Patents by Inventor Xiwu Cao
Xiwu Cao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20230410478Abstract: A processing apparatus is provided that is configured to perform operations including obtaining a plurality of images having been evaluated by different sources such that each source has classified each of the plurality of image as being a member of one of a predefined class, generating a distribution array identifying a number of times each image of the plurality of images has been classified into each of the predefined classes, generating, for each predefined class, a loss function based on the ratio of a number of images in other classes of the predefined classes to a number of images to this predefined classes, providing the generated loss function for each predefined class as evaluation parameters to a model, and using the generated loss function to determine that the model classifies raw image data as being a member of one of the predefined classes according to a predetermined accuracy threshold.Type: ApplicationFiled: November 8, 2021Publication date: December 21, 2023Inventor: Xiwu Cao
-
Publication number: 20230401813Abstract: An image processing apparatus and method are provided which obtains an image captured by an image capture device and stored in a memory, extracts one or more regions of interest in the obtained image, normalizes the extracted one or more regions of interest to be at a same scale or some predefined scales, extract the frequency information of regions of interest, determines a sharpness of the obtained image by aggregating the frequency information in each of the one or more extracted regions of interest, and labels the obtained image with the determined sharpness score.Type: ApplicationFiled: November 8, 2021Publication date: December 14, 2023Inventor: Xiwu Cao
-
Publication number: 20220366181Abstract: Devices, systems, and methods obtain one or more training images; obtain a test image; select one or more associated pixels in the training images for a target pixel in the training images; calculate respective value relationships between a value of the target pixel and respective values of the associated pixels in the training images; select one or more associated pixels in the test image for a target pixel in the test image; and detect an anomaly in the target pixel in the test image based on the respective value relationships between the value of the target pixel and the respective values of the associated pixels in the training images and on respective value relationships between a value of the target pixel and respective values of the associated pixels in the test image.Type: ApplicationFiled: July 22, 2022Publication date: November 17, 2022Inventors: Xiwu Cao, Bradley Scott Denney
-
Patent number: 11429806Abstract: Devices, systems, and methods obtain one or more training images; obtain a test image; select one or more associated pixels in the training images for a target pixel in the training images; calculate respective value relationships between a value of the target pixel and respective values of the associated pixels in the training images; select one or more associated pixels in the test image for a target pixel in the test image; and detect an anomaly in the target pixel in the test image based on the respective value relationships between the value of the target pixel and the respective values of the associated pixels in the training images and on respective value relationships between a value of the target pixel and respective values of the associated pixels in the test image.Type: GrantFiled: November 8, 2019Date of Patent: August 30, 2022Assignee: Canon Virginia, Inc.Inventors: Xiwu Cao, Bradley Scott Denney
-
Patent number: 11392846Abstract: Applying a local-adapted minority oversampling strategy technique to an imbalanced dataset including positive samples belonging to a minority class and negative samples belonging to a majority class, the minority class being less prevalent than the majority class, wherein each sample from the dataset includes a plurality of features. The local-adapted minority oversampling strategy includes determining a local imbalance for each positive sample from the minority class corresponding to a number of other positive samples and/or negative samples within a neighborhood of each positive sample. The local-adapted minority oversampling strategy also includes calculating a local-adapted oversampling ratio based on the local imbalance estimated for each positive sample and replicating each positive sample using the local-adapted oversampling ratio to generate a new dataset.Type: GrantFiled: May 24, 2019Date of Patent: July 19, 2022Assignee: Canon U.S.A., Inc.Inventors: Xiwu Cao, Samuel Schrader
-
Publication number: 20220207746Abstract: Some embodiments of devices, systems, and methods obtain at least one first image, wherein the at least one first image is defined in an image space; select at least one feature in the at least one first image; define a topology based on the at least one feature; generate a topology mapping between the topology and the image-space topology; obtain a plurality of anomaly scores, wherein each anomaly score of the plurality of anomaly scores was generated based on a respective detection area in a second image; map the plurality of anomaly scores to the topology based on the topology mapping; and normalize each anomaly score in the plurality of anomaly scores based on the respective neighboring anomaly scores in the topology, thereby generating normalized anomaly scores.Type: ApplicationFiled: March 17, 2022Publication date: June 30, 2022Inventors: Xiwu Cao, Bradley Scott Denney
-
Patent number: 11321846Abstract: Some embodiments of devices, systems, and methods obtain at least one first image, wherein the at least one first image is defined in an image space; select at least one feature in the at least one first image; define a topology based on the at least one feature; generate a topology mapping between the topology and the image-space topology; obtain a plurality of anomaly scores, wherein each anomaly score of the plurality of anomaly scores was generated based on a respective detection area in a second image; map the plurality of anomaly scores to the topology based on the topology mapping; and normalize each anomaly score in the plurality of anomaly scores based on the respective neighboring anomaly scores in the topology, thereby generating normalized anomaly scores.Type: GrantFiled: March 24, 2020Date of Patent: May 3, 2022Assignee: Canon Virginia, Inc.Inventors: Xiwu Cao, Bradley Scott Denney
-
Patent number: 11189023Abstract: Devices, systems, and methods obtain a reference image; obtain a test image; globally align the test image to the reference image; select subfields in the test image; align the subfields in the test image with respective areas in the reference image; warp the test image based on the aligning of the subfields; select anchor points in the reference image; select anchor-edge points in the reference image; realign the subfields in the warped test image with respective areas in the reference image based on the anchor points in the reference image and on the anchor-edge points in the reference image; and warp the warped test image based on the realigning of the subfields.Type: GrantFiled: November 19, 2020Date of Patent: November 30, 2021Assignee: Canon Virginia, Inc.Inventors: Xiwu Cao, Nikhil Krishnan, Bradley Scott Denney, Hung Khei Huang
