Abstract: A measurement system and associated techniques can reduce the time for obtaining 3D data about a target object by measurement.

Abstract: A measurement parameter for use when measuring an object with a measuring device provided on a robot may be adjusted and optimized significantly more easily than in conventional technology. A measurement parameter optimization method or operations performed by a processor may include: acquiring N captured images of objects with first measurement parameters; estimating recognized object counts Zi for the objects based on acquiring N/j captured images of the objects with second measurement parameters, and storing the recognized object counts Zi as first data; based on acquiring N/j/k captured images of the objects with third measurement parameters, estimating recognized object counts Zi for the objects based on the first data and storing the recognized object counts Zi as second data; and determining an optimized measurement parameter that satisfies a predetermined judgment criterion from among the second data.

Abstract: A control apparatus according to one or more embodiments generates poses of the measurement device to measure an object, determines, for the measurement device, a measurement path including the poses to cause the measurement device to move along the measurement path including the poses and to measure the object, instructs the robot to move the measurement device along a movement path including the measurement path and instructs the measurement device to measure the object in the poses, recognizes the object using obtained measurement data, and determines the measurement path for the measurement device for a next operating cycle.

Abstract: Values of parameters specifying conditions for obtaining 3D measurement data representing a measurement object are output as values satisfying a condition designated by a user.

Abstract: The three-dimensional measurement apparatus includes a projecting unit configured to project patterned light onto a measurement target and an image capturing unit configured to capture an image of the measurement target onto which the patterned light is projected, with a predetermined exposure time, a calculation unit configured to calculate positions of a three-dimensional point group expressing a three-dimensional shape of the measurement target based on the feature points included in the image, and a determination unit configured to determine the exposure time such that at least one of the number of feature points and the number of three-dimensional point groups is equal to or greater than a threshold that is defined based on one of their maximum numbers, and the exposure time is shorter than an exposure time for the maximum number.

Abstract: Provided are a measurement system, a measurement device, a measurement method, and a measurement program. 3D data is registered to 3D data based on the displacements of joints of a robot at a point in time when a 3D sensor measures 3D data of a measurement object at a specific measurement point while the robot is stopped, and the displacements of the joints of the robot at a point in time when the 3D sensor measures 3D data of the measurement object at a measurement point other than the specific measurement point while that robot is in motion. The 3D data is further registered to the 3D data such that a registration error between the 3D data and the 3D data is less than a threshold value. Similarly, each of 3D data is registered to the 3D data.

Abstract: The three-dimensional measurement apparatus includes a projecting unit configured to project patterned light onto a measurement target and an image capturing unit configured to capture an image of the measurement target onto which the patterned light is projected, with a predetermined exposure time, a calculation unit configured to calculate positions of a three-dimensional point group expressing a three-dimensional shape of the measurement target based on the feature points included in the image, and a determination unit configured to determine the exposure time such that at least one of the number of feature points and the number of three-dimensional point groups is equal to or greater than a threshold that is defined based on one of their maximum numbers, and the exposure time is shorter than an exposure time for the maximum number.

Abstract: A measurement parameter for use when measuring an object with a measuring device provided on a robot may be adjusted and optimized significantly more easily than in conventional technology. A measurement parameter optimization method or operations performed by a processor may include: acquiring N captured images of objects with first measurement parameters; estimating recognized object counts Zi for the objects based on acquiring N/j captured images of the objects with second measurement parameters, and storing the recognized object counts Zi as first data; based on acquiring N/j/k captured images of the objects with third measurement parameters, estimating recognized object counts Zi for the objects based on the first data and storing the recognized object counts Zi as second data; and determining an optimized measurement parameter that satisfies a predetermined judgment criterion from among the second data.

Abstract: A robot control device executes: capturing, using a hand-eye camera, a first image for use in image processing for determining a first target motion of a robot, and a second image for use in image processing for determining a second target motion following the first target motion; performing the image processing for determining the first target motion and the second target motion based on the first image and the second image, respectively; controlling the motion of the robot based on the first target motion and the second target motion. The image processing for determining the second target motion based on the second image is performed while the robot is in motion based on the first target motion. An image capturing device 82 captures the second image before the motion of a robot 60 based on the first target motion is completed.

Abstract: A light-projecting and image-capturing part may include at least a first unit, and a second unit. A pattern storage part may store predetermined pattern. A calculation part may select target pixels from captured images of a measurement object and may calculate three-dimensional positions of the target pixels based on a predetermined pattern in captured images and predetermined pattern stored in the pattern storage part. A light-projecting and image-capturing part may project a first patterned light and a second patterned light individually onto the measurement object, and may capture images of the measurement object, onto which the first patterned light and the second patterned light are individually projected, with a first image capturing part and a second image capturing part.

Abstract: Provided are a measurement system, a measurement device, a measurement method, and a measurement program. 3D data is registered to 3D data based on the displacements of joints of a robot at a point in time when a 3D sensor measures 3D data of a measurement object at a specific measurement point while the robot is stopped, and the displacements of the joints of the robot at a point in time when the 3D sensor measures 3D data of the measurement object at a measurement point other than the specific measurement point while that robot is in motion. The 3D data is further registered to the 3D data such that a registration error between the 3D data and the 3D data is less than a threshold value. Similarly, each of 3D data is registered to the 3D data.

Abstract: A three-dimensional measurement apparatus includes: projecting means for projecting, onto a measurement target, patterned light having a two-dimensionally coded pattern in which a plurality of types of words each having a different two-dimensional structure and being distinguishable from each other are two-dimensionally arranged; capturing means for capturing the measurement target onto which the patterned light is projected; and calculating means for calculating a three-dimensional position of a target pixel of the image from an image captured by the capturing means, and the two-dimensionally coded pattern is two-fold symmetrical. The two-dimensionally coded pattern is a pattern in which a predetermined word is repeated in the column direction for each column.

Abstract: Three-dimensional measurement is performed by projecting patterned light having a hybrid pattern Ph onto a measurement target. The hybrid pattern Ph is a pattern in which a random pattern Pr is superimposed on a structured light pattern Ps, and is arranged in pattern such that the random pattern Pr and the structured light pattern Ps do not interfere mutually.

Abstract: A three-dimensional measurement apparatus includes: projecting means for projecting, onto a measurement target, patterned light having a two-dimensionally coded pattern in which a plurality of types of words each having a different two-dimensional structure and being distinguishable from each other are two-dimensionally arranged; capturing means for capturing the measurement target onto which the patterned light is projected; and calculating means for calculating a three-dimensional position of a target pixel of the image from an image captured by the capturing means, and the two-dimensionally coded pattern is two-fold symmetrical. The two-dimensionally coded pattern is a pattern in which a predetermined word is repeated in the column direction for each column.

Abstract: Three-dimensional measurement is performed by projecting patterned light having a hybrid pattern Ph onto a measurement target. The hybrid pattern Ph is a pattern in which a random pattern Pr is superimposed on a structured light pattern Ps, and is arranged in pattern such that the random pattern Pr and the structured light pattern Ps do not interfere mutually.