Patents by Inventor Yan BONDAR

Yan BONDAR has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10161762
    Abstract: A method for computing a correction factor (KF) for an angular measuring system (10) comprising a measurement of a first output value (W1) in a first measuring position (20) and a measurement of a second output value (W2) in a second measuring position (30). An actual value (DI) is formed from the difference between the first output value (W1) and the second output value (W2), and a target value (DS) is formed from the difference of target values (S1, S2) in the first measuring position (20) and in the second measuring position (30). The correction factor (KF) is computed from the ratio of the target value (DS) to the actual value (DI).
    Type: Grant
    Filed: September 15, 2015
    Date of Patent: December 25, 2018
    Assignee: TDK-Micronas GmbH
    Inventor: Yan Bondar
  • Patent number: 10119840
    Abstract: A measuring system and drive system with a measuring system, a magnet, a transmitter, and a magnetic field sensor. The magnetic field sensor is arranged between the magnet and the transmitter. The transmitter has a number of segments made of a magnetically conductive material, each segment having a wing shape with a web edge that is radially directed outwards, each web edge being diagonally designed towards the rotational direction, and that each web edge is distanced from the magnetic field sensor by an air gap.
    Type: Grant
    Filed: July 28, 2015
    Date of Patent: November 6, 2018
    Assignee: TDK-Micronas GmbH
    Inventors: Yan Bondar, Stefan Albrecht
  • Publication number: 20180283900
    Abstract: A measuring system for determining an angle of rotation of a shaft, which is rotatable about an axis of rotation, having a magnetically conductive encoder, which is spaced from the axis of rotation and fixedly connected to the shaft, a magnet unit with a permanent magnet, and an intermediate sensor unit having two magnetic field sensors. The permanent magnet has a magnetization extending parallel to the axis of rotation, and a circular-cylindrical recess having a bottom, an axis of symmetry extending perpendicular to the bottom, and a diameter, the sensor unit being completely arranged within the recess and stationary with respect to the permanent magnet. The first distance of the encoder from the axis of rotation being less than half the diameter of the recess, the encoder being arranged in a direction parallel to the axis of rotation at a second distance from the sensor unit.
    Type: Application
    Filed: March 30, 2018
    Publication date: October 4, 2018
    Applicant: TDK-Micronas GmbH
    Inventor: Yan BONDAR
  • Patent number: 10072944
    Abstract: The invention relates to a device (1) for measurement of an angle of an axis of rotation (10), comprising a magnet (12) with a magnet surface (14), which is pivotally assembled at the axis of rotation (10), and further comprising a sensor (16) for recognition of external magnetic flux lines of the magnet (12). According to the invention, the magnet (12) comprises at least a first magnet section (20) with a magnetic first orientation (22) and the magnet (12) further at least comprises a second magnet section (24) with a second magnetic orientation (26), wherein the first magnetic orientation (22) is displaced from the second magnetic orientation (26), whereby the magnet surface (14) comprises a different concentration of external magnetic flux lines.
    Type: Grant
    Filed: December 23, 2014
    Date of Patent: September 11, 2018
    Assignee: TDK-Micronas GmbH
    Inventors: Tobias Klocke, Yan Bondar
  • Patent number: 9810553
    Abstract: A measurement system having a first magnetic field sensor and having a magnet for generating a magnetic field, in which the magnet has a first pole face and a second pole face, wherein an axis of rotation is defined perpendicular to the first pole face and perpendicular to the second pole face, wherein the magnet is supported for rotation about the axis of rotation, in which the first magnetic field sensor is positioned facing the first pole face and at a distance from the axis of rotation, in which the magnet has a rotational asymmetry of the flux density in the region of the first pole face, wherein the flux density of the magnet in the first magnetic field sensor can be adjusted between a maximum and a minimum by rotation of the magnet about the axis of rotation.
    Type: Grant
    Filed: December 15, 2014
    Date of Patent: November 7, 2017
    Assignee: TDK-Micronas GmbH
    Inventor: Yan Bondar
  • Patent number: 9322637
    Abstract: A measuring system is provided that includes a magnetic field sensor array, an evaluation circuit for evaluating measurement signals of the magnetic field sensor array, and a rotatable encoder that has a mass element to change a magnetic field vector in the magnetic field sensor array. The encoder has a spring element in which the mass element is attached to the spring element. The encoder has a linear guide, and the mass element is guided in a radial direction in the linear guide such that during a rotation of the encoder the mass element can be moved by centrifugal force and the centrifugal force works against the spring force of the spring element. The magnetic field sensor array is arranged toward the encoder to measure a change, caused by the movement of the mass element, in the magnetic field vector.
    Type: Grant
    Filed: January 9, 2014
    Date of Patent: April 26, 2016
    Assignee: Micronas GmbH
    Inventor: Yan Bondar
  • Publication number: 20160091340
    Abstract: A method for computing a correction factor (KF) for an angular measuring system (10) comprising a measurement of a first output value (W1) in a first measuring position (20) and a measurement of a second output value (W2) in a second measuring position (30). An actual value (DI) is formed from the difference between the first output value (W1) and the second output value (W2), and a target value (DS) is formed from the difference of target values (S1, S2) in the first measuring position (20) and in the second measuring position (30). The correction factor (KF) is computed from the ratio of the target value (DS) to the actual value (DI).
    Type: Application
    Filed: September 15, 2015
    Publication date: March 31, 2016
    Inventor: Yan Bondar
  • Publication number: 20160025521
    Abstract: A measuring system and drive system with a measuring system, a magnet, a transmitter, and a magnetic field sensor. The magnetic field sensor is arranged between the magnet and the transmitter. The transmitter has a number of segments made of a magnetically conductive material, each segment having a wing shape with a web edge that is radially directed outwards, each web edge being diagonally designed towards the rotational direction, and that each web edge is distanced from the magnetic field sensor by an air gap.
    Type: Application
    Filed: July 28, 2015
    Publication date: January 28, 2016
    Applicant: MICRONAS GMBH
    Inventors: Yan BONDAR, Stefan ALBRECHT
  • Patent number: 9093237
    Abstract: A control device is provided that includes a plate and a control unit. The control unit has a rotary unit designed as a transmitter unit and a receiver unit. The transmitter unit has a top surface and a bottom side, wherein a base is formed on the bottom side in a center region and a first magnetizable element or a first magnet for positioning the transmitter unit at a predefined position over the receiver unit is arranged in the center region. In a rest position the transmitter unit rests with the base on the plate and the axis of rotation extends essentially parallel to the normal of the plate, or the transmitter unit is tilted into an operating position such that the base rests only partially on the plate and the axis of rotation is tilted relative to the normal of the plate.
    Type: Grant
    Filed: February 4, 2013
    Date of Patent: July 28, 2015
    Assignee: Micronas GmbH
    Inventor: Yan Bondar
  • Publication number: 20150177023
    Abstract: The invention relates to a device (1) for measurement of an angle of an axis of rotation (10), comprising a magnet (12) with a magnet surface (14), which is pivotally assembled at the axis of rotation (10), and further comprising a sensor (16) for recognition of external magnetic flux lines of the magnet (12). According to the invention, the magnet (12) comprises at least a first magnet section (20) with a magnetic first orientation (22) and the magnet (12) further at least comprises a second magnet section (24) with a second magnetic orientation (26), wherein the first magnetic orientation (22) is displaced from the second magnetic orientation (26), whereby the magnet surface (14) comprises a different concentration of external magnetic flux lines.
    Type: Application
    Filed: December 23, 2014
    Publication date: June 25, 2015
    Inventors: Tobias Klocke, Yan Bondar
  • Publication number: 20150168124
    Abstract: A measurement system having a first magnetic field sensor and having a magnet for generating a magnetic field, in which the magnet has a first pole face and a second pole face, wherein an axis of rotation is defined perpendicular to the first pole face and perpendicular to the second pole face, wherein the magnet is supported for rotation about the axis of rotation, in which the first magnetic field sensor is positioned facing the first pole face and at a distance from the axis of rotation, in which the magnet has a rotational asymmetry of the flux density in the region of the first pole face, wherein the flux density of the magnet in the first magnetic field sensor can be adjusted between a maximum and a minimum by rotation of the magnet about the axis of rotation.
    Type: Application
    Filed: December 15, 2014
    Publication date: June 18, 2015
    Inventor: Yan BONDAR
  • Publication number: 20140191749
    Abstract: A measuring system is provided that includes a magnetic field sensor array, an evaluation circuit for evaluating measurement signals of the magnetic field sensor array, and a rotatable encoder that has a mass element to change a magnetic field vector in the magnetic field sensor array. The encoder has a spring element in which the mass element is attached to the spring element. The encoder has a linear guide, and the mass element is guided in a radial direction in the linear guide such that during a rotation of the encoder the mass element can be moved by centrifugal force and the centrifugal force works against the spring force of the spring element. The magnetic field sensor array is arranged toward the encoder to measure a change, caused by the movement of the mass element, in the magnetic field vector.
    Type: Application
    Filed: January 9, 2014
    Publication date: July 10, 2014
    Applicant: Micronas GmbH
    Inventor: Yan BONDAR