Abstract: A large-scale direct shear apparatus for direct shear test of multi-size cylindrical undisturbed soil samples, comprising an external framework, a sample shear box, a horizontal loading device, a vertical loading device, and a control system. The sample shear box is disposed within the external framework and includes an upper shear box, a lower shear box, and a base. The horizontal loading device includes a horizontal drive motor equipped with a load sensor, a horizontal mechanical loading mechanism, and an upper shear box connection structure. The horizontal drive motor is installed on one inner side of the external framework and contacts the lower shear box via the horizontal mechanical loading mechanism. The upper shear box connection structure is fixed to the other inner side of the external framework and contacts the upper shear box. The vertical loading device includes a vertical drive motor and a vertical mechanical loading mechanism.

Abstract: A large-scale direct shear apparatus for direct shear test of multi-size cylindrical undisturbed soil samples, comprising an external framework, a sample shear box, a horizontal loading device, a vertical loading device, and a control system. The sample shear box is disposed within the external framework and includes an upper shear box, a lower shear box, and a base. The horizontal loading device includes a horizontal drive motor equipped with a load sensor, a horizontal mechanical loading mechanism, and an upper shear box connection structure. The horizontal drive motor is installed on one inner side of the external framework and contacts the lower shear box via the horizontal mechanical loading mechanism. The upper shear box connection structure is fixed to the other inner side of the external framework and contacts the upper shear box. The vertical loading device includes a vertical drive motor and a vertical mechanical loading mechanism.

Abstract: An input device may include various sensor electrodes that detect positional information of an input object in a sensing region of the input device. The input device may include a first sensor electrode that detects a first change in a first variable capacitance in response to a deflection of a conductive layer by the input object. The input device may include a second sensor electrode that detects a second change in a second variable capacitance in response to the deflection of the conductive layer by the input object. The first change in the first variable capacitance and the second change in the second variable capacitance may determine an acquired force image of the input force. An adjusted force image may be determined from the acquired force image using the positional information.