Patents by Inventor Xiyu Yi

Xiyu Yi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11598946
    Abstract: Devices, systems and methods for widefield three-dimensional (3D) microscopy with a quantum entanglement light source are described. An example method includes generating a first set of photons and a second set of photons, wherein each of the photons in the first set is quantum entangled with a corresponding photon in the second set, directing the second set of photons toward a sample and simultaneously directing the first set of photons toward a first two-dimensional (2D) detector, detecting, from the sample, a plurality of photons at a second 2D detector, analyzing detections from the first and second 2D detectors to determine coincidence information, and determining one or more characteristics associated with at least a three-dimensional (3D) section of the sample based on collective detections at the first and the second 2D detectors.
    Type: Grant
    Filed: October 14, 2020
    Date of Patent: March 7, 2023
    Assignee: LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
    Inventors: Tiziana C. Bond, Matthew A. Horsley, Shervin Kiannejad, Ted Laurence, Ty Samo, Peter Weber, Xiyu Yi
  • Publication number: 20220113529
    Abstract: Devices, systems and methods for widefield three-dimensional (3D) microscopy with a quantum entanglement light source are described. An example method includes generating a first set of photons and a second set of photons, wherein each of the photons in the first set is quantum entangled with a corresponding photon in the second set, directing the second set of photons toward a sample and simultaneously directing the first set of photons toward a first two-dimensional (2D) detector, detecting, from the sample, a plurality of photons at a second 2D detector, analyzing detections from the first and second 2D detectors to determine coincidence information, and determining one or more characteristics associated with at least a three-dimensional (3D) section of the sample based on collective detections at the first and the second 2D detectors.
    Type: Application
    Filed: October 14, 2020
    Publication date: April 14, 2022
    Inventors: Tiziana C. Bond, Matthew A. Horsley, Shervin Kiannejad, Ted Laurence, Ty Samo, Peter Weber, Xiyu Yi