Patents by Inventor Xinguo ZHANG

Xinguo ZHANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11976014
    Abstract: The invention relates to the technical field of agricultural planting, in particular to a controlled-release bacterial fertilizer for peanuts and a preparation method of the special controlled-release bacterial fertilizer. The special controlled-release bacterial fertilizer is composed of an inner layer and an outer layer; after the outer layer is released completely, the inner-layer network structure gradually absorbs water and preserves moisture, and has good slow release and controlled release properties, thereby achieving the gradual release of the inner layer, high fertilizer utilization rate, exerting the efficacy of the microbial agent and facilitating the large-area promotion.
    Type: Grant
    Filed: July 20, 2020
    Date of Patent: May 7, 2024
    Assignee: Biotechnology Research Center, Shandong Academy of Agricultural Sciences
    Inventors: Jialei Zhang, Xinguo Li, Shubo Wan, Feng Guo, Jianguo Wang, Zheng Zhang, Gao Chen, Chaohui Tang, Sha Yang, Zhenying Peng, Jingjing Meng
  • Patent number: 11960869
    Abstract: An Android penetration method and device for implementing silent installation based on accessibility services. The method includes: acquiring a second target application by adding a load program to a first target application and adding penetration permissions using an Android decompilation technology; and implementing silent installation of the second target application using an accessibility service technology.
    Type: Grant
    Filed: January 5, 2022
    Date of Patent: April 16, 2024
    Assignee: Guangzhou University
    Inventors: Hui Lu, Zhihong Tian, Chengjie Jin, Luxiaohan He, Man Zhang, Jiageng Yang, Xinguo Zhang, Dongqiu Huang, Qi Sun, Yanbin Sun, Shen Su
  • Patent number: 11828177
    Abstract: The present disclosure provides a comprehensive utilization method and test equipment for surface water, a goaf and geothermal energy in a coal mining subsidence area. The method comprises the following steps: determining a geothermal water collection area, arranging heat energy exchange equipment in a main roadway, and arranging a geothermal water extraction system, wherein the geothermal water extraction system comprises geothermal wells, extraction pipelines and tail water reinjection pipelines, the extraction pipelines are connected with the heat energy exchange equipment, and the tail water reinjection pipelines are connected with a water outlet of the heat energy exchange equipment; arranging a water channel on the surface, and arranging a drainage system on a subsidence trough to guide surface water to flow underground; and controlling directional and ordered flow of surface water through the coal mining subsidence area formed by ground mining to achieve sustainable mining of underground water.
    Type: Grant
    Filed: January 26, 2022
    Date of Patent: November 28, 2023
    Assignee: Shandong University of Science and Technology
    Inventors: Jinhai Zhao, Liming Yin, Xinguo Zhang, Wenbin Sun, Changjian Zhou, Juntao Chen, Shichuan Zhang, Ning Jiang, Yangyang Li, Yin Liu, Yunzhao Zhang, Shupeng Zhang, Zhixue Zhang, Yang Qiao, Dan Kang
  • Publication number: 20230003123
    Abstract: The present disclosure provides a comprehensive utilization method and test equipment for surface water, a goaf and geothermal energy in a coal mining subsidence area. The method comprises the following steps: determining a geothermal water collection area, arranging heat energy exchange equipment in a main roadway, and arranging a geothermal water extraction system, wherein the geothermal water extraction system comprises geothermal wells, extraction pipelines and tail water reinjection pipelines, the extraction pipelines are connected with the heat energy exchange equipment, and the tail water reinjection pipelines are connected with a water outlet of the heat energy exchange equipment; arranging a water channel on the surface, and arranging a drainage system on a subsidence trough to guide surface water to flow underground; and controlling directional and ordered flow of surface water through the coal mining subsidence area formed by ground mining to achieve sustainable mining of underground water.
    Type: Application
    Filed: January 26, 2022
    Publication date: January 5, 2023
    Inventors: Jinhai ZHAO, Liming YIN, Xinguo ZHANG, Wenbin SUN, Changjian ZHOU, Juntao CHEN, Shichuan ZHANG, Ning JIANG, Yangyang LI, Yin LIU, Yunzhao ZHANG, Shupeng ZHANG, Zhixue ZHANG, Yang QIAO, Dan KANG
  • Publication number: 20220129256
    Abstract: Embodiments of the present invention provides an Android penetration method and device for implementing silent installation based on accessibility services. The method includes: acquiring a second target application by adding a load program to a first target application and adding penetration permissions using an Android decompilation technology; and implementing silent installation of the second target application using an accessibility service technology. The embodiment of the present invention enables a terminal to perform silent penetration test without root and user interaction. The embodiments of the present invention can also improve the stability of the penetration session.
    Type: Application
    Filed: January 5, 2022
    Publication date: April 28, 2022
    Inventors: Hui Lu, Zhihong Tian, Chengjie Jin, Luxiaohan He, Man Zhang, Jiageng Yang, Xinguo Zhang, Dongqiu Huang, Qi Sun, Yanbin Sun, Shen Su
  • Patent number: 9842038
    Abstract: Embodiments of the present invention utilize a dual buffer size threshold system for raising interrupts that allows DUT testing systems to perform real-time buffer memory allocation procedures in an on demand basis. Using dual interrupt threshold systems in the manner described by embodiments of the present invention, DUT testing systems can reduce the need to decide on a single buffer size threshold when testing a set of DUTs that separately provide different amounts of fail data relative to each other. As such, embodiments of the present invention can minimize the overhead processing spent on interrupt handling while also reducing the amount wait time needed for the data processing module to process fail data for each DUT. Thus, embodiments of the present invention can increase the use of tester resources more efficiently while decrease the amount of time a tester system spends collecting and/or analyzing fail data for a set of DUTs during a testing session.
    Type: Grant
    Filed: April 30, 2015
    Date of Patent: December 12, 2017
    Assignee: Advantest Corporation
    Inventors: Xinguo Zhang, Yi Liu, Ze'ev Raz, Darrin Albers, Alan S. Krech, Jr., Shigeo Chiyoda, Jesse Hobbs
  • Patent number: 9612272
    Abstract: An ATE system performs RA over NAND flash memory DUTs. A first UBM captures fresh failure related data from a DUT. A second UBM transmits existing failure related data. A fail engine accesses the stored existing failure related data and generates a failure list based thereon. The storing and the accessing the existing failure related data, and/or the generating the failure list, are performed in parallel contemporaneously in relation to the capturing the fresh data. The generated failure list is queued. A failure processor, which may be operable for controlling the capturing, computes a redundancy analysis based on the queued failure list. The first and second UBMs then ping-pong operably.
    Type: Grant
    Filed: February 26, 2014
    Date of Patent: April 4, 2017
    Assignee: ADVANTEST CORPORATION
    Inventors: Xinguo Zhang, Michael Jones, Ken Hanh Duc Lai, Edmundo De La Puente, Alan S. Krech, Jr.
  • Patent number: 9558852
    Abstract: System and method of selecting defective columns in NAND memory devices for repair. After locating the defective blocks and defective columns in a NAND memory device, a weight value is calculated for each defective block by dividing a total number of defective blocks that would be inherently repaired as a result of repairing the respective defective block by a number of defective data columns in the respective defective block. A defective block with the greatest weight value is selected for repair in which the defective columns in the selected block are substituted by redundant columns. Other defective blocks with defective columns having the same column addresses with the defective columns in the selected defective block are automatically selected for repair as well. Remaining defective columns are selected for repair by iteratively updating weight values and selecting a defective block that has the greatest weight value among the remaining defective blocks.
    Type: Grant
    Filed: April 15, 2015
    Date of Patent: January 31, 2017
    Assignee: Advantest Corporation
    Inventors: Xinguo Zhang, Ze'ev Raz, Yang Liu
  • Publication number: 20160321153
    Abstract: Embodiments of the present invention utilize a dual buffer size threshold system for raising interrupts that allows DUT testing systems to perform real-time buffer memory allocation procedures in an on demand basis. Using dual interrupt threshold systems in the manner described by embodiments of the present invention, DUT testing systems can reduce the need to decide on a single buffer size threshold when testing a set of DUTs that separately provide different amounts of fail data relative to each other. As such, embodiments of the present invention can minimize the overhead processing spent on interrupt handling while also reducing the amount wait time needed for the data processing module to process fail data for each DUT. Thus, embodiments of the present invention can increase the use of tester resources more efficiently while decrease the amount of time a tester system spends collecting and/or analyzing fail data for a set of DUTs during a testing session.