-
Patent number: 11132791Abstract: Devices, systems, and methods obtain a reference image; obtain a test image; globally align the test image to the reference image; select subfields in the test image; align the subfields in the test image with respective areas in the reference image; warp the test image based on the aligning of the subfields; select anchor points in the reference image; select anchor-edge points in the reference image; realign the subfields in the warped test image with respective areas in the reference image based on the anchor points in the reference image and on the anchor-edge points in the reference image; and warp the warped test image based on the realigning of the subfields.Type: GrantFiled: November 19, 2020Date of Patent: September 28, 2021Assignee: Canon Virginia, Inc.Inventors: Xiwu Cao, Nikhil Krishnan, Bradley Scott Denney, Hung Khei Huang
-
Patent number: 10997712Abstract: Devices, systems, and methods obtain a reference image; obtain a test image; globally align the test image to the reference image; select subfields in the test image; align the subfields in the test image with respective areas in the reference image; warp the test image based on the aligning of the subfields; select anchor points in the reference image; select anchor-edge points in the reference image; realign the subfields in the warped test image with respective areas in the reference image based on the anchor points in the reference image and on the anchor-edge points in the reference image; and warp the warped test image based on the realigning of the subfields.Type: GrantFiled: January 15, 2019Date of Patent: May 4, 2021Assignee: Canon Virginia, Inc.Inventors: Xiwu Cao, Nikhil Krishnan, Bradley Scott Denney, Hung Khei Huang
-
Publication number: 20210073964Abstract: Devices, systems, and methods obtain a reference image; obtain a test image; globally align the test image to the reference image; select subfields in the test image; align the subfields in the test image with respective areas in the reference image; warp the test image based on the aligning of the subfields; select anchor points in the reference image; select anchor-edge points in the reference image; realign the subfields in the warped test image with respective areas in the reference image based on the anchor points in the reference image and on the anchor-edge points in the reference image; and warp the warped test image based on the realigning of the subfields.Type: ApplicationFiled: November 19, 2020Publication date: March 11, 2021Inventors: Xiwu Cao, Nikhil Krishnan, Bradley Scott Denney, Hung Khei Huang
-
Publication number: 20210073965Abstract: Devices, systems, and methods obtain a reference image; obtain a test image; globally align the test image to the reference image; select subfields in the test image; align the subfields in the test image with respective areas in the reference image; warp the test image based on the aligning of the subfields; select anchor points in the reference image; select anchor-edge points in the reference image; realign the subfields in the warped test image with respective areas in the reference image based on the anchor points in the reference image and on the anchor-edge points in the reference image; and warp the warped test image based on the realigning of the subfields.Type: ApplicationFiled: November 19, 2020Publication date: March 11, 2021Inventors: Xiwu Cao, Nikhil Krishnan, Bradley Scott Denney, Hung Khei Huang
-
Publication number: 20200372383Abstract: Applying a local-adapted minority oversampling strategy technique to an imbalanced dataset including positive samples belonging to a minority class and negative samples belonging to a majority class, the minority class being less prevalent than the majority class, wherein each sample from the dataset includes a plurality of features. The local-adapted minority oversampling strategy includes determining a local imbalance for each positive sample from the minority class corresponding to a number of other positive samples and/or negative samples within a neighborhood of each positive sample. The local-adapted minority oversampling strategy also includes calculating a local-adapted oversampling ratio based on the local imbalance estimated for each positive sample and replicating each positive sample using the local-adapted oversampling ratio to generate a new dataset.Type: ApplicationFiled: May 24, 2019Publication date: November 26, 2020Inventors: Xiwu Cao, Samuel Schrader
-
Publication number: 20200311944Abstract: Some embodiments of devices, systems, and methods obtain at least one first image, wherein the at least one first image is defined in an image space; select at least one feature in the at least one first image; define a topology based on the at least one feature; generate a topology mapping between the topology and the image-space topology; obtain a plurality of anomaly scores, wherein each anomaly score of the plurality of anomaly scores was generated based on a respective detection area in a second image; map the plurality of anomaly scores to the topology based on the topology mapping; and normalize each anomaly score in the plurality of anomaly scores based on the respective neighboring anomaly scores in the topology, thereby generating normalized anomaly scores.Type: ApplicationFiled: March 24, 2020Publication date: October 1, 2020Inventors: Xiwu Cao, Bradley Scott Denney
-
Publication number: 20200151496Abstract: Devices, systems, and methods obtain one or more training images; obtain a test image; select one or more associated pixels in the training images for a target pixel in the training images; calculate respective value relationships between a value of the target pixel and respective values of the associated pixels in the training images; select one or more associated pixels in the test image for a target pixel in the test image; and detect an anomaly in the target pixel in the test image based on the respective value relationships between the value of the target pixel and the respective values of the associated pixels in the training images and on respective value relationships between a value of the target pixel and respective values of the associated pixels in the test image.Type: ApplicationFiled: November 8, 2019Publication date: May 14, 2020Inventors: Xiwu Cao, Bradley Scott Denney
-
Publication number: 20190220965Abstract: Devices, systems, and methods obtain a reference image; obtain a test image; globally align the test image to the reference image; select subfields in the test image; align the subfields in the test image with respective areas in the reference image; warp the test image based on the aligning of the subfields; select anchor points in the reference image; select anchor-edge points in the reference image; realign the subfields in the warped test image with respective areas in the reference image based on the anchor points in the reference image and on the anchor-edge points in the reference image; and warp the warped test image based on the realigning of the subfields.Type: ApplicationFiled: January 15, 2019Publication date: July 18, 2019Inventors: Xiwu Cao, Nikhil Krishnan, Bradley Scott Denney, Hung Khei Huang