Patents by Inventor Xuemiao LI

Xuemiao LI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250002869
    Abstract: A purified phage having a specific bactericidal activity against Burkholderia pseudomallei (Bp), such as a Bp phage vB_BpP_HN01. A composition for preventing or treating an infectious disease caused by the Bp includes the phage as an active ingredient. The present disclosure further provides an antibiotic including the phage as an active ingredient, a feed additive composition including the phage as an active ingredient, and a disinfectant or a cleaning agent including the phage as an active ingredient. The present disclosure further provides a method for using the Bp. The purified phage has a specific bactericidal activity against the Bp. Therefore, the phage may be used for the prevention or treatment of an infectious disease caused by the Bp, and may also be widely used for the preparation of an antibiotic, a drug, a bactericide, an antiseptic, a disinfectant, and a diagnostic preparation for a bacterial infection.
    Type: Application
    Filed: June 30, 2023
    Publication date: January 2, 2025
    Inventors: Qianfeng XIA, Yanshuang WANG, Shen TIAN, Nini LUO, Xuemiao LI
  • Patent number: 10975188
    Abstract: The present invention relates to a rapid assembled small-sized block polymer material with low quenching temperature and the preparation and application thereof. In particular, the present invention discloses a block copolymer, and glass transition temperature of the block copolymer is less than 120° C. The present invention also discloses the preparation and application of the block copolymer. The block copolymer can achieve excellent phase separation and rapid patterning at a lower annealing temperature (e.g. 80° C.) and a shorter annealing time (e.g. 30 s), and a photolithographic pattern with a very high resolution (e.g. 5 nm half-pitch) can be further obtained by etching, which provides a new photolithographic mean for further extension of Moore's Law to achieve semiconductor photolithography with a resolution of less than 10 nm, or even 5 nm (half-pitch).
    Type: Grant
    Filed: June 5, 2017
    Date of Patent: April 13, 2021
    Assignee: FUDAN UNIVERSITY
    Inventors: Hai Deng, Xuemiao Li, Jie Li
  • Publication number: 20200040119
    Abstract: The present invention discloses a block copolymer comprising at least a block A and a block B, wherein the monomer of block A contains one or more of the structural units: a C3-C6 alkenyl group containing a substituent or a C3-C6 alkenyl group; wherein the number of R1 is 0, 1, 2, 3, 4 or 5; R2 is selected from the group consisting of: absent, substituted or unsubstituted C1-C6 alkyl, substituted or unsubstituted C1-C6 alkoxyl, hydroxyl, halogen; “substituted” means a group is substituted by one or more substituents selected from halogen and hydroxyl; block B is obtained by polymerization of the monomer R6 is selected from F or a group containing F, and the number of R6 is 0, 1, 2, 3, 4 or 5. The block copolymer can assemble rapidly at a low temperature with self-repairing performance to reduce the defect rate.
    Type: Application
    Filed: November 1, 2018
    Publication date: February 6, 2020
    Applicant: Fudan University
    Inventors: Hai DENG, Chenxu WANG, Zhilong LI, Xuemiao LI
  • Publication number: 20180208697
    Abstract: The present invention relates to a rapid assembled small-sized block polymer material with low quenching temperature and the preparation and application thereof. In particular, the present invention discloses a block copolymer, and glass transition temperature of the block copolymer is less than 120° C. The present invention also discloses the preparation and application of the block copolymer. The block copolymer can achieve excellent phase separation and rapid patterning at a lower annealing temperature (e.g. 80° C.) and a shorter annealing time (e.g. 30 s), and a photolithographic pattern with a very high resolution (e.g. 5 nm half-pitch) can be further obtained by etching, which provides a new photolithographic mean for further extension of Moore's Law to achieve semiconductor photolithography with a resolution of less than 10 nm, or even 5 nm (half-pitch).
    Type: Application
    Filed: June 5, 2017
    Publication date: July 26, 2018
    Inventors: Hai DENG, Xuemiao LI, Jie LI