Abstract: Provided is a pixel circuit. In the pixel circuit, a data writing circuit controls the connection or disconnection between a data terminal and a first node, a reset circuit controls the connection or disconnection between an initial power supply terminal and a second node and between an initial power supply terminal and a light-emitting element, and controls the connection or disconnection between a reference power supply terminal and the first node, a potential adjustment circuit adjusts the potentials of the first node, the second node and the third node, a light emission control circuit controls the connection or disconnection between the reference power supply terminal and the first node, and controls the connection or disconnection between the fourth node and the light-emitting element, and a drive circuit drives the light-emitting element to emit light.

Abstract: A pixel driving circuit is used for driving a light emitting element, in the pixel driving circuit, a first terminal of the driving sub-circuit being coupled to a power supply line; a compensation sub-circuit is respectively coupled to a scanning line, a control terminal of the driving sub-circuit, and a second terminal of the driving sub-circuit; a first terminal of the coupling sub-circuit being coupled to the control terminal of the driving sub-circuit; a first terminal of the storage sub-circuit being coupled to a second terminal of the coupling sub-circuit; a data writing-in sub-circuit is respectively coupled to a second terminal of the storage sub-circuit, a data line, and a reset line; a first reset sub-circuit is respectively coupled to the reset line, an initialization signal line, the control terminal of the driving sub-circuit, and the second terminal of the coupling sub-circuit.

Abstract: The present application provides a method and an apparatus for measuring ingot diameter, and a device for growing the ingot. The method comprises controlling a first calibration light source and a second calibration light source to emit light; obtaining coordinates of the calibration light sources; obtaining a diameter measurement coefficient based on the coordinates; obtaining diameter coordinates of two ends of the ingot diameter; and obtaining a measured value of the diameter based on the diameter coordinates and the diameter measurement coefficient. Accordingly, the measurement error of the ingot diameter can be reduced, and the accuracy of ingot diameter control during the growth process can be improved, thereby the production efficiency of Czochralski silicon ingot can be increased.

Abstract: A pixel structure, a display panel and a display device are provided. The pixel structure includes: pixel circuits arranged in rows and columns, the pixel circuits including a first type and a second type of pixel circuits; a data line electrically connected to the pixel circuits, and used for providing a data voltage to the pixel circuit; the pixel circuits in two adjacent rows electrically connected to at least one data line are the first and second types of pixel circuits; light-emitting elements, including a first and a second light-emitting elements electrically connected to the first type and the second type of pixel circuits respectively; a display brightness of the first light-emitting element increases as the data voltage provided to the first type of pixel circuit increases; a display brightness of the second light-emitting element decreases as data voltage provided to the second type of pixel circuit increases.

Abstract: A display panel includes: a substrate; a driving layer, arranged on one side of the substrate and including multiple circuit units distributed in an array, multiple row wiring harnesses, and multiple column wiring harnesses; where the circuit unit includes multiple pixel circuits; the row wiring harness includes multiple row wirings distributed at intervals along a column direction, the column wiring harness includes multiple column wirings distributed at intervals along a row direction; orthographic projections of the row wiring harnesses and the column wiring harnesses on the substrate cross and separate multiple transparent regions, and a region of the driving layer corresponding to the transparent region is a transparent structure; and a light emitting layer, arranged on a surface of the driving layer away from the substrate, and including multiple device units distributed in an array; where the device units correspond to the transparent regions.

Abstract: A pixel driving circuit is used for driving a light emitting element, in the pixel driving circuit, a first terminal of the driving sub-circuit being coupled to a power supply line; a compensation sub-circuit is respectively coupled to a scanning line, a control terminal of the driving sub-circuit, and a second terminal of the driving sub-circuit; a first terminal of the coupling sub-circuit being coupled to the control terminal of the driving sub-circuit; a first terminal of the storage sub-circuit being coupled to a second terminal of the coupling sub-circuit; a data writing-in sub-circuit is respectively coupled to a second terminal of the storage sub-circuit, a data line, and a reset line; a first reset sub-circuit is respectively coupled to the reset line, an initialization signal line, the control terminal of the driving sub-circuit, and the second terminal of the coupling sub-circuit.

Abstract: The present application provides a pixel driving circuit, a control method thereof, and a display device, which relates to the technical field of display. The pixel driving circuit is configured to drive a light emitting diode to emit light at different refresh rates, and includes: a first control module, a second control module, a compensation module, a refresh module, a first reset module, a first light emitting control module, a driving module, and a second light emitting control module. By holding potentials of a first node and a second node, the pixel driving circuit according to the present application may operate at different refresh rates, and the problem of insufficient Vth capture time is effectively solved.

Abstract: Provided is a flexible display substrate, including: a peripheral region and a display region. The peripheral region surrounds the display region. The peripheral region has a plurality of corner regions, and at least one of the corner regions includes two first regions and a second region disposed between the two first regions. The first region has a hollow structure, and the second region has at least one notch disposed in an edge of the flexible display substrate.

Abstract: The present application provides an apparatus and a method for ingot growth. The apparatus for ingot growth comprises a growth furnace, a crucible, a heater, a lifting mechanism, an infrared detector, a dividing disc, a sensor and a control device. The crucible is located within the growth furnace. The lifting mechanism comprises a lifting wire and a driving device, wherein the lifting wire connects to the top of the ingot via one terminal and to the driving device via another terminal. The bottom of the ingot puts inside the crucible, and the ingot has plural crystal lines thereon. The infrared detector is located outside the growth furnace. The dividing disc is above the growth furnace, connects to the lifting mechanism, and rotates with the ingot synchronously under the driving of the lifting mechanism, and an orthographic projection of bisector of the dividing disc is between two adjacent crystal lines. The sensor is located on the periphery of the dividing disc.

Abstract: The present application provides an apparatus and a method for ingot growth. The apparatus for ingot growth comprises a growth furnace, a crucible, a heater, a lifting mechanism, an infrared detector, a dividing disc, a sensor and a control device. The crucible is located within the growth furnace. The lifting mechanism comprises a lifting wire and a driving device, wherein the lifting wire connects to the top of the ingot via one terminal and to the driving device via another terminal. The bottom of the ingot puts inside the crucible, and the ingot has plural crystal lines thereon. The infrared detector is located outside the growth furnace. The dividing disc is above the growth furnace, connects to the lifting mechanism, and rotates with the ingot synchronously under the driving of the lifting mechanism, and an orthographic projection of bisector of the dividing disc is between two adjacent crystal lines. The sensor is located on the periphery of the dividing disc.