Patents by Inventor Yan BONDAR
Yan BONDAR has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11604081Abstract: An integrated rotation angle determining sensor unit in a measuring system for determining a rotation angle, comprising a shaft, rotatable around a rotation axis, having a transducer, a first semiconductor layer designed as a die being provided, which has an upper side arranged perpendicularly to the rotation axis and an underside and a first Hall sensor system monolithically formed in the first semiconductor layer, and a second semiconductor layer designed as a die being provided, which has an upper side arranged perpendicularly to the rotation axis and an underside and a second Hall sensor system monolithically formed in the second semiconductor layer, each Hall sensor system including at least one first Hall sensor and a second Hall sensor and a third Hall sensor.Type: GrantFiled: August 31, 2020Date of Patent: March 14, 2023Assignee: TDK-Micronas GmbHInventors: Yan Bondar, Marcus Christian Meyer, Hans Christian Paul Dittmann
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Patent number: 11486733Abstract: An integrated rotation-angle sensor unit in a measuring system for rotation angle determination, with a shaft that is rotatable about an axis of rotation with a transmitter, The sensor unit has a semiconductor layer with a top surface that can be arranged perpendicular to the axis of rotation and has a bottom surface, and two monolithic Hall sensor systems are implemented in the semiconductor layer. Each Hall sensor system has at least a first Hall sensor, a second Hall sensor, and a third Hall sensor, and the three Hall sensors of the first Hall sensor system are arranged on a first circle that is parallel to the top surface of the semiconductor layer and can be arranged concentrically around the axis of rotation.Type: GrantFiled: August 24, 2020Date of Patent: November 1, 2022Assignee: TDK-Micronas GmbHInventors: Yan Bondar, Marcus Christian Meyer, Hans Christian Paul Dittmann
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Publication number: 20210063204Abstract: An integrated rotation angle determining sensor unit in a measuring system for determining a rotation angle, comprising a shaft, rotatable around a rotation axis, having a transducer, a first semiconductor layer designed as a die being provided, which has an upper side arranged perpendicularly to the rotation axis and an underside and a first Hall sensor system monolithically formed in the first semiconductor layer, and a second semiconductor layer designed as a die being provided, which has an upper side arranged perpendicularly to the rotation axis and an underside and a second Hall sensor system monolithically formed in the second semiconductor layer, each Hall sensor system including at least one first Hall sensor and a second Hall sensor and a third Hall sensor.Type: ApplicationFiled: August 31, 2020Publication date: March 4, 2021Applicant: TDK-Micronas GmbHInventors: Yan BONDAR, Marcus Christian MEYER, Hans Christian Paul DITTMANN
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Publication number: 20210055132Abstract: An integrated rotation-angle sensor unit in a measuring system for rotation angle determination, with a shaft that is rotatable about an axis of rotation with a transmitter, The sensor unit has a semiconductor layer with a top surface that can be arranged perpendicular to the axis of rotation and has a bottom surface, and two monolithic Hall sensor systems are implemented in the semiconductor layer. Each Hall sensor system has at least a first Hall sensor, a second Hall sensor, and a third Hall sensor, and the three Hall sensors of the first Hall sensor system are arranged on a first circle that is parallel to the top surface of the semiconductor layer and can be arranged concentrically around the axis of rotation.Type: ApplicationFiled: August 24, 2020Publication date: February 25, 2021Applicant: TDK-Micronas GmbHInventors: Yan BONDAR, Marcus Christian MEYER, Hans Christian Paul DITTMANN
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Patent number: 10564003Abstract: A measuring system for determining an angle of rotation of a shaft, which is rotatable about an axis of rotation, having a magnetically conductive encoder, which is spaced from the axis of rotation and fixedly connected to the shaft, a magnet unit with a permanent magnet, and an intermediate sensor unit having two magnetic field sensors. The permanent magnet has a magnetization extending parallel to the axis of rotation, and a circular-cylindrical recess having a bottom, an axis of symmetry extending perpendicular to the bottom, and a diameter, the sensor unit being completely arranged within the recess and stationary with respect to the permanent magnet. The first distance of the encoder from the axis of rotation being less than half the diameter of the recess, the encoder being arranged in a direction parallel to the axis of rotation at a second distance from the sensor unit.Type: GrantFiled: March 30, 2018Date of Patent: February 18, 2020Assignee: TDK-Micronas GmbHInventor: Yan Bondar
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Patent number: 10161762Abstract: A method for computing a correction factor (KF) for an angular measuring system (10) comprising a measurement of a first output value (W1) in a first measuring position (20) and a measurement of a second output value (W2) in a second measuring position (30). An actual value (DI) is formed from the difference between the first output value (W1) and the second output value (W2), and a target value (DS) is formed from the difference of target values (S1, S2) in the first measuring position (20) and in the second measuring position (30). The correction factor (KF) is computed from the ratio of the target value (DS) to the actual value (DI).Type: GrantFiled: September 15, 2015Date of Patent: December 25, 2018Assignee: TDK-Micronas GmbHInventor: Yan Bondar
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Patent number: 10119840Abstract: A measuring system and drive system with a measuring system, a magnet, a transmitter, and a magnetic field sensor. The magnetic field sensor is arranged between the magnet and the transmitter. The transmitter has a number of segments made of a magnetically conductive material, each segment having a wing shape with a web edge that is radially directed outwards, each web edge being diagonally designed towards the rotational direction, and that each web edge is distanced from the magnetic field sensor by an air gap.Type: GrantFiled: July 28, 2015Date of Patent: November 6, 2018Assignee: TDK-Micronas GmbHInventors: Yan Bondar, Stefan Albrecht
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Publication number: 20180283900Abstract: A measuring system for determining an angle of rotation of a shaft, which is rotatable about an axis of rotation, having a magnetically conductive encoder, which is spaced from the axis of rotation and fixedly connected to the shaft, a magnet unit with a permanent magnet, and an intermediate sensor unit having two magnetic field sensors. The permanent magnet has a magnetization extending parallel to the axis of rotation, and a circular-cylindrical recess having a bottom, an axis of symmetry extending perpendicular to the bottom, and a diameter, the sensor unit being completely arranged within the recess and stationary with respect to the permanent magnet. The first distance of the encoder from the axis of rotation being less than half the diameter of the recess, the encoder being arranged in a direction parallel to the axis of rotation at a second distance from the sensor unit.Type: ApplicationFiled: March 30, 2018Publication date: October 4, 2018Applicant: TDK-Micronas GmbHInventor: Yan BONDAR
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Patent number: 10072944Abstract: The invention relates to a device (1) for measurement of an angle of an axis of rotation (10), comprising a magnet (12) with a magnet surface (14), which is pivotally assembled at the axis of rotation (10), and further comprising a sensor (16) for recognition of external magnetic flux lines of the magnet (12). According to the invention, the magnet (12) comprises at least a first magnet section (20) with a magnetic first orientation (22) and the magnet (12) further at least comprises a second magnet section (24) with a second magnetic orientation (26), wherein the first magnetic orientation (22) is displaced from the second magnetic orientation (26), whereby the magnet surface (14) comprises a different concentration of external magnetic flux lines.Type: GrantFiled: December 23, 2014Date of Patent: September 11, 2018Assignee: TDK-Micronas GmbHInventors: Tobias Klocke, Yan Bondar
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Patent number: 9810553Abstract: A measurement system having a first magnetic field sensor and having a magnet for generating a magnetic field, in which the magnet has a first pole face and a second pole face, wherein an axis of rotation is defined perpendicular to the first pole face and perpendicular to the second pole face, wherein the magnet is supported for rotation about the axis of rotation, in which the first magnetic field sensor is positioned facing the first pole face and at a distance from the axis of rotation, in which the magnet has a rotational asymmetry of the flux density in the region of the first pole face, wherein the flux density of the magnet in the first magnetic field sensor can be adjusted between a maximum and a minimum by rotation of the magnet about the axis of rotation.Type: GrantFiled: December 15, 2014Date of Patent: November 7, 2017Assignee: TDK-Micronas GmbHInventor: Yan Bondar
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Patent number: 9322637Abstract: A measuring system is provided that includes a magnetic field sensor array, an evaluation circuit for evaluating measurement signals of the magnetic field sensor array, and a rotatable encoder that has a mass element to change a magnetic field vector in the magnetic field sensor array. The encoder has a spring element in which the mass element is attached to the spring element. The encoder has a linear guide, and the mass element is guided in a radial direction in the linear guide such that during a rotation of the encoder the mass element can be moved by centrifugal force and the centrifugal force works against the spring force of the spring element. The magnetic field sensor array is arranged toward the encoder to measure a change, caused by the movement of the mass element, in the magnetic field vector.Type: GrantFiled: January 9, 2014Date of Patent: April 26, 2016Assignee: Micronas GmbHInventor: Yan Bondar
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Publication number: 20160091340Abstract: A method for computing a correction factor (KF) for an angular measuring system (10) comprising a measurement of a first output value (W1) in a first measuring position (20) and a measurement of a second output value (W2) in a second measuring position (30). An actual value (DI) is formed from the difference between the first output value (W1) and the second output value (W2), and a target value (DS) is formed from the difference of target values (S1, S2) in the first measuring position (20) and in the second measuring position (30). The correction factor (KF) is computed from the ratio of the target value (DS) to the actual value (DI).Type: ApplicationFiled: September 15, 2015Publication date: March 31, 2016Inventor: Yan Bondar
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Publication number: 20160025521Abstract: A measuring system and drive system with a measuring system, a magnet, a transmitter, and a magnetic field sensor. The magnetic field sensor is arranged between the magnet and the transmitter. The transmitter has a number of segments made of a magnetically conductive material, each segment having a wing shape with a web edge that is radially directed outwards, each web edge being diagonally designed towards the rotational direction, and that each web edge is distanced from the magnetic field sensor by an air gap.Type: ApplicationFiled: July 28, 2015Publication date: January 28, 2016Applicant: MICRONAS GMBHInventors: Yan BONDAR, Stefan ALBRECHT
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Patent number: 9093237Abstract: A control device is provided that includes a plate and a control unit. The control unit has a rotary unit designed as a transmitter unit and a receiver unit. The transmitter unit has a top surface and a bottom side, wherein a base is formed on the bottom side in a center region and a first magnetizable element or a first magnet for positioning the transmitter unit at a predefined position over the receiver unit is arranged in the center region. In a rest position the transmitter unit rests with the base on the plate and the axis of rotation extends essentially parallel to the normal of the plate, or the transmitter unit is tilted into an operating position such that the base rests only partially on the plate and the axis of rotation is tilted relative to the normal of the plate.Type: GrantFiled: February 4, 2013Date of Patent: July 28, 2015Assignee: Micronas GmbHInventor: Yan Bondar
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Publication number: 20150177023Abstract: The invention relates to a device (1) for measurement of an angle of an axis of rotation (10), comprising a magnet (12) with a magnet surface (14), which is pivotally assembled at the axis of rotation (10), and further comprising a sensor (16) for recognition of external magnetic flux lines of the magnet (12). According to the invention, the magnet (12) comprises at least a first magnet section (20) with a magnetic first orientation (22) and the magnet (12) further at least comprises a second magnet section (24) with a second magnetic orientation (26), wherein the first magnetic orientation (22) is displaced from the second magnetic orientation (26), whereby the magnet surface (14) comprises a different concentration of external magnetic flux lines.Type: ApplicationFiled: December 23, 2014Publication date: June 25, 2015Inventors: Tobias Klocke, Yan Bondar
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Publication number: 20150168124Abstract: A measurement system having a first magnetic field sensor and having a magnet for generating a magnetic field, in which the magnet has a first pole face and a second pole face, wherein an axis of rotation is defined perpendicular to the first pole face and perpendicular to the second pole face, wherein the magnet is supported for rotation about the axis of rotation, in which the first magnetic field sensor is positioned facing the first pole face and at a distance from the axis of rotation, in which the magnet has a rotational asymmetry of the flux density in the region of the first pole face, wherein the flux density of the magnet in the first magnetic field sensor can be adjusted between a maximum and a minimum by rotation of the magnet about the axis of rotation.Type: ApplicationFiled: December 15, 2014Publication date: June 18, 2015Inventor: Yan BONDAR
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Publication number: 20140191749Abstract: A measuring system is provided that includes a magnetic field sensor array, an evaluation circuit for evaluating measurement signals of the magnetic field sensor array, and a rotatable encoder that has a mass element to change a magnetic field vector in the magnetic field sensor array. The encoder has a spring element in which the mass element is attached to the spring element. The encoder has a linear guide, and the mass element is guided in a radial direction in the linear guide such that during a rotation of the encoder the mass element can be moved by centrifugal force and the centrifugal force works against the spring force of the spring element. The magnetic field sensor array is arranged toward the encoder to measure a change, caused by the movement of the mass element, in the magnetic field vector.Type: ApplicationFiled: January 9, 2014Publication date: July 10, 2014Applicant: Micronas GmbHInventor: Yan BONDAR