Patents by Inventor Yacov Malinovitch

Yacov Malinovitch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and a method for inspecting an object using a hybrid sensor
    Patent number: 9042635
    Abstract: A system, that includes a hybrid sensor that comprises: a monochromatic portion that is arranged to obtain a monochromatic image of a first area of an object; a multiple-color portion that is arranged to obtain a multi-colored image of a second area of the object; wherein the monochromatic portion comprises monochromatic sensing elements that sense radiation of a same frequency band; wherein the multiple-color portion comprises color sensing elements of different types, wherein different types of color sensing elements are associated with different frequency bands.
    Type: Grant
    Filed: October 13, 2013
    Date of Patent: May 26, 2015
    Assignee: CAMTEK LTD.
    Inventors: Yosi Cherbis, Yacov Malinovitch, Gilad Golan
  • SYSTEM AND A METHOD FOR INSEPCTING AN OBJECT USING A HYBRID SENSOR
    Publication number: 20140104410
    Abstract: A system, that includes a hybrid sensor that comprises: a monochromatic portion that is arranged to obtain a monochromatic image of a first area of an object; a multiple-color portion that is arranged to obtain a multi-colored image of a second area of the object; wherein the monochromatic portion comprises monochromatic sensing elements that sense radiation of a same frequency band; wherein the multiple-color portion comprises color sensing elements of different types, wherein different types of color sensing elements are associated with different frequency bands.
    Type: Application
    Filed: October 13, 2013
    Publication date: April 17, 2014
    Inventors: Yosi Cherbis, Yacov Malinovitch, Gilad Golan
  • METHOD AND SYSTEM FOR EVALUATING A HEIGHT OF STRUCTURES
    Publication number: 20110255097
    Abstract: A system and method for measuring a height difference between an extremum portion of a microscopic structure and a background element, the method includes detecting, by a sensor, first and second interference patterns by a sensor; wherein the first and second interference patterns are generated by illuminating an area of a sample by a first light beam and directing towards the sensor a first reference light beam of a first wavelength (w1) and light of the first wavelength (w1) that is either reflected from the area or passes through the area; wherein the second interference patterns are generated by illuminating the area of the sample by a second light beam and directing towards the sensor a second reference light beam of a second wavelength (w2) and light of the second wavelength (w2) that is either reflected from the area or passes through the area; wherein w1 differs from w2; wherein H<ws/2, wherein ws=(w1×w2)/?w1?w2?; generating, in response to the first and second interference patterns, first and seco
    Type: Application
    Filed: March 15, 2011
    Publication date: October 20, 2011
    Inventors: Gilad GOLAN, Yacov Malinovitch