Patents by Inventor Xingfan Chen

Xingfan Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250030509
    Abstract: The present disclosure provides a method and device for performing signal communication based on a levitated particle. In one example, the method includes: preparing a levitated state of the particle; regulating and measuring a net charge quantity carried by the levitated particle; calibrating electromagnetic response characteristics of the levitated particle; applying an electromagnetic communication signal; obtaining and demodulating the electromagnetic communication signal.
    Type: Application
    Filed: May 25, 2023
    Publication date: January 23, 2025
    Applicants: ZHEJIANG LAB, ZHEJIANG UNIVERSITY
    Inventors: Huizhu HU, Zhenhai FU, Xiaowen GAO, Xingfan CHEN, Nan LI, Cheng LIU, Zhiming CHEN, Jinsheng XU, Shaochong ZHU, Yingying WANG, Peitong HE
  • Patent number: 12174335
    Abstract: An absolute gravimeter and a measurement method based on vacuum optical tweezers. The micro-nano particle releasing device is equipped with micro-nano particles, and is located above laser optical tweezers, and the laser optical tweezers have two capturing beams which pass through the respective convergent lenses and then converge at an intersection. An area where the intersection is located serves as an optical trap capturing region, and the micro-nano particles are stably captured by the two capturing beams in the optical trap capturing region. The optical interferometer is electrically connected to the signal processing device, the optical interferometer measures a displacement of the micro-nano particles in real time at the beginning of a free fall process from the optical trap capturing region and sends the displacement signal to the signal processing device. The signal processing device obtains a measured value of an absolute gravitational acceleration.
    Type: Grant
    Filed: August 28, 2020
    Date of Patent: December 24, 2024
    Assignees: ZHEJIANG UNIVERSITY, ZHEJIANG LAB
    Inventors: Xingfan Chen, Yishi Liu, Xiaowen Gao, Nan Li, Huizhu Hu, Cheng Liu
  • Publication number: 20230243998
    Abstract: An absolute gravimeter and a measurement method based on vacuum optical tweezers. The micro-nano particle releasing device is equipped with micro-nano particles, and is located above laser optical tweezers, and the laser optical tweezers have two capturing beams which pass through the respective convergent lenses and then converge at an intersection. An area where the intersection is located serves as an optical trap capturing region, and the micro-nano particles are stably captured by the two capturing beams in the optical trap capturing region. The optical interferometer is electrically connected to the signal processing device, the optical interferometer measures a displacement of the micro-nano particles in real time at the beginning of a free fall process from the optical trap capturing region and sends the displacement signal to the signal processing device. The signal processing device obtains a measured value of an absolute gravitational acceleration.
    Type: Application
    Filed: August 28, 2020
    Publication date: August 3, 2023
    Applicants: ZHEJIANG UNIVERSITY, ZHEJIANG LAB
    Inventors: Xingfan CHEN, Yishi LIU, Xiaowen GAO, Nan LI, Huizhu HU, Cheng LIU
  • Patent number: 11255767
    Abstract: A method and a device for measuring light field distribution are provided; including steps of utilizing the optical trap to stably levitating particles, moving the optical trap to bring the particles close to the light field to be measured, and utilizing the photodetector to collect the scattered light signals of the particles at different positions in the three-dimensional space of the light field to be measured, and calculating the light field distribution of the light field to be measured according to the scattered light intensity which is proportional to the light intensity at that position. The device for measuring the optical field distribution includes a laser, an optical trapping path, particles, a photodetector, a control system and an upper computer; the laser emits a laser, passes through the optical trapping path, and emits highly focused captured light B to form an V optical trap to capture particles.
    Type: Grant
    Filed: July 10, 2021
    Date of Patent: February 22, 2022
    Assignees: Zhejiang Lab, Zhejiang University
    Inventors: Zhenhai Fu, Cheng Liu, Zhiming Chen, Xingfan Chen, Nan Li, Huizhu Hu
  • Publication number: 20210333190
    Abstract: A method and a device for measuring light field distribution are provided; including steps of utilizing the optical trap to stably levitating particles, moving the optical trap to bring the particles close to the light field to be measured, and utilizing the photodetector to collect the scattered light signals of the particles at different positions in the three-dimensional space of the light field to be measured, and calculating the light field distribution of the light field to be measured according to the scattered light intensity which is proportional to the light intensity at that position. The device for measuring the optical field distribution includes a laser, an optical trapping path, particles, a photodetector, a control system and an upper computer; the laser emits a laser, passes through the optical trapping path, and emits highly focused captured light B to form an V optical trap to capture particles.
    Type: Application
    Filed: July 10, 2021
    Publication date: October 28, 2021
    Inventors: Zhenhai Fu, Cheng Liu, Zhiming Chen, Xingfan Chen, Nan Li, Huizhu Hu