electronic device passes the test process, and outputs a signal indicating success if the electronic device passes the test process.