Patents by Inventor Yael NAE

Yael NAE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11227414
    Abstract: A method includes processing projection data with a first reconstruction algorithm and reconstructing first reconstructed volumetric image data, wherein the first reconstructed volumetric image data has a first 3D noise function. The method further includes processing the same projection data with a second different reconstruction algorithm and reconstructing second reconstructed volumetric image data, wherein the second reconstructed volumetric image data has a second 3D noise function, which is different from the first 3D noise function. The method further includes visually presenting the first or the second reconstructed volumetric image data in a main viewport. The method further includes visually presenting a sub-portion the other of the first or the second reconstructed volumetric image data in a region of interest overlaid over a sub-portion of the main viewport.
    Type: Grant
    Filed: March 28, 2014
    Date of Patent: January 18, 2022
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Amar Dhanantwari, Mukta Joshi, Yael Nae
  • Patent number: 10706506
    Abstract: A method includes determining a low contrast detectability of a scan and generating an image quality index based on the determined low contrast detectability. Another method includes identifying an image quality index of interest, identifying an acquisition and/or reconstruction parameter based on the image quality index and a pre-determined mapping between image quality indexes and acquisition parameter and reconstruction parameters, and displaying the identified acquisition and/or the reconstruction parameter. A system (100) includes a metric determiner (122) that determines a first image quality index for a scan based on at least one of a low contrast detectability of the scan or a project domain noise of the scan, and/or a parameter recommender (126) that recommends at least one of an acquisition or a reconstruction parameter for a scan based on a second image quality index, and a display (114) that visually presents the first or second image quality index.
    Type: Grant
    Filed: April 3, 2014
    Date of Patent: July 7, 2020
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Amar Dhanantwari, Dhruv Mehta, Yael Nae
  • Publication number: 20160048982
    Abstract: A method includes processing projection data with a first reconstruction algorithm and reconstructing first reconstructed volumetric image data, wherein the first reconstructed volumetric image data has a first 3D noise function. The method further includes processing the same projection data with a second different reconstruction algorithm and reconstructing second reconstructed volumetric image data, wherein the second reconstructed volumetric image data has a second 3D noise function, which is different from the first3Dnoise function. The method further includes visually presenting the first or the second reconstructed volumetric image data in a main viewport. The method further includes visually presenting a sub-portion the other of the first or the second reconstructed volumetric image data in a region of interest overlaid over a sub-portion of the main viewport.
    Type: Application
    Filed: March 28, 2014
    Publication date: February 18, 2016
    Inventors: Amar DHANANTWARI, Mukta JOSHI, Yael NAE
  • Publication number: 20160042499
    Abstract: A method includes determining a low contrast detectability of a scan and generating an image quality index based on the determined low contrast detectability. Another method includes identifying an image quality index of interest, identifying an acquisition and/or reconstruction parameter based on the image quality index and a pre-determined mapping between image quality indexes and acquisition parameter and reconstruction parameters, and displaying the identified acquisition and/or the reconstruction parameter. A system (100) includes a metric determiner (122) that determines a first image quality index for a scan based on at least one of a low contrast detectability of the scan or a project domain noise of the scan, and/or a parameter recommender (126) that recommends at least one of an acquisition or a reconstruction parameter for a scan based on a second image quality index, and a display (114) that visually presents the first or second image quality index.
    Type: Application
    Filed: April 3, 2014
    Publication date: February 11, 2016
    Applicant: KONINKLIJKE PHILIPS N.V.
    Inventors: Amar DHANANTWARI, Dhruv MEHTA, Yael NAE