Patents by Inventor Xuemei Xi

Xuemei Xi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10756019
    Abstract: A die-to-die interconnect structure includes an interconnect network including a plurality of metal interconnect layers. The interconnect network is configured to electrically couple a first die and a second die mounted on a top surface of the die-to-die interconnect structure. A first metal interconnect layer of the plurality of metal interconnect layers includes a plurality of ground lines and a plurality of signal lines distributed across the first metal interconnect layer according to a GSSG pattern. In some examples, adjacent signal lines within the first metal interconnect layer are separated by a dielectric region. In some embodiments, a second metal interconnect layer of the plurality of metal interconnect layers is disposed above the first metal interconnect layer and includes a plurality of configurable signal/ground lines. By way of example, each of the plurality of configurable signal/ground lines is disposed over the dielectric region and within the second metal interconnect layer.
    Type: Grant
    Filed: November 27, 2018
    Date of Patent: August 25, 2020
    Assignee: Xilinx, Inc.
    Inventors: Shuxian Wu, Xiaobao Wang, Xuemei Xi