Abstract: Disclosed are various embodiments of methods and corresponding devices for effecting such methods that permit integrated circuits, sensors, chips or dies to be identified. Imperfections or irregularities in pixels or memory cells are used to generate identification codes for integrated circuits, sensors, chips or dies. Addresses or data locations of selected defective pixels or memory cells may be used to generate such identification codes.

Abstract: A method for compensating for dark current in an image sensor array. In a representative embodiments, the method includes determining a nominal average dark current for the image sensor array, determining location of each pixel in the image sensor array, obtaining a nominal dark current associated with each pixel based on the nominal average dark current and on the location of the pixel, and subtracting the associated nominal dark current from the image signal for each pixel. At least two of the pixels have differing associated nominal dark currents. In other representative embodiments compensation values for dark currents and for differences in channel processing are determined during the same time period.

Abstract: A system and method for generating dynamically modifiable timing control signals. Timing waveforms can be changed, for each phase of control, by changing the contents of memory locations and start/stop indices. Parallel signals are generated from the output of the memory locations. The memory locations are accessed in a user-selected order by an index value. This technique of generating timing waveforms, and thus control signals, can be applied to, for example, pixel array development.