Patents by Inventor Yaakov Davidi

Yaakov Davidi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for automatic probe card replacement
    Patent number: 12742797
    Abstract: A system and a method of automatically replacing a probe card used to test and inspect semiconductor devices are disclosed. The method for replacing a probe card in a test system includes using a probe card manipulator to move a used probe card from a measurement position to a replacement position, using a probe card exchanger to move the used probe card from the replacement position to a cassette, choosing a new probe card to replace the used probe card, using the probe card exchanger to move the new probe card from the cassette to the replacement position, using the probe card manipulator to engage the new probe card, and using the probe card manipulator to move the new probe card to the measurement position. The new probe card includes an array of flexible probes.
    Type: Grant
    Filed: November 14, 2025
    Date of Patent: September 22, 2026
    Assignee: InZiv Ltd.
    Inventors: Ori Dadoosh, Yuri Levinzon, Doobie Abraham, Yuval Yohai, Netanel Refaelovich, Matan Saydoff, Yaakov Davidi, Baoting Huang, Andrey Ignatov, David Colin Chase
  • Inspection of a substrate using multiple cameras
    Patent number: 11113803
    Abstract: Apparatus for inspection includes an imaging assembly, including a plurality of cameras, which are mounted in different, respective locations in the imaging assembly and are configured to capture respective images of a sample. A motion assembly is configured to move at least one of the imaging assembly and the sample so as to cause the imaging assembly to scan the sample with a scan accuracy that is limited by a predetermined position tolerance. An image processor is coupled to receive and process the images captured by the cameras so as to locate a defect in the sample with a position accuracy that is finer than the position tolerance.
    Type: Grant
    Filed: January 11, 2009
    Date of Patent: September 7, 2021
    Assignee: Orbotech Ltd.
    Inventors: Ofer Saphier, Israel Shappira, Yaakov Davidi
  • INSPECTION OF A SUBSTRATE USING MULTIPLE CAMERAS
    Publication number: 20100309308
    Abstract: Apparatus for inspection includes an imaging assembly, including a plurality of cameras, which are mounted in different, respective locations in the imaging assembly and are configured to capture respective images of a sample. A motion assembly is configured to move at least one of the imaging assembly and the sample so as to cause the imaging assembly to scan the sample with a scan accuracy that is limited by a predetermined position tolerance. An image processor is coupled to receive and process the images captured by the cameras so as to locate a defect in the sample with a position accuracy that is finer than the position tolerance.
    Type: Application
    Filed: January 11, 2009
    Publication date: December 9, 2010
    Applicant: Orbotech Ltd.
    Inventors: Ofer Saphier, Israel Shappira, Yaakov Davidi