Abstract: A method for manufacturing a component carrier. The method includes (a) supplying a semifinished or finished component carrier to an automatic or semi-automatic optical inspection device and (b) performing an automatic or semi-automatic optical inspection by capturing a first image with a first illumination; capturing a second image with a second illumination; comparing a data set indicative of the first image and/or the second image with a reference data set; and identifying potential defects; (c) performing a quality classification of the semifinished or finished component carrier by generating a virtual third image indicative of the component carrier under a virtual different third illumination having a third spectral composition different from both the first spectral composition and from the second spectral composition; processing the three images; classifying the potential defects in true defects and false defects; and (d) taking action based on the quality classification.

Abstract: A method for manufacturing a component carrier. The method includes (a) supplying a semifinished or finished component carrier to an automatic or semi-automatic optical inspection device and (b) performing an automatic or semi-automatic optical inspection by capturing a first image with a first illumination; capturing a second image with a second illumination; comparing a data set indicative of the first image and/or the second image with a reference data set; and identifying potential defects; (c) performing a quality classification of the semifinished or finished component carrier by generating a virtual third image indicative of the component carrier under a virtual different third illumination having a third spectral composition different from both the first spectral composition and from the second spectral composition; processing the three images; classifying the potential defects in true defects and false defects; and (d) taking action based on the quality classification.