Abstract: The present subject matter relates to inspection systems, devices and methods for x-ray inspection of objects. A conveyor can move an object to be inspected through an inspection zone along a direction of travel, one or more multibeam x-ray source arrays can provide multiple collimated x-ray beams through the inspection zone along a direction substantially perpendicular to the direction of travel, and one or more x-ray detector arrays can detect x-ray beams passing through the inspection zone from the x-ray source array. X-ray signals detected by the x-ray detector array can be recorded to form multiple x-ray projection images of the object, and the multiple x-ray projection images can be processed into three-dimensional tomographic images of the object.