    Type: Application
    Filed: April 30, 2015
    Publication date: November 3, 2016
    Inventors: Xinguo ZHANG, Yi LIU, Ze'ev RAZ, Darrin ALBERS, Alan S. KRECH, JR., Shigeo CHIYODA, Jesse HOBBS
  • Patent number: 9330792
    Abstract: Automated testing system and method of testing memory devices with distributed processing operations. A redundancy analysis system includes multiple test site processors (TSPs) respectively coupled to multiple devices under test (DUTs). Each TSP is installed with a redundancy analyzer configured to analyzing redundancy data returned from a respective (DUT). Each TSP may be coupled with a respective fail engine for returning the redundancy data from the corresponding DUT. A main TSP of the multiple TSPs is configured to control testing routine over the multiple DUTs and process failure related data from the DUTs. The main TSP may direct the RAs distributed in the multiple TSPs to execute the redundancy analyzers in parallel.
    Type: Grant
    Filed: February 26, 2014
    Date of Patent: May 3, 2016
    Assignee: ADVANTEST CORPORATION
    Inventors: Xinguo Zhang, Ze'ev Raz, Ken Hanh Duc Lai, Edmundo De La Puente
  • Publication number: 20150294741
    Abstract: System and method of selecting defective columns in NAND memory devices for repair. After locating the defective blocks and defective columns in a NAND memory device, a weight value is calculated for each defective block by dividing a total number of defective blocks that would be inherently repaired as a result of repairing the respective defective block by a number of defective data columns in the respective defective block. A defective block with the greatest weight value is selected for repair in which the defective columns in the selected block are substituted by redundant columns. Other defective blocks with defective columns having the same column addresses with the defective columns in the selected defective block are automatically selected for repair as well. Remaining defective columns are selected for repair by iteratively updating weight values and selecting a defective block that has the greatest weight value among the remaining defective blocks.
    Type: Application
    Filed: April 15, 2015
    Publication date: October 15, 2015
    Inventors: Xinguo ZHANG, Ze'ev RAZ, Yang LIU
  • Publication number: 20150243370
    Abstract: ATE performs testing of memory devices with distributed processing operations. A redundancy analysis (RA) system has a first test site processor (TSP), operable for controlling a testing routine over multiple DUTs and analyzing redundancy data returned from a first of the DUTs. The RA has at least a second TSP, operable for analyzing redundancy data returned from a second of the DUTs. The RA may have one or more additional TSPs, each operable for analyzing redundancy data returned from an additional DUT. Controlling the testing routine includes directing the RA in each of the first and second (and any of the additional) TSPs.
    Type: Application
    Filed: February 26, 2014
    Publication date: August 27, 2015
    Applicant: Advantest Corporation
    Inventors: Xinguo ZHANG, Ze'ev RAZ, Ken Hanh Duc LAI, Edmundo DE LA PUENTE
  • Publication number: 20150243369
    Abstract: An ATE system performs RA over NAND flash memory DUTs. A first UBM captures fresh failure related data from a DUT. A second UBM transmits existing failure related data. A fail engine accesses the stored existing failure related data and generates a failure list based thereon. The storing and the accessing the existing failure related data, and/or the generating the failure list, are performed in parallel contemporaneously in relation to the capturing the fresh data. The generated failure list is queued. A failure processor, which may be operable for controlling the capturing, computes a redundancy analysis based on the queued failure list. The first and second UBMs then ping-pong operably.
    Type: Application
    Filed: February 26, 2014
    Publication date: August 27, 2015
    Applicant: Advantest Corporation
    Inventors: Xinguo ZHANG, Michael JONES, Ken Hanh Duc LAI, Edmundo DE LA PUENTE, Alan S. KRECH, JR.