Patents by Inventor Yair Grof

Yair Grof has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11867645
    Abstract: In one embodiment, a system and a method for inspecting a substance to detect and identify predetermined foreign element(s) in the substance. The foreign element may carry X-ray responding material compositions, emitting X-ray signals in response to primary exciting X-ray or Gamma-ray radiation. The inspection is performed during a relative displacement between the substance and an inspection zone, defined by an overlap region between a solid angle of emission of an X-ray/Gamma-ray source and a solid angle of detection of X-ray radiation, along a movement path, as the substance moves along the movement path, the detected X-ray radiation includes X-ray response signals from successive portions of the substance propagating towards, through, and out of the overlap region. Measured data indicative of X-ray response signals is analyzed to identify a signal variation pattern over time indicative of a location of at least one foreign element carrying an X-ray responsive marker.
    Type: Grant
    Filed: October 18, 2019
    Date of Patent: January 9, 2024
    Inventors: Yair Grof, Dmitrijs Docenko, Mor Kaplinsky, Haggai Alon, Yifat Bareket, Michal Firstenberg, Avital Trachtman, Nachum Holin, Nadav Yoran
  • Publication number: 20220388329
    Abstract: The present invention provides an anti-counterfeit marking technique for verifying authenticity of objects using x-rays fluorescence (XRF) analysis.
    Type: Application
    Filed: August 12, 2022
    Publication date: December 8, 2022
    Inventors: Yair GROF, Tzemah KISLEV, Nadav YORAN, Yaara BONDY, Haggai ALON
  • Patent number: 11508195
    Abstract: The present invention relates to an access control system, an access object and a method for access control. The access control system comprises an access request receiving device being configured and operable for receiving an access object; the access request receiving device comprising an emitter configured and operable for irradiating the access object with a radiation having a wavelength in the range of about 10?12 and 10?9 m and a detector configured and operable for detecting a response signal from the irradiated access object; a control circuit being configured and operable to receive the response signal from the access request receiving device and process the response signal to identify spectral features indicative of an XRF signature of the access object; wherein the control circuit is adapted to generate an unlocking signal for switching a module device between a locked state and an unlocked state upon identification of the XRF signature.
    Type: Grant
    Filed: March 21, 2017
    Date of Patent: November 22, 2022
    Assignees: Soreq Nuclear Research Center, Security Matters Ltd.
    Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Haggai Alon
  • Publication number: 20220312711
    Abstract: The invention concerns compositions and methods for authenticating an agricultural product.
    Type: Application
    Filed: September 2, 2020
    Publication date: October 6, 2022
    Inventors: Yair GROF, Nataly TAL, Mor KAPLINSKY, Ron DAFNI, Yifat BAREKET, Michal FIRSTENBERG, Tehila NAHUM, Hagit SADE, Nadav YORAN, Haggai ALON
  • Publication number: 20220317069
    Abstract: A method and system are provided for model-based analysis of samples of interest and management of sample classification. Predetermined modeled data is provided including data indicative of K models for respective K measurement schemes based on a predetermined function having a spectral line shape, data indicative of M characteristic vectors of M predetermined group to which different samples relate, and data indicative of a common vector of weights for the M groups. A data processor utilizes the data and operates to apply model-based processing to measured spectral data of a sample of interest using the predetermined modeled data, and generate classification data indicative of relation of the specific sample of interest to one of the M predetermined groups.
    Type: Application
    Filed: April 5, 2020
    Publication date: October 6, 2022
    Applicant: SECURITY MATTERS LTD.
    Inventors: Yair GROF, Dmitrijs DOCENKO, Mirit KAGARLITSKY, Nataly TAL, Nadav YORAN, Haggai ALON
  • Patent number: 11446951
    Abstract: Provided is an anti-counterfeit marking technique for verifying authenticity of objects using x-ray fluorescence (XRF) analysis.
    Type: Grant
    Filed: February 2, 2017
    Date of Patent: September 20, 2022
    Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.
    Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Yaara Bondy, Haggai Alon
  • Publication number: 20220163456
    Abstract: Method and systems are presented for authentication of precious stones, according to their natural ID and/or predetermined markings created in the stones, based on unique characteristic radiation response of the stone to predetermined primary radiation.
    Type: Application
    Filed: February 8, 2022
    Publication date: May 26, 2022
    Inventors: Yair GROF, Tzemah KISLEV, Nadav YORAN, Haggai ALON, Mor KAPLINSKY
  • Patent number: 11320384
    Abstract: Method and systems are presented for authentication of precious stones, according to their natural ID and/or predetermined markings created in the stones, based on unique characteristic radiation response of the stone to predetermined primary radiation.
    Type: Grant
    Filed: August 29, 2017
    Date of Patent: May 3, 2022
    Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD., YAHIOMA TECHNOLOGIES INC.
    Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Haggai Alon, Mor Kaplinsky
  • Patent number: 11193007
    Abstract: The invention provides formulations and masterbatches of a polymeric material and XRF-identifiable markers, for producing transparent elements including a polymer and at least one XRF-identifiable marker for a variety of industrial uses.
    Type: Grant
    Filed: October 1, 2017
    Date of Patent: December 7, 2021
    Assignees: Security Matters Ltd., SOREQ NUCLEAR RESEARCH CENTER
    Inventors: Nadav Yoran, Tzemah Kislev, Yair Grof, Haggai Alon, Mor Kaplinsky
  • Publication number: 20210321649
    Abstract: Provided is a method for marking a product for human or animal use with an XRF identifiable mark, the method including forming on at least a region of the product a pattern of at least one FDA-grade material identifiable by XRF, the pattern being optionally at least partially invisible to the naked human eye and having a predefined identifiable characteristic, wherein the product is selected from food products, therapeutics and cosmetics.
    Type: Application
    Filed: September 25, 2017
    Publication date: October 21, 2021
    Applicants: SECURITY MATTERS LTD., SOREQ NUCLEAR RESEARCH CENTER
    Inventors: Nadav YORAN, Tzemah KISLEV, Yair GROF, Haggai ALON, Mor KAPLINSKY
  • Publication number: 20210325323
    Abstract: In one embodiment, a system and method for inspecting a substance to detect and identify predetermined foreign element(s) in the substance. The foreign element may carry X-ray responding material compositions, emitting X-ray signals in response to primary exciting X-ray or Gamma-ray radiation. The inspection is performed during a relative displacement between the substance and an inspection zone, defined by an overlap region between a solid angle of emission of an X-ray/Gamma-ray source and a solid angle of detection of X-ray radiation, along a predetermined movement path, as the substance moves along said path, the detected X-ray radiation includes X-ray response signals from successive portions of the substance propagating towards, through, and out of said overlap region. Measured data indicative of X-ray response signals is analyzed to identify a signal variation pattern over time indicative of a location of at least one foreign element carrying an X-ray responsive marker.
    Type: Application
    Filed: October 18, 2019
    Publication date: October 21, 2021
    Inventors: Yair Grof, Dmitrijs Docenko, Mor Kaplinsky, Haggai Alon, Yifat Bareket, Michal Firstenberg, Avital Trachtman, Nachum Holin, Nadav Yoran
  • Patent number: 11112372
    Abstract: A control system and method are presented for controlling operation of an X-ray Fluorescent (XRF) system for detecting at least one material carried by a sample, for example at least one marker carried by the sample. The control system comprises: data input utility for receiving input data comprising material/marker related data about said at least one material/marker; and data processor and analyzer utility. The data processor and analyzer utility is configured and operable for analyzing the input data and determining optimal geometrical characteristics of the XRF system for optimizing operational conditions of said XRF system to maximize amount of primary X-ray radiation that reaches a predetermined region of the sample and is absorbed by a volume of said region and to maximize a portion of secondary radiation emitted from said region that reaches a detector of the XRF system; and for generating operational data to the XRF system enabling adjustment of the geometrical characteristics of the XRF system.
    Type: Grant
    Filed: September 17, 2017
    Date of Patent: September 7, 2021
    Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.
    Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Haggai Alon, Mor Kaplinsky
  • Publication number: 20210178802
    Abstract: The present invention provides an anti-counterfeit marking technique for verifying authenticity of objects using x-ray fluorescence (XRF) analysis.
    Type: Application
    Filed: February 2, 2017
    Publication date: June 17, 2021
    Applicants: SECURITY MATTERS LTD., SOREQ NUCLEAR RESEARCH CENTER
    Inventors: Yair GROF, Tzemah KISLEV, Nadav YORAN, Yaara BONDY, Haggai ALON
  • Patent number: 10967404
    Abstract: The present invention discloses a novel XRF analyzer capable of simultaneously identifying the presence of a marking composition in a plurality of objects by modulating/varying the intensity of the excitation beam on the different objects and measuring the secondary radiation thereof.
    Type: Grant
    Filed: June 21, 2017
    Date of Patent: April 6, 2021
    Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.
    Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Haggai Alon, Mor Kaplinsky
  • Patent number: 10969351
    Abstract: In a method and a system for authenticating an object marked with XRF marking, a wavelength spectral profile is provided of a detected portion of an X-Ray signal arriving from an object in response to X-Ray or Gamma-Ray radiation applied to the object and the wavelength spectral profile is filtered to suppress trend and periodic components from the wavelength spectral profile to obtain a filtered profile with improved signal to noise or signal to clutter ratio. The object can be authenticated by processing the filtered profile and identifying one or more peaks therein, which satisfy a predetermined condition, whereby the wavelengths of the identified peaks are indicative of the signatures of materials included in the object.
    Type: Grant
    Filed: December 10, 2019
    Date of Patent: April 6, 2021
    Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.
    Inventor: Yair Grof
  • Publication number: 20210048399
    Abstract: A control system and method are presented for controlling operation of an X-ray Fluorescent (XRF) system for detecting at least one material carried by a sample, for example at least one marker carried by the sample. The control system comprises: data input utility for receiving input data comprising material/marker related data about said at least one material/marker; and data processor and analyzer utility. The data processor and analyzer utility is configured and operable for analyzing the input data and determining optimal geometrical characteristics of the XRF system for optimizing operational conditions of said XRF system to maximize amount of primary X-ray radiation that reaches a predetermined region of the sample and is absorbed by a volume of said region and to maximize a portion of secondary radiation emitted from said region that reaches a detector of the XRF system; and for generating operational data to the XRF system enabling adjustment of the geometrical characteristics of the XRF system.
    Type: Application
    Filed: September 17, 2017
    Publication date: February 18, 2021
    Inventors: Yair GROF, Tzemah KISLEV, Nadav YORAN, Haggai ALON, Mor KAPLINSKY
  • Publication number: 20200242865
    Abstract: The present invention relates to an access control system, an access object and a method for access control. The access control system comprises an access request receiving device being configured and operable for receiving an access object; the access request receiving device comprising an emitter configured and operable for irradiating the access object with a radiation having a wavelength in the range of about 10?12 and 10?9 m and a detector configured and operable for detecting a response signal from the irradiated access object; a control circuit being configured and operable to receive the response signal from the access request receiving device and process the response signal to identify spectral features indicative of an XRF signature of the access object; wherein the control circuit is adapted to generate an unlocking signal for switching a module device between a locked state and an unlocked state upon identification of the XRF signature.
    Type: Application
    Filed: March 21, 2017
    Publication date: July 30, 2020
    Inventors: Yair GROF, Tzemah KISLEV, Nadav YORAN, Haggai ALON
  • Publication number: 20200116656
    Abstract: In a method and a system for authenticating an object marked with XRF marking, a wavelength spectral profile is provided of a detected portion of an X-Ray signal arriving from an object in response to X-Ray or Gamma-Ray radiation applied to the object and the wavelength spectral profile is filtered to suppress trend and periodic components from the wavelength spectral profile to obtain a filtered profile with improved signal to noise or signal to clutter ratio. The object can be authenticated by processing the filtered profile and identifying one or more peaks therein, which satisfy a predetermined condition, whereby the wavelengths of the identified peaks are indicative of the signatures of materials included in the object.
    Type: Application
    Filed: December 10, 2019
    Publication date: April 16, 2020
    Inventor: Yair GROF
  • Patent number: 10607049
    Abstract: Methods and systems for verifying compatibility of components of an electronic system are disclosed. The method includes irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and in response thereto, detecting one or more XRF response signals indicative of first and second XRF signatures, emitted from the first and second components. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures. Electronic systems are also disclosed including at least a first and a second electronic components respectively having the first and second XRF marking compositions that enable verification of compatibility of the components.
    Type: Grant
    Filed: April 4, 2017
    Date of Patent: March 31, 2020
    Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.
    Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Haggai Alon
  • Patent number: 10539521
    Abstract: In a method and a system for authenticating an object marked with XRF marking, a wavelength spectral profile is provided of a detected portion of an X-Ray signal arriving from an object in response to X-Ray or Gamma-Ray radiation applied to the object and the wavelength spectral profile is filtered to suppress trend and periodic components from the wavelength spectral profile to obtain a filtered profile with improved signal to noise or signal to clutter ratio. The object can be authenticated by processing the filtered profile and identifying one or more peaks therein, which satisfy a predetermined condition, whereby the wavelengths of the identified peaks are indicative of the signatures of materials included in the object.
    Type: Grant
    Filed: March 31, 2016
    Date of Patent: January 21, 2020
    Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.
    Inventor: Yair Grof