Abstract: The present disclosure provides a pipelined analog-to-digital converter having input signal pre-comparison and charge redistribution, including: one-stage or multi-stage of pipelined structure unit, a first flash analog-to-digital converter, and an adjusting output unit. Each stage of the pipelined structure unit is used to quantify the input signal. The first flash analog-to-digital converter quantizes a residual signal output by a final pipelined structure unit, and outputs a corresponding quantized value. The adjusting output unit combines each of the quantized values according to a connection order of the multi-stage pipelined structure unit and a flash analog-to-digital conversion unit to output a complete quantization result.

Abstract: The present disclosure provides a pipelined analog-to-digital converter having input signal pre-comparison and charge redistribution, including: one-stage or multi-stage of pipelined structure unit, a first flash analog-to-digital converter, and an adjusting output unit. Each stage of the pipelined structure unit is used to quantify the input signal. The first flash analog-to-digital converter quantizes a residual signal output by a final pipelined structure unit, and outputs a corresponding quantized value. The adjusting output unit combines each of the quantized values according to a connection order of the multi-stage pipelined structure unit and a flash analog-to-digital conversion unit to output a complete quantization result.

Abstract: The present disclosure relates to the field of semiconductor integrated circuits, and to a method for calibrating a capacitor voltage coefficient of a high-precision successive approximation analog-to-digital converter (SAR ADC). The method includes: calibrating a voltage coefficient; obtaining a sampled charged charge according to a capacitance model with the voltage coefficient; according to an INL value obtained by testing, first verifying whether a maximum value of INL occurs in the place shown in Equation 3, then obtaining two very close second-order capacitor voltage coefficients according to Equation 4, and taking an average value thereof as a second-order capacitor voltage coefficient; and then calibrating the second-order capacitor voltage coefficient in a digital domain.

Abstract: The present disclosure relates to the field of semiconductor integrated circuits, and to a method for calibrating a capacitor voltage coefficient of a high-precision successive approximation analog-to-digital converter (SAR ADC). The method includes: calibrating a voltage coefficient; obtaining a sampled charged charge according to a capacitance model with the voltage coefficient; according to an INL value obtained by testing, first verifying whether a maximum value of INL occurs in the place shown in Equation 3, then obtaining two very close second-order capacitor voltage coefficients according to Equation 4, and taking an average value thereof as a second-order capacitor voltage coefficient; and then calibrating the second-order capacitor voltage coefficient in a digital domain.

Abstract: The specification discloses a computer-implemented method for user action determination, comprising: recognizing an item displacement action performed by a user; determining a first time and a first location of the item displacement action; recognizing a target item in a non-stationary state; determining a second time when the target item is in the non-stationary state and a second location where the target item is in the non-stationary state; and in response to determining that the first time matches the second time and the first location matches the second location, determining that the item displacement action of the user is performed with respect to the target item.