Abstract: A method for making a semiconductor device may include forming first and second semiconductor regions laterally adjacent one another and each comprising a first semiconductor material. The method may further include forming an in-situ doped, punch-through stopper layer above the second semiconductor region comprising the first semiconductor material and a first dopant, and forming a semiconductor buffer layer above the punch-through stopper layer, where the punch-through stopper layer includes the first semiconductor material. The method may also include forming a third semiconductor region above the semiconductor buffer layer, where the third semiconductor region includes a second semiconductor material different than the first semiconductor material.

Abstract: A method for making a semiconductor device is provided. Raised source and drain regions are formed with a tensile strain-inducing material, after thermal treatment to form source drain extension regions, to thereby preserve the strain-inducing material in desired substitutional states.