Patents by Inventor Xinfa Chen

Xinfa Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9366627
    Abstract: A light transmittance measuring apparatus includes a housing made of opaque material, a light source device disposed in the housing and for emitting a first light beam and a second light beam to the object, a light sensor and a microcontroller. The first light beam and the second light beam have different wavelength ranges and have a first light intensity value and a second light intensity value, respectively. The light sensor is for sensing the first and second light beams after passing through the object and obtaining a third and fourth light intensity values, respectively. The microcontroller is for comparing the first and third light intensity values to obtain the light transmittance of the object under the first light beam and compare the second and fourth light intensity values to obtain the light transmittance of the object under the second light beam.
    Type: Grant
    Filed: December 17, 2014
    Date of Patent: June 14, 2016
    Assignee: TPK Touch Solutions (Xiamen) Inc.
    Inventors: Chung-Hang Tai, Lijun Li, Musheng Li, Xinfa Chen, Meishu Wang
  • Publication number: 20150204783
    Abstract: A light transmittance measuring apparatus includes a housing made of opaque material, a light source device disposed in the housing and for emitting a first light beam and a second light beam to the object, a light sensor and a microcontroller. The first light beam and the second light beam have different wavelength ranges and have a first light intensity value and a second light intensity value, respectively. The light sensor is for sensing the first and second light beams after passing through the object and obtaining a third and fourth light intensity values, respectively. The microcontroller is for comparing the first and third light intensity values to obtain the light transmittance of the object under the first light beam and compare the second and fourth light intensity values to obtain the light transmittance of the object under the second light beam.
    Type: Application
    Filed: December 17, 2014
    Publication date: July 23, 2015
    Inventors: Chung-Hang Tai, Lijun Li, Musheng Li, Xinfa Chen, Meishu Wang