Patents by Inventor Xiujun ZHU

Xiujun ZHU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for processing filter to obtain calibration dust filter, and method for off-site calibration using calibration dust filter
    Patent number: 11181458
    Abstract: The present invention provides a method for processing a filter to obtain a calibration dust filter, and a method for off-site calibration using the calibration dust filter. In the present invention, a batch of filters that meets specific requirements is screened out as the basal filters, and then the basal filters are processed in an actual environment to obtain the calibration dust filters. The counted number of beta particles is measured before and after sampling, and then a correction factor K is inversely inferred. The beta attenuation suspended particulate analyzer is corrected using the correction factor K.
    Type: Grant
    Filed: July 31, 2017
    Date of Patent: November 23, 2021
    Assignee: Chinese Research Academy of Environmental Sciences
    Inventors: Zhipeng Bai, Wen Yang, Xinhua Wang, Chunmei Geng, Jing Wang, Baohui Yin, Bin Han, Xiujun Zhu, Xia Zhang, Xueyan Zhao, Yan Jiang, Xiaoli Wang, Wengang Sheng, Junfeng Guo
  • METHOD FOR PROCESSING FILTER TO OBTAIN CALIBRATION DUST FILTER, AND METHOD FOR OFF-SITE CALIBRATION USING CALIBRATION DUST FILTER
    Publication number: 20210010921
    Abstract: The present invention provides a method for processing a filter to obtain a calibration dust filter, and a method for off-site calibration using the calibration dust filter. In the present invention, a batch of filters that meets specific requirements is screened out as the basal filters, and then the basal filters are processed in an actual environment to obtain the calibration dust filters. The counted number of beta particles is measured before and after sampling, and then a correction factor K is inversely inferred. The beta attenuation suspended particulate analyzer is corrected using the correction factor K.
    Type: Application
    Filed: July 31, 2017
    Publication date: January 14, 2021
    Inventors: Zhipeng BAI, Wen YANG, Xinhua WANG, Chunmei GENG, Jing WANG, Baohui YIN, Bin HAN, Xiujun ZHU, Xia ZHANG, Xueyan ZHAO, Yan JIANG, Xiaoli WANG, Wengang SHENG, Junfeng GUO