Patents by Inventor Xinjue Zou

Xinjue Zou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8112172
    Abstract: A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.
    Type: Grant
    Filed: April 29, 2009
    Date of Patent: February 7, 2012
    Assignee: General Electric Company
    Inventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
  • Patent number: 7924439
    Abstract: A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.
    Type: Grant
    Filed: April 6, 2009
    Date of Patent: April 12, 2011
    Assignee: General Electric Company
    Inventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
  • Patent number: 7876454
    Abstract: A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.
    Type: Grant
    Filed: September 29, 2008
    Date of Patent: January 25, 2011
    Assignee: General Electric Company
    Inventors: Xiaoming Du, Kevin George Harding, Steven Robert Hayashi, Tian Chen, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou
  • Publication number: 20100280649
    Abstract: A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.
    Type: Application
    Filed: April 29, 2009
    Publication date: November 4, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
  • Publication number: 20100079769
    Abstract: A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.
    Type: Application
    Filed: April 6, 2009
    Publication date: April 1, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
  • Publication number: 20090067704
    Abstract: A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.
    Type: Application
    Filed: September 29, 2008
    Publication date: March 12, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Xiaoming Du, Kevin George Harding, Steven Robert Hayashi, Tian Chen, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou