Patents by Inventor Yair Hanani

Yair Hanani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System, a method and a computer program product for patch-based defect detection
    Patent number: 9235885
    Abstract: A system capable of inspecting an article for defects, the system including: a patch comparator, configured to determine with respect to each of a plurality of reference patches in a reference image a similarity level, based on a predefined patch-similarity criterion and on a source patch defined in the reference image; an evaluation module, configured to rate each inspected pixel out of multiple inspected pixels of the inspection image with a representative score which is based on the similarity level of a reference patch associated with a reference pixel corresponding to the inspected pixel; a selection module, configured to select multiple selected inspected pixels based on the representative scores of the multiple inspected pixels; and a defect detection module, configured to determine a presence of a defect in the candidate pixel based on an inspected value of the candidate pixel and inspected values of the selected inspected pixels.
    Type: Grant
    Filed: January 31, 2013
    Date of Patent: January 12, 2016
    Assignee: Applied Materials Israel Ltd
    Inventors: Moshe Amzaleg, Nir Ben David Dodzin, Vered Gatt, Yair Hanani, Efrat Rozenman
  • SYSTEM, A METHOD AND A COMPUTER PROGRAM PRODUCT FOR PATCH-BASED DEFECT DETECTION
    Publication number: 20140212021
    Abstract: A system capable of inspecting an article for defects, the system including: a patch comparator, configured to determine with respect to each of a plurality of reference patches in a reference image a similarity level, based on a predefined patch-similarity criterion and on a source patch defined in the reference image; an evaluation module, configured to rate each inspected pixel out of multiple inspected pixels of the inspection image with a representative score which is based on the similarity level of a reference patch associated with a reference pixel corresponding to the inspected pixel; a selection module, configured to select multiple selected inspected pixels based on the representative scores of the multiple inspected pixels; and a defect detection module, configured to determine a presence of a defect in the candidate pixel based on an inspected value of the candidate pixel and inspected values of the selected inspected pixels.
    Type: Application
    Filed: January 31, 2013
    Publication date: July 31, 2014
    Applicant: Applied Materials Israel Ltd.
    Inventors: Moshe Amzaleg, Nir Ben-David, Vered Gatt, Yair Hanani, Efrat Rozenman