Abstract: A vapor chamber structure includes an aluminum upper plate, an aluminum lower plate, a working fluid and multiple micron-sized recesses. The aluminum upper plate has a first side and a second side. The aluminum lower plate has a third side and a fourth side. The aluminum upper and lower plates are correspondingly mated with each other to define an airtight chamber. The working fluid is filled in the airtight chamber. The micron-sized recesses are directly formed on the third side. The micron-sized recesses are upward raised and/or downward recessed from the third side in the form of multiple small puddles so as to enhance the boiling efficiency of the working fluid in the airtight chamber and promote liquid-vapor circulation performance of the vapor chamber. In addition, when used in a low-temperature environment, the vapor chamber structure prevents the working fluid in the airtight chamber from freezing.

Abstract: Testing apparatuses, and methods for using such apparatuses to calibrate and test an antenna, include a chamber that includes a lining, the lining being made from a material that is absorptive to radiation at a test wavelength. An adjustable platform is positioned at a first side of the chamber, the adjustable platform being rotatable to change an orientation of a device under test. A probe is positioned at a second side of the chamber, opposite to the first side of the chamber, that measures electromagnetic radiation from the device under test. A vector network analyzer communicates with the device under test and the probe to determine calibration information for the device under test.

Abstract: Testing apparatuses, and methods for using such apparatuses to calibrate and test an antenna, include a chamber that includes a lining, the lining being made from a material that is absorptive to radiation at a test wavelength. An adjustable platform is positioned at a first side of the chamber, the adjustable platform being rotatable to change an orientation of a device under test. A probe is positioned at a second side of the chamber, opposite to the first side of the chamber, that measures electromagnetic radiation from the device under test. A vector network analyzer communicates with the device under test and the probe to determine calibration information for the device under test.

Abstract: A light emitting diode (LED) covered with a reflective layer by imprinting process is provided. The imprinting process includes coating a plastic layer on a mold to form an imprinting substrate; coating a reflective layer on the plastic layer and modifying the shape of the reflective layer to fit the shape of outer surfaces of the light emitting diode; softening the plastic layer and impressing the mold covered with the reflective layer upon the LED structure so that the reflective layer adheres to the surfaces of LED; and removing the mold. Because the reflective layer has high reflectivity, the light emitted from the top surface and side surfaces of LED is reflected back to the light extraction direction, and thereby the light extraction efficiency is enhanced.

Abstract: A light emitting diode (LED) covered with a reflective layer by imprinting process is provided. The imprinting process includes coating a plastic layer on a mold to form an imprinting substrate; coating a reflective layer on the plastic layer and modifying the shape of the reflective layer to fit the shape of outer surfaces of the light emitting diode; softening the plastic layer and impressing the mold covered with the reflective layer upon the LED structure so that the reflective layer adheres to the surfaces of LED; and removing the mold. Because the reflective layer has high reflectivity, the light emitted from the top surface and side surfaces of LED is reflected back to the light extraction direction, and thereby the light extraction efficiency is enhanced